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1. 
Cover image for Advanced techniques for maintenance modeling and reliability analysis of repairable systems
Advanced techniques for maintenance modeling and reliability analysis of repairable systems
Author 
Sharma, Garima, author. Rai, Rajiv Nandan, author.
Preferred Shelf Number 
TA169 .S53 2023
Electronic Access 
https://onlinelibrary.wiley.com/doi/book/10.1002/9781394174836
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2. 
Cover image for Electromechanical coupling theory, methodology and applications for high-performance microwave equipment
Electromechanical coupling theory, methodology and applications for high-performance microwave equipment
Author 
Duan, Baoyan, author. Zhang, Shuxin (Professor of electromechanical engineering), author.
Preferred Shelf Number 
TK7876 .D83 2023
Electronic Access 
https://onlinelibrary.wiley.com/doi/book/10.1002/9781119904427
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3. 
Cover image for Electrical connectors : design, manufacture, test, and selection
Electrical connectors : design, manufacture, test, and selection
Author 
Pecht, Michael, editor. Kyeong, San, editor.
Preferred Shelf Number 
TK3521
Electronic Access 
https://onlinelibrary.wiley.com/doi/book/10.1002/9781119679837
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4. 
Cover image for Systems engineering in the fourth industrial revolution : big data, novel technologies, and modern systems engineering
Systems engineering in the fourth industrial revolution : big data, novel technologies, and modern systems engineering
Author 
Kenett, Ron, editor. Swarz, Robert S., editor. Zonnenshain, Avigdor, editor.
Preferred Shelf Number 
TA168 .S8727 2020
Electronic Access 
https://onlinelibrary.wiley.com/doi/book/10.1002/9781119513957
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5. 
Cover image for Repairable systems reliability analysis : a comprehensive framework
Repairable systems reliability analysis : a comprehensive framework
Author 
Rai, Rajiv Nandan, author. Chaturvedi, Sanjay K., author. Bolia, Nomesh, author.
Preferred Shelf Number 
QA402 .R35 2020
Electronic Access 
https://onlinelibrary.wiley.com/doi/book/10.1002/9781119526582
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6. 
Cover image for Probabilistic physics of failure approach to reliability : modeling, accelerated testing, prognosis and reliability assessment
Probabilistic physics of failure approach to reliability : modeling, accelerated testing, prognosis and reliability assessment
Author 
Modarres, M. (Mohammad), author. Amiri, Mehdi, author. Jackson, Christopher, 1979- author.
Preferred Shelf Number 
TA169.5
Electronic Access 
https://onlinelibrary.wiley.com/doi/book/10.1002/9781119388692
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7. 
Cover image for Real-time embedded systems
Real-time embedded systems
Author 
Wang, Jiacun, 1963- author.
Preferred Shelf Number 
TK7895 .E42
Electronic Access 
https://onlinelibrary.wiley.com/doi/book/10.1002/9781119420712
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8. 
Cover image for Lead Free Solder Mechanics and Reliability
Lead Free Solder Mechanics and Reliability
Author 
Pang, John Hock Lye. author. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE
Electronic Access 
http://dx.doi.org/10.1007/978-1-4614-0463-7
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9. 
Cover image for Semiconductor Power Devices Physics, Characteristics, Reliability
Semiconductor Power Devices Physics, Characteristics, Reliability
Author 
Lutz, Josef. author. Schlangenotto, Heinrich. author. Scheuermann, Uwe. author. De Doncker, Rik. author. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE
Electronic Access 
http://dx.doi.org/10.1007/978-3-642-11125-9
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10. 
Cover image for A Guide to Lead-free Solders Physical Metallurgy and Reliability
A Guide to Lead-free Solders Physical Metallurgy and Reliability
Author 
Evans, John W. author. Engelmaier, Werner. editor. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE
Electronic Access 
http://dx.doi.org/10.1007/978-1-84628-310-9
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