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Publication Date: 2013

Author

SpringerLink (Online service)

(78)

Kurtoglu, Selahattin. author.

(2)

Li, Jinwen. editor.

(2)

Xiao, Liquan. editor.

(2)

Xu, Weixia. editor.

(2)

Zhang, Chengyi. editor.

(2)

van Aartsengel, Aristide. author.

(2)

Alampalli, Sreenivas.

(1)

Aldrin, John C. author.

(1)

Amalberti, René. author.

(1)

Amendola, Aniello. editor.

(1)

(1)

Ashar, Navin G. author.

(1)

Attard, Mario M., editor.

(1)

Australasian Conference on the Mechanics of Structures and Materials (22nd : 2012 : Sydney, Australia)

(1)

Aven, Terje. author.

(1)

Awasthi, Amit K. editor.

(1)

Balakrishnan, N. author.

(1)

Benaroya, Haym, 1954- author.

(1)

Bhattacharya, Gautam. editor.

(1)

Billinton, Roy. editor.

(1)

Bitner-Gregersen, Elzbieta Maria. author.

(1)

Bitsch, Friedemann. editor.

(1)

Bosselmann, Philipp. author.

(1)

Bostan, Ion. author.

(1)

Bostan, Viorel. author.

(1)

Brayner, Roberta. editor.

(1)

Brinkmann, Steffen. editor.

(1)

Bässler, Hans-Jürgen. author.

(1)

Calixto, Eduardo.

(1)

Caron, Franco. author.

(1)

Cha, Ji Hwan. author.

(1)

Chakrabarti, Amaresh. editor.

(1)

Chakraborty, Subrata. editor.

(1)

Chan, Hing Kai. author.

(1)

(1)

Chemuturi, Murali. author.

(1)

Cheptsov, Alexey. editor.

(1)

Chorafas, Dimitris N. author.

(1)

Chudnovsky, Bella H.

(1)

Cogan, Scott. editor.

(1)

Conference on the Theory and Applications of Reliability with Emphasis on Bayesian and Nonparametric Methods (1975 : University of South Florida)

(1)

Coradin, Thibaud. editor.

(1)

Cotroneo, Domenico. editor.

(1)

Cressler, John D.

(1)

Cuzzocrea, Alfredo. editor.

(1)

Czichos, Horst. editor.

(1)

Dadashi, Nastaran.

(1)

Deodatis, G. (George), editor.

(1)

(1)

Dietrich, Wilhelm. author.

(1)

Ding, Steven X. author.

(1)

Dohi, Tadashi. editor.

(1)

Dou, Hua-Shu. author.

(1)

Dubrova, Elena. author.

(1)

Dulgheru, Valeriu. author.

(1)

Dutta, Rudra. author.

(1)

Eide, Lars Ingolf. author.

(1)

El Fallah Seghrouchni, Amal. author.

(1)

El-Reedy, Mohamed Abdallah.

(1)

Ellingwood, Bruce R., editor.

(1)

Epperlein, Peter W.

(1)

Ermolieva, Tatiana. editor.

(1)

Ettouney, Mohammed.

(1)

Fan, X.J. editor.

(1)

Ferreira, Kurt. author.

(1)

Finkelstein, Maxim. author.

(1)

Fiévet, Fernand. editor.

(1)

Frangopol, Dan M., editor.

(1)

Fries, Richard C.

(1)

Fujita, Kohei. author.

(1)

Gardini, Fausto. editor.

(1)

Garvey, Paul R., 1956-

(1)

Gaycken, Sandro. editor.

(1)

(1)

Gfrerrer, Anton. author.

(1)

Gheorghe, Adrian. author.

(1)

Gielen, Georges. author.

(1)

Glismann, Peter J.

(1)

Golwalkar, Kiran R. author.

(1)

Goodarzi, Ehsan. author.

(1)

Goyal, Neeraj Kumar. author.

(1)

Gracia, José. editor.

(1)

Grigsby, Leonard L.

(1)

Grous, Ammar, author.

(1)

(1)

Guerritore, Walter B.

(1)

Guiochet, Jérémie. editor.

(1)

Guo, Xiaqng-Gui.

(1)

Gurtuna, Ozgur. author.

(1)

Han, Seon Mi, author.

(1)

Hayes, John P. author.

(1)

He, Feifei. author.

(1)

Heyden, Anders. editor.

(1)

Hillerbrand, Rafaela. editor.

(1)

Hugo, Clemens. author.

(1)

Hørte, Torfinn. author.

(1)

IEEE Xplore (Online Service), distributor.

(1)

International Conference on Structural Safety and Reliability (11th : 2013 : New York). Sponsor.

(1)

Jaeger, Carlo. editor.

