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13. 
Cover image for Semiconductor materials analysis and fabrication process control proceedings of Symposium D on Diagnostic Techniques for Semiconductor Materials Analysis and Fabrication Process Control of the 1992 E-MRS Spring Conference, Strasbourg, France, June 2-5, 1992
Semiconductor materials analysis and fabrication process control proceedings of Symposium D on Diagnostic Techniques for Semiconductor Materials Analysis and Fabrication Process Control of the 1992 E-MRS Spring Conference, Strasbourg, France, June 2-5, 1992
Author 
Symposium D on Diagnostic Techniques for Semiconductor Materials Analysis and Fabrication Process Control (1992 : Strasbourg, France) Crean, G. M. Stuck, R. Woollam, John A. European Materials Research Society.
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ScienceDirect http://www.sciencedirect.com/science/book/9780444899088
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14. 
Cover image for Wide-band-gap semiconductors proceedings of the Seventh Trieste ICTP-IUPAP Semiconductor Symposium, International Centre for Theoretical Physics, Trieste, Italy, 8-12 June 1992
Wide-band-gap semiconductors proceedings of the Seventh Trieste ICTP-IUPAP Semiconductor Symposium, International Centre for Theoretical Physics, Trieste, Italy, 8-12 June 1992
Author 
Trieste ICTP-IUPAP Semiconductor Symposium (7th : 1992) Van de Walle, Chris Gilbert.
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ScienceDirect http://www.sciencedirect.com/science/book/9780444815736
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15. 
Cover image for Non-stoichiometry in semiconductors proceedings of Symposium A3 on Non-Stoichiometry in Semiconductors of the International Conference on Advanced Materials--ICAM 91, Strasbourg, France, 27-31 May, 1991
Non-stoichiometry in semiconductors proceedings of Symposium A3 on Non-Stoichiometry in Semiconductors of the International Conference on Advanced Materials--ICAM 91, Strasbourg, France, 27-31 May, 1991
Author 
Symposium A3 on Non-Stoichiometry in Semiconductors (1991 : Strasbourg, France) Bachmann, K. J. Hwang, H.-L. Schwab, C. International Conference on Advanced Materials (1991 : Strasbourg, France)
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16. 
Cover image for Solid state ionics proceedings of Symposium A2 on Solid State Ionics of the International Conference on Advanced Materials--ICAM 91, Strasbourg, France, 27-31 May, 1991
Solid state ionics proceedings of Symposium A2 on Solid State Ionics of the International Conference on Advanced Materials--ICAM 91, Strasbourg, France, 27-31 May, 1991
Author 
Symposium A2 on Solid State Ionics (1991 : Strasbourg, France) Balkanski, Minko, 1927- Takahashi, Takehiko. Tuller, Harry L. International Conference on Advanced Materials (1991 : Strasbourg, France)
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17. 
Cover image for Hot carriers in semiconductor nanostructures physics and applications
Hot carriers in semiconductor nanostructures physics and applications
Author 
Shah, J. (Jagdeep)
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ScienceDirect http://www.sciencedirect.com/science/book/9780126381405
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18. 
Cover image for Hydrogen in semiconductors bulk and surface properties : proceedings of the Sixth Trieste IUPAP-ICTP Semiconductor Symposium, International Centre for Theoretical Physics, Trieste, Italy, 27-31 August 1990
Hydrogen in semiconductors bulk and surface properties : proceedings of the Sixth Trieste IUPAP-ICTP Semiconductor Symposium, International Centre for Theoretical Physics, Trieste, Italy, 27-31 August 1990
Author 
Trieste ICTP-IUPAP Semiconductor Symposium (6th : 1990) Stutzmann, M. (Martin) Chevallier, J. (Jacques)
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19. 
Cover image for Defect control in semiconductors proceedings of the International Conference on the Science and Technology of Defect Control in Semiconductors, the Yokohama 21st century forum, Yokohama, Japan, September 17-22 1989. Vol. 2
Defect control in semiconductors proceedings of the International Conference on the Science and Technology of Defect Control in Semiconductors, the Yokohama 21st century forum, Yokohama, Japan, September 17-22 1989. Vol. 2
Author 
International Conference on the Science and Technology of Defect Control in Semiconductors (1989 : Yokohama-shi, Japan) Sumino, K. (Kōji), 1931-
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20. 
Cover image for Shallow impurity centers in semiconductors proceedings of the Second International Conference on Shallow Impurity Centers/Fourth Trieste IUPAP-ICTP Semiconductor Symposium, International Centre for Theoretical Physics, Trieste, Italy, 28 July-1 August 1986
Shallow impurity centers in semiconductors proceedings of the Second International Conference on Shallow Impurity Centers/Fourth Trieste IUPAP-ICTP Semiconductor Symposium, International Centre for Theoretical Physics, Trieste, Italy, 28 July-1 August 1986
Author 
International Conference on Shallow Impurity Centers (2nd : 1986 : International Centre for Theoretical Physics) Baldereschi, A. Resta, R. Trieste ICTP-IUPAP Semiconductor Symposium (4th : 1986 : International Centre for Theoretical Physics)
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21. 
Cover image for High excitation and short pulse phenomena : proceedings of the third Trieste ICTP-IUPAP Semiconductor Symposium, International Centre for Theoretical Physics, Trieste, Italy, 2-6 July 1984
High excitation and short pulse phenomena : proceedings of the third Trieste ICTP-IUPAP Semiconductor Symposium, International Centre for Theoretical Physics, Trieste, Italy, 2-6 July 1984
Author 
Trieste ICTP-IUPAP Semiconductor Symposium (3d : 1984) Pilkuhn, M. H., 1934-
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22. 
Cover image for Surfaces and interfaces physics and electronics : proceedings of the second Trieste ICTP-IUPAP Semiconductor Symposium, International Centre for Theoretical Physics, Trieste, Italy, 30 August - 3 September 1982
Surfaces and interfaces physics and electronics : proceedings of the second Trieste ICTP-IUPAP Semiconductor Symposium, International Centre for Theoretical Physics, Trieste, Italy, 30 August - 3 September 1982
Author 
Trieste ICTP-IUPAP Semiconductor Symposium (2nd : 1982) Bauer, Robert S. International Centre for Theoretical Physics. International Union of Pure and Applied Physics.
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23. 
Cover image for Laser and electron beam processing of materials
Laser and electron beam processing of materials
Author 
White, C. W. Peercy, P. S. Materials Research Society.
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