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13. 
Cover image for Functional Design Errors in Digital Circuits Diagnosis, Correction and Repair
Functional Design Errors in Digital Circuits Diagnosis, Correction and Repair
Author 
Chang, Kai-hui. author. Markov, Igor L. author. Bertacco, Valeria. author. SpringerLink (Online service)
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Electronic Access 
http://dx.doi.org/10.1007/978-1-4020-9365-4
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14. 
Cover image for Low-Power High-Level Synthesis for Nanoscale CMOS Circuits
Low-Power High-Level Synthesis for Nanoscale CMOS Circuits
Author 
Patra, Priyardarsan. author. Kougianos, Elias. author. Ranganathan, Nagarajan. author. Mohanty, Saraju P. author. SpringerLink (Online service)
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http://dx.doi.org/10.1007/978-0-387-76474-0
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15. 
Cover image for Electromagnetic Compatibility of Integrated Circuits Techniques for low emission and susceptibility
Electromagnetic Compatibility of Integrated Circuits Techniques for low emission and susceptibility
Author 
Ben Dhia, Sonia. editor. Ramdani, Mohamed. editor. Sicard, Etienne. editor. SpringerLink (Online service)
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http://dx.doi.org/10.1007/b137864
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16. 
Cover image for Reuse-Based Methodologies and Tools in the Design of Analog and Mixed-Signal Integrated Circuits
Reuse-Based Methodologies and Tools in the Design of Analog and Mixed-Signal Integrated Circuits
Author 
CASTRO-LÓPEZ, R. author. FERNÁNDEZ, F.V. author. GUERRA-VINUESA, O. author. RODRÍGUEZ-VÁZQUEZ, Á. author. SpringerLink (Online service)
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http://dx.doi.org/10.1007/978-1-4020-5139-5
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17. 
Cover image for Nanoscale Memory Repair
Nanoscale Memory Repair
Author 
Horiguchi, Masashi. author. Itoh, Kiyoo. author. SpringerLink (Online service)
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http://dx.doi.org/10.1007/978-1-4419-7958-2
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18. 
Cover image for Clocking in Modern VLSI Systems
Clocking in Modern VLSI Systems
Author 
Xanthopoulos, Thucydides. editor. SpringerLink (Online service)
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http://dx.doi.org/10.1007/978-1-4419-0261-0
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19. 
Cover image for Carbon Nanotube Electronics
Carbon Nanotube Electronics
Author 
Kong, Jing. editor. Javey, Ali. editor. SpringerLink (Online service)
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http://dx.doi.org/10.1007/978-0-387-69285-2
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20. 
Cover image for Low-Power High-Resolution Analog to Digital Converters Design, Test and Calibration
Low-Power High-Resolution Analog to Digital Converters Design, Test and Calibration
Author 
Zjajo, Amir. author. Pineda de Gyvez, José. author. SpringerLink (Online service)
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http://dx.doi.org/10.1007/978-90-481-9725-5
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21. 
Cover image for Design for Manufacturability and Yield for Nano-Scale CMOS
Design for Manufacturability and Yield for Nano-Scale CMOS
Author 
Chiang, Charles C. author. Kawa, Jamil. author. SpringerLink (Online service)
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http://dx.doi.org/10.1007/978-1-4020-5188-3
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22. 
Cover image for Full-Chip Nanometer Routing Techniques
Full-Chip Nanometer Routing Techniques
Author 
Ho, Tsung-Yi. author. Chang, Yao-Wen. author. Chen, Sao-Jie. author. SpringerLink (Online service)
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http://dx.doi.org/10.1007/978-1-4020-6195-0
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23. 
Cover image for SAT-Based Scalable Formal Verification Solutions
SAT-Based Scalable Formal Verification Solutions
Author 
Ganai, Malay K. author. Gupta, Aarti. author. SpringerLink (Online service)
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http://dx.doi.org/10.1007/978-0-387-69167-1
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24. 
Cover image for Leakage in Nanometer CMOS Technologies
Leakage in Nanometer CMOS Technologies
Author 
Narendra, Siva G. author. Chandrakasan, Anantha. author. SpringerLink (Online service)
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http://dx.doi.org/10.1007/0-387-28133-9
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