(1)

Javaherdashti, Reza.

(1)

Jelali, Mohieddine. author.

(1)

Jensen, Uwe. author.

(1)

Jha, Kumar Neeraj. author.

(1)

Kahl, Fredrik. editor.

(1)

Kaminskiy, Mark, 1946-

(1)

Karadeniz, Halil. author.

(1)

Karki, Rajesh. editor.

(1)

Kaul, Anupama B.

(1)

Kaâniche, Mohamed. editor.

(1)

Kelly, Suzanne M. author.

(1)

Khonsari, Michael M.

(1)

Kittl, Christian. editor.

(1)

Knopp, Jeremy S. author.

(1)

Kovacic, Samuel F. editor.

(1)

Krishnaswamy, Smita. author.

(1)

Krüger, Jörg. editor.

(1)

Kunkel, Julian Martin. editor.

(1)

Lang, Johann. author.

(1)

Laros III, James H. author.

(1)

Lehmann, Frank. author.

(1)

Leira, Bernt J. author.

(1)

Li, Guoqiang. author.

(1)

Li, Haijun. editor.

(1)

Li, Rita Yi Man. author.

(1)

Li, Shengcai. author.

(1)

Li, Xiaohu. editor.

(1)

Lin, Shi-Woei. editor.

(1)

Lin, Yi-Kuei. editor.

(1)

Linnerooth-Bayer, Joanne. editor.

(1)

Liu, Shuhong. author.

(1)

Lu, Pingjing. editor.

(1)

Ludwig, Thomas. editor.

(1)

Lunau, Stephan. editor.

(1)

(1)

(1)

Malyshkin, Victor. editor.

(1)

Mandenius, Carl-Fredrik. editor.

(1)

Mantooth, H. Alan, 1963-

(1)

Maricau, Elie. author.

(1)

Mario, Hirz. author.

(1)

Markov, Igor L. author.

(1)

McPherson, J. W. author.

(1)

Mechler, Reinhard. editor.

(1)

Meier, Horst. editor.

(1)

Meran, Renata. author.

(1)

Meuer, Hans Werner. editor.

(1)

(1)

Moaveni, Babak. editor.

(1)

Mollenhauer, Jens-Peter. author.

(1)

Mortimore, Sara. author.

(1)

Moustafa, Abbas. author.

(1)

Murphy, R. Kim. author.

(1)

Nagel, Wolfgang E. editor.

(1)

Nagurka, Mark L., author.

(1)

Nair, N. Unnikrishnan. author.

(1)

Nakagawa, Toshio. editor.

(1)

Nickolay, Bertram. editor.

(1)

Nikolaidis, Yiannis. editor.

(1)

Nwaoha, Chikezie, 1984-

(1)

Olsson, Carl. editor.

(1)

Oskarsson, Magnus. editor.

(1)

Osterhage, Wolfgang W. author.

(1)

Pandey, Ajeet Kumar. author.

(1)

Papadimitriou, Costas. editor.

(1)

Parente, Eugenio. editor.

(1)

Pathak, Parth H. author.

(1)

Pavlova, Yulia. author.

(1)

Pearson, Siani. editor.

(1)

Pearton, Stephen J. editor.

(1)

Pedretti, Kevin. author.

(1)

Peterson, Martin. editor.

(1)

Pinto, Cesar Ariel.

(1)

Poon, Sun Wah. author.

(1)

Potiron, Katia. author.

(1)

Qian, Zhongdong. author.

(1)

Rabinovich, Semyon G. author.

(1)

Ranganathan, Subramanyam.

(1)

Reniers, Genserik. author.

(1)

Resch, Michael M. editor.

(1)

Roe, Michael. author.

(1)

Roenpage, Olin. author.

(1)

Roeser, Sabine. editor.

(1)

Sabbagh, Elias H. author.

(1)

Sabbagh, Harold A. author.

(1)

Samali, Bijan, editor.

(1)

Sandin, Per. editor.

(1)

Sankaran, P.G. author.

(1)

Schon, Klaus. author.

(1)

Schrieber, Randall R.

(1)

(1)

Sene, Kevin. author.

(1)

Shi, Peijun. editor.

(1)

(1)

Shu, Wei. author.

(1)

Simmermacher, Todd. editor.

(1)

Simos, Dimitris E. editor.

(1)

Singh, Karan. editor.

(1)

Skjong, Rolf. author.

(1)

Sobor, Ion. author.

(1)

Language

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Subject

Quality Control, Reliability, Safety and Risk.

(51)

(51)

(40)

Computer science.

(20)

Operating systems (Computers).

(13)

Performance and Reliability.

