Limit Search Results
Author
SpringerLink (Online service)
(30)
SAE-China. editor.
(2)
Abdelal, Gasser F. author.
(1)
Abuelfoutouh, Nader. author.
(1)
Akkaya, Yılmaz. editor.
(1)
Language
Publication Date
-
Subject
Systems engineering.
(14)
Electronics.
(11)
Engineering design.
(8)
Materials.
(7)
Mechanical engineering.
(5)
Material Type
Shelf Location
Library
Switch to list view
Switch to thumbnail view
Select an Action
33 Results Found Subscribe to search results
000000000000DEFAULT
Print
1. 
Cover image for Role of Seismic Testing Facilities in Performance-Based Earthquake Engineering SERIES Workshop
Role of Seismic Testing Facilities in Performance-Based Earthquake Engineering SERIES Workshop
Author 
Fardis, Michael N. editor. Rakicevic, Zoran T. editor. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE
Electronic Access 
http://dx.doi.org/10.1007/978-94-007-1977-4
Format: 
Availability 
Online Library~1
Available:
Copies:
2. 
Cover image for The ELFNET Book on Failure Mechanisms, Testing Methods, and Quality Issues of Lead-Free Solder Interconnects
The ELFNET Book on Failure Mechanisms, Testing Methods, and Quality Issues of Lead-Free Solder Interconnects
Author 
Grossmann, Günter. editor. Zardini, Christian. editor. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE
Electronic Access 
http://dx.doi.org/10.1007/978-0-85729-236-0
Format: 
Availability 
Online Library~1
Available:
Copies:
3. 
Cover image for Split Hopkinson (Kolsky) Bar Design, Testing and Applications
Split Hopkinson (Kolsky) Bar Design, Testing and Applications
Author 
Chen, Weinong. author. Song, Bo. author. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE
Electronic Access 
http://dx.doi.org/10.1007/978-1-4419-7982-7
Format: 
Availability 
Online Library~1
Available:
Copies:
4. 
Cover image for Power-Aware Testing and Test Strategies for Low Power Devices
Power-Aware Testing and Test Strategies for Low Power Devices
Author 
Girard, Patrick. editor. Nicolici, Nicola. editor. Wen, Xiaoqing. editor. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE
Electronic Access 
http://dx.doi.org/10.1007/978-1-4419-0928-2
Format: 
Availability 
Online Library~1
Available:
Copies:
5. 
Cover image for Virtual Testing and Predictive Modeling For Fatigue and Fracture Mechanics Allowables
Virtual Testing and Predictive Modeling For Fatigue and Fracture Mechanics Allowables
Author 
Farahmand, Bahram. editor. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE
Electronic Access 
http://dx.doi.org/10.1007/978-0-387-95924-5
Format: 
Availability 
Online Library~1
Available:
Copies:
6. 
Cover image for Modern Testing Techniques for Structural Systems Dynamics and Control
Modern Testing Techniques for Structural Systems Dynamics and Control
Author 
Bursi, Oreste S. editor. Wagg, David. editor. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE
Electronic Access 
http://dx.doi.org/10.1007/978-3-211-09445-7
Format: 
Availability 
Online Library~1
Available:
Copies:
7. 
Cover image for Acoustic Emission Testing Basics for Research - Applications in Civil Engineering
Acoustic Emission Testing Basics for Research - Applications in Civil Engineering
Author 
Grosse, Christian. editor. Ohtsu, Masayasu. editor. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE
Electronic Access 
http://dx.doi.org/10.1007/978-3-540-69972-9
Format: 
Availability 
Online Library~1
Available:
Copies:
8. 
Cover image for Soft Errors in Modern Electronic Systems
Soft Errors in Modern Electronic Systems
Author 
Nicolaidis, Michael. editor. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE
Electronic Access 
http://dx.doi.org/10.1007/978-1-4419-6993-4
Format: 
Availability 
Online Library~1
Available:
Copies:
9. 
Cover image for CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies Process-Aware SRAM Design and Test
CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies Process-Aware SRAM Design and Test
Author 
Pavlov, Andrei. author. Sachdev, Manoj. author. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE
Electronic Access 
http://dx.doi.org/10.1007/978-1-4020-8363-1
Format: 
Availability 
Online Library~1
Available:
Copies:
10. 
Cover image for New Methods of Concurrent Checking
New Methods of Concurrent Checking
Author 
Göessel, Michael. author. Ocheretny, Vitaly. author. Sogomonyan, Egor. author. Marienfeld, Daniel. author. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE
Electronic Access 
http://dx.doi.org/10.1007/978-1-4020-8420-1
Format: 
Availability 
Online Library~1
Available:
Copies:
11. 
Cover image for Emerging Nanotechnologies Test, Defect Tolerance, and Reliability
Emerging Nanotechnologies Test, Defect Tolerance, and Reliability
Author 
Tehranipoor, Mohammad. editor. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE
Electronic Access 
http://dx.doi.org/10.1007/978-0-387-74747-7
Format: 
Availability 
Online Library~1
Available:
Copies:
12. 
Cover image for Gizopoulos / Advances in ElectronicTesting
Gizopoulos / Advances in ElectronicTesting
Author 
Gizopoulos, Dimitris. editor. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE
Electronic Access 
http://dx.doi.org/10.1007/0-387-29409-0
Format: 
Availability 
Online Library~1
Available:
Copies: