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13. 
Cover image for Fundamentals of Bias Temperature Instability in MOS Transistors Characterization Methods, Process and Materials Impact, DC and AC Modeling
Fundamentals of Bias Temperature Instability in MOS Transistors Characterization Methods, Process and Materials Impact, DC and AC Modeling
Author 
Mahapatra, Souvik. editor. SpringerLink (Online service)
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https://doi.org/10.1007/978-81-322-2508-9
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14. 
Cover image for Multiband RF Circuits and Techniques for Wireless Transmitters
Multiband RF Circuits and Techniques for Wireless Transmitters
Author 
Chen, Wenhua. author. Rawat, Karun. author. Ghannouchi, Fadhel M. author. SpringerLink (Online service)
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https://doi.org/10.1007/978-3-662-50440-6
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15. 
Cover image for Smart Sensors and Systems
Smart Sensors and Systems
Author 
Lin, Youn-Long. editor. Kyung, Chong-Min. editor. Yasuura, Hiroto. editor. Liu, Yongpan. editor. SpringerLink (Online service)
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ONLINE
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https://doi.org/10.1007/978-3-319-14711-6
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16. 
Cover image for Current Conveyors Variants, Applications and Hardware Implementations
Current Conveyors Variants, Applications and Hardware Implementations
Author 
Senani, Raj. author. Bhaskar, D. R. author. Singh, A. K. author. SpringerLink (Online service)
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ONLINE
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https://doi.org/10.1007/978-3-319-08684-2
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