(13)

(10)

Statistics for Engineering, Physics, Computer Science, Chemistry and Earth Sciences.

(8)

Software engineering.

(7)

Economics/Management Science.

(6)

Engineering economy.

(6)

Reliability (Engineering)

(6)

Systems engineering.

(6)

Chemical engineering.

(5)

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(5)

(5)

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(5)

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(5)

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(5)

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(5)

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(5)

(5)

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(4)

Characterization and Evaluation of Materials.

(4)

(4)

Circuits and Systems.

(4)

Computer Communication Networks.

(4)

Computer software.

(4)

Distribution (Probability theory).

(4)

Industrial and Production Engineering.

(4)

Industrial engineering.

(4)

Mathematical statistics.

(4)

(4)

Probability Theory and Stochastic Processes.

(4)

Surfaces (Physics).

(4)

Arithmetic and Logic Structures.

(3)

Computer network architectures.

(3)

Computer system performance.

(3)

Construction Management.

(3)

(3)

Data protection.

(3)

Earth Sciences.

(3)

Geoengineering, Foundations, Hydraulics.

(3)

(3)

(3)

Hydraulic engineering.

(3)

(3)

Mechanical engineering.

(3)

Natural Hazards.

(3)

(3)

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(3)

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(3)

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(3)

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(3)

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(3)

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(3)

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(2)

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(2)

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(2)

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(2)

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(2)

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(2)

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(2)

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(2)

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(2)

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(2)

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(2)

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(2)

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(2)

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(2)

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(2)

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(2)

(2)

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(2)

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(2)

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(2)

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(2)

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(2)

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(2)

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(2)

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(2)

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(2)

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(1)

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(1)

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(1)

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(1)

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(1)

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(1)

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(1)

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(1)

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(1)

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(1)

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(1)

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(1)

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(1)

(1)

(1)

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(1)

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(1)

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(1)

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(1)

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(1)

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(1)

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(1)

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(1)

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(1)

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(1)

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(1)

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(1)

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(1)

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(1)

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(1)

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(1)

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(1)

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(1)

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(1)

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(1)

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(1)

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(1)

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(1)

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(1)

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(1)

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(1)

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(1)

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(1)

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(1)

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(1)

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(1)

(1)

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(1)

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(1)

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13.

Cover image for Fracture mechanics. 1, Analysis of reliability and quality control

Fracture mechanics. 1, Analysis of reliability and quality control

Fracture mechanics. 1, Analysis of reliability and quality control

Author

Grous, Ammar, author.

Preferred Shelf Number

ONLINE

Electronic Access

John Wiley http://dx.doi.org/10.1002/9781118580004
Wiley http://onlinelibrary.wiley.com/book/10.1002/9781118580004

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14.

Cover image for The theory and applications of reliability with emphasis on Bayesian and nonparametric methods

The theory and applications of reliability with emphasis on Bayesian and nonparametric methods

The theory and applications of reliability with emphasis on Bayesian and nonparametric methods

Author

Conference on the Theory and Applications of Reliability with Emphasis on Bayesian and Nonparametric Methods (1975 : University of South Florida) Tsokos, Chris P. Shimi, I. N. United States. Air Force. Office of Scientific Research. University of South Florida.

Preferred Shelf Number

ONLINE

Electronic Access

ScienceDirect http://www.sciencedirect.com/science/book/9780127021010

Format:

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Online Library~1

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15.

Cover image for Safety, reliability, risk and life-cycle performance of structures and infrastructures : proceedings of the 11th International Conference on Structural Safety and Reliability, New York, USA, 16-20 June 2013

Safety, reliability, risk and life-cycle performance of structures and infrastructures : proceedings of the 11th International Conference on Structural Safety and Reliability, New York, USA, 16-20 June 2013

Safety, reliability, risk and life-cycle performance of structures and infrastructures : proceedings of the 11th International Conference on Structural Safety and Reliability, New York, USA, 16-20 June 2013

Author

International Conference on Structural Safety and Reliability (11th : 2013 : New York). Sponsor. Deodatis, G. (George), editor. Ellingwood, Bruce R., editor. Frangopol, Dan M., editor.

Preferred Shelf Number

ONLINE(356919.1)

Electronic Access

Distributed by publisher. Purchase or institutional license may be required for access.

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Online Library~1

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16.

Cover image for Reliability Physics and Engineering Time-To-Failure Modeling

Reliability Physics and Engineering Time-To-Failure Modeling

Reliability Physics and Engineering Time-To-Failure Modeling

Author

McPherson, J. W. author. SpringerLink (Online service)

Preferred Shelf Number

ONLINE(332682.1)

Electronic Access

http://dx.doi.org/10.1007/978-3-319-00122-7

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17.

