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13. 
Cover image for Solid State Lighting Reliability Part 2 Components to Systems
Solid State Lighting Reliability Part 2 Components to Systems
Author 
van Driel, Willem Dirk. editor. Fan, Xuejun. editor. Zhang, Guo Qi. editor. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE
Electronic Access 
https://doi.org/10.1007/978-3-319-58175-0
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14. 
Cover image for Fundamentals of electronics. 2, Continuous-time signals and systems
Fundamentals of electronics. 2, Continuous-time signals and systems
Author 
Muret, Pierre, author.
Preferred Shelf Number 
TK7816
Electronic Access 
https://onlinelibrary.wiley.com/doi/book/10.1002/9781119422082
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15. 
Cover image for Natural language processing and computational linguistics 2 : semantics, discourse and applications
Natural language processing and computational linguistics 2 : semantics, discourse and applications
Author 
Kurdi, Mohamed Zakaria, author.
Preferred Shelf Number 
QA76.9 .N38
Electronic Access 
https://onlinelibrary.wiley.com/doi/book/10.1002/9781119419686
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16. 
Cover image for Modeling and simulation of logistics flows. 2, Dashboards, traffic planning and management
Modeling and simulation of logistics flows. 2, Dashboards, traffic planning and management
Author 
Reveillac, Jean-Michel, author.
Preferred Shelf Number 
HD38.5
Electronic Access 
https://onlinelibrary.wiley.com/doi/book/10.1002/9781119368564
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17. 
Cover image for From additive manufacturing to 3D/4D printing. 2, Current techniques, improvements and their limitations
From additive manufacturing to 3D/4D printing. 2, Current techniques, improvements and their limitations
Author 
André, Jean-Claude, author.
Preferred Shelf Number 
TS171.95
Electronic Access 
https://onlinelibrary.wiley.com/doi/book/10.1002/9781119428299
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18. 
Cover image for Molecular Modeling and Multiscaling Issues for Electronic Material Applications Volume 2
Molecular Modeling and Multiscaling Issues for Electronic Material Applications Volume 2
Author 
Wymyslowski, Artur. editor. Iwamoto, Nancy. editor. Yuen, Matthew. editor. Fan, Haibo. editor. SpringerLink (Online service)
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ONLINE
Electronic Access 
https://doi.org/10.1007/978-3-319-12862-7
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19. 
Cover image for Designing 2D and 3D Network-on-Chip Architectures
Designing 2D and 3D Network-on-Chip Architectures
Author 
Tatas, Konstantinos. author. Siozios, Kostas. author. Soudris, Dimitrios. author. Jantsch, Axel. author. SpringerLink (Online service)
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ONLINE
Electronic Access 
https://doi.org/10.1007/978-1-4614-4274-5
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20. 
Cover image for SystemC and SystemC-AMS in Practice SystemC 2.3, 2.2 and SystemC-AMS 1.0
SystemC and SystemC-AMS in Practice SystemC 2.3, 2.2 and SystemC-AMS 1.0
Author 
Banerjee, Amal. author. Sur, Balmiki. author. SpringerLink (Online service)
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ONLINE
Electronic Access 
https://doi.org/10.1007/978-3-319-01147-9
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21. 
Cover image for The Cinderella.2 Manual Working with The Interactive Geometry Software
The Cinderella.2 Manual Working with The Interactive Geometry Software
Author 
Richter-Gebert, Jürgen. author. Kortenkamp, Ulrich H. author. SpringerLink (Online service)
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ONLINE
Electronic Access 
http://dx.doi.org/10.1007/978-3-540-34926-6
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22. 
Cover image for Grundlagen der Elektrotechnik und Elektronik 2 Elektromagnetische Felder und ihre Anwendungen
Grundlagen der Elektrotechnik und Elektronik 2 Elektromagnetische Felder und ihre Anwendungen
Author 
Paul, Steffen. author. Paul, Reinhold. author. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE
Electronic Access 
http://dx.doi.org/10.1007/978-3-642-24157-4
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23. 
Cover image for Electrical Engineering and Control Selected Papers from the 2011 International Conference on Electric and Electronics (EEIC 2011) in Nanchang, China on June 20-22, 2011, Volume 2
Electrical Engineering and Control Selected Papers from the 2011 International Conference on Electric and Electronics (EEIC 2011) in Nanchang, China on June 20-22, 2011, Volume 2
Author 
Zhu, Min. editor. SpringerLink (Online service)
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ONLINE
Electronic Access 
http://dx.doi.org/10.1007/978-3-642-21765-4
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24. 
Cover image for Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits 2nd Edition
Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits 2nd Edition
Author 
Sachdev, Manoj. editor. Gyvez, José Pineda de. editor. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE
Electronic Access 
http://dx.doi.org/10.1007/0-387-46547-2
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