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13. 
Cover image for Light Scattering in Solid IX
Light Scattering in Solid IX
Author 
Cardona, Manuel. editor. Merlin, Roberto. editor. SpringerLink (Online service)
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ONLINE
Electronic Access 
http://dx.doi.org/10.1007/b14231
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14. 
Cover image for Semiconductor Optics
Semiconductor Optics
Author 
Klingshirn, Claus. author. SpringerLink (Online service)
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ONLINE
Electronic Access 
http://dx.doi.org/10.1007/978-3-540-38347-5
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15. 
Cover image for Fundamentals of Solid State Engineering
Fundamentals of Solid State Engineering
Author 
Razeghi, Manijeh. author. SpringerLink (Online service)
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Electronic Access 
http://dx.doi.org/10.1007/0-387-28751-5
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16. 
Cover image for Semiconductor Physical Electronics
Semiconductor Physical Electronics
Author 
Li, Sheng S. editor. SpringerLink (Online service)
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ONLINE
Electronic Access 
http://dx.doi.org/10.1007/0-387-37766-2
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17. 
Cover image for The Physics of Semiconductors An Introduction Including Devices and Nanophysics
The Physics of Semiconductors An Introduction Including Devices and Nanophysics
Author 
Grundmann, Marius. author. SpringerLink (Online service)
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ONLINE
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http://dx.doi.org/10.1007/3-540-34661-9
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18. 
Cover image for Spin Dynamics in Confined Magnetic Structures III
Spin Dynamics in Confined Magnetic Structures III
Author 
Hillebrands, Burkard. editor. Thiaville, André. editor. SpringerLink (Online service)
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ONLINE
Electronic Access 
http://dx.doi.org/10.1007/b12462
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19. 
Cover image for Nanoscale Transistors Device Physics, Modeling and Simulation
Nanoscale Transistors Device Physics, Modeling and Simulation
Author 
Lundstrom, Mark S. author. Guo, Jing. author. SpringerLink (Online service)
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ONLINE
Electronic Access 
http://dx.doi.org/10.1007/0-387-28003-0
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20. 
Cover image for Planewaves, Pseudopotentials and the LAPW Method
Planewaves, Pseudopotentials and the LAPW Method
Author 
Singh, David J. author. Nordström, Lars. author. SpringerLink (Online service)
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ONLINE
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http://dx.doi.org/10.1007/978-0-387-29684-5
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21. 
Cover image for Introduction to Focused Ion Beams Instrumentation, Theory, Techniques and Practice
Introduction to Focused Ion Beams Instrumentation, Theory, Techniques and Practice
Author 
Giannuzzi, Lucille A. editor. Stevie, Fred A. editor. SpringerLink (Online service)
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Electronic Access 
http://dx.doi.org/10.1007/b101190
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22. 
Cover image for Lifetime Spectroscopy A Method of Defect Characterization in Silicon for Photovoltaic Applications
Lifetime Spectroscopy A Method of Defect Characterization in Silicon for Photovoltaic Applications
Author 
Rein, Stefan. author. SpringerLink (Online service)
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ONLINE
Electronic Access 
http://dx.doi.org/10.1007/3-540-27922-9
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23. 
Cover image for Thin Films and Heterostructures for Oxide Electronics
Thin Films and Heterostructures for Oxide Electronics
Author 
Ogale, Satischandra B. author. SpringerLink (Online service)
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http://dx.doi.org/10.1007/b136780
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24. 
Cover image for Semiconductor Optics
Semiconductor Optics
Author 
Klingshirn, Claus. author. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE
Electronic Access 
http://dx.doi.org/10.1007/b138175
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