Cover image for Optimal Stochastic Control Schemes within a Structural Reliability Framework

Optimal Stochastic Control Schemes within a Structural Reliability Framework

Optimal Stochastic Control Schemes within a Structural Reliability Framework

Author

Leira, Bernt J. author. SpringerLink (Online service)

Preferred Shelf Number

ONLINE(332864.1)

Electronic Access

http://dx.doi.org/10.1007/978-3-319-01405-0

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18.

Cover image for Quality, Reliability, Security and Robustness in Heterogeneous Networks 9th International Conference, QShine 2013, Greader Noida, India, January 11-12, 2013, Revised Selected Papers

Quality, Reliability, Security and Robustness in Heterogeneous Networks 9th International Conference, QShine 2013, Greader Noida, India, January 11-12, 2013, Revised Selected Papers

Quality, Reliability, Security and Robustness in Heterogeneous Networks 9th International Conference, QShine 2013, Greader Noida, India, January 11-12, 2013, Revised Selected Papers

Author

Singh, Karan. editor. Awasthi, Amit K. editor. SpringerLink (Online service)

Preferred Shelf Number

ONLINE(334505.1)

Electronic Access

http://dx.doi.org/10.1007/978-3-642-37949-9

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19.

Cover image for Computer Safety, Reliability, and Security 32nd International Conference, SAFECOMP 2013, Toulouse, France, September 24-27, 2013. Proceedings

Computer Safety, Reliability, and Security 32nd International Conference, SAFECOMP 2013, Toulouse, France, September 24-27, 2013. Proceedings

Computer Safety, Reliability, and Security 32nd International Conference, SAFECOMP 2013, Toulouse, France, September 24-27, 2013. Proceedings

Author

Bitsch, Friedemann. editor. Guiochet, Jérémie. editor. Kaâniche, Mohamed. editor. SpringerLink (Online service)

Preferred Shelf Number

ONLINE(335005.1)

Electronic Access

http://dx.doi.org/10.1007/978-3-642-40793-2

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20.

Cover image for Designing high availability systems : design for Six Sigma and classical reliability techniques with practical real-life examples

Designing high availability systems : design for Six Sigma and classical reliability techniques with practical real-life examples

Designing high availability systems : design for Six Sigma and classical reliability techniques with practical real-life examples

Author

Taylor, Zachary, 1959- Ranganathan, Subramanyam. IEEE Xplore (Online Service), distributor. Wiley, publisher.

Preferred Shelf Number

ONLINE(365001.1)

Electronic Access

Abstract with links to resource http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=6628863

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21.

Cover image for Materials and Reliability Handbook for Semiconductor Optical and Electron Devices

Materials and Reliability Handbook for Semiconductor Optical and Electron Devices

Materials and Reliability Handbook for Semiconductor Optical and Electron Devices

Author

Ueda, Osamu. editor. Pearton, Stephen J. editor. SpringerLink (Online service)

Preferred Shelf Number

ONLINE(331478.1)

Electronic Access

http://dx.doi.org/10.1007/978-1-4614-4337-7

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22.

Cover image for Reliability and Risk Evaluation of Wind Integrated Power Systems

Reliability and Risk Evaluation of Wind Integrated Power Systems

Reliability and Risk Evaluation of Wind Integrated Power Systems

Author

Billinton, Roy. editor. Karki, Rajesh. editor. Verma, Ajit Kumar. editor. SpringerLink (Online service)

Preferred Shelf Number

ONLINE(335484.1)

Electronic Access

http://dx.doi.org/10.1007/978-81-322-0987-4

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23.

Cover image for Early Software Reliability Prediction A Fuzzy Logic Approach

Early Software Reliability Prediction A Fuzzy Logic Approach

Early Software Reliability Prediction A Fuzzy Logic Approach

Author

Pandey, Ajeet Kumar. author. Goyal, Neeraj Kumar. author. SpringerLink (Online service)

Preferred Shelf Number

ONLINE(335512.1)

Electronic Access

http://dx.doi.org/10.1007/978-81-322-1176-1

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24.

Cover image for Semiconductor Laser Engineering, Reliability and Diagnostics a Practical Approach to High Power and Single Mode Devices.

Semiconductor Laser Engineering, Reliability and Diagnostics a Practical Approach to High Power and Single Mode Devices.

Semiconductor Laser Engineering, Reliability and Diagnostics a Practical Approach to High Power and Single Mode Devices.

Author

Epperlein, Peter W.

Preferred Shelf Number

ONLINE

Electronic Access

Ebook Library http://public.eblib.com/EBLPublic/PublicView.do?ptiID=1118506
John Wiley http://dx.doi.org/10.1002/9781118481882

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