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SpringerLink (Online service)

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Chaturvedi, Nitin. editor.

(2)

Dwivedi, Devesh. editor.

(2)

Gupta, Anu. editor.

(2)

Pandey, Jai Gopal. editor. (orcid)0000-0001-9937-7438

(2)

Wang, Laung-Terng.

(2)

Abramovici, Miron.

(1)

(1)

Agrawal, Vishwani D., 1943-

(1)

Bakir, Muhannad S., editor.

(1)

Breuer, Melvin A.

(1)

Bushnell, Michael L. (Michael Lee), 1950-

(1)

(1)

Chakrabarty, Krishnendu, editor of compilation.

(1)

Chakrabarty, Krishnendu. author.

(1)

Chen, Wai-Kai, 1936-

(1)

Domingo, George, 1937- author.

(1)

Dorf, Richard C., author

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Dorf, Richard C., editor.

(1)

Franzon, Paul D., editor.

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Friedman, Arthur D.

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Frobenius, Rex.

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Goel, Sandeep K, editor of compilation.

(1)

Heyman, Joseph S.

(1)

Huang, Wei, editor.

(1)

Hurst, Stanley L.

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IEEE Circuits and Systems Society.

(1)

Iniewski, Krzysztof Kris. author.

(1)

J.M. Veendrick, Harry. author.

(1)

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Lidow, Alex, author.

(1)

Machado, Gerson A. S., ed.

(1)

Marinissen, Eric Jan, editor.

(1)

Meng, Hong, editor.

(1)

Oklobdzija, Vojin G.

(1)

Oklobdzija, Vojin G., author.

(1)

Perelroyzen, Evgeni.

(1)

Pineda de Gyvez, José.

(1)

Pradhan, Dhiraj K.

(1)

Puers, R., editor.

(1)

Ramaswami, Sesh.

(1)

Russell, Gordon, ed.

(1)

Scott, Allan W.

(1)

Sharma, Rohit, editor.

(1)

Stroud, Charles E.

(1)

Taylor, Gaynor, ed.

(1)

(1)

Veendrick, Harry. author.

(1)

Voldman, Steven H.

(1)

Wang, Albert Z. H., 1962- author.

(1)

Wang, Francis C.

(1)

Wang, Ran. author.

(1)

(1)

Whitaker, Jerry C.

(1)

Wiley InterScience (Online service)

(1)

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Wu, Cheng-Wen, EE Ph. D.

(1)

Yichuang Sun, ed.

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Zurawski, Richard.

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Subject

Electronic Circuits and Systems.

(6)

Electronic books.

(6)

Electronic circuits.

(6)

(5)

Computer engineering.

(4)

Digital integrated circuits -- Testing.

(4)

Integrated circuits--Testing.

(4)

Application-specific integrated circuits.

(3)

Integrated circuits -- Testing.

(3)

Integrated circuits -- Very large scale integration -- Testing.

(3)

Computer Engineering and Networks.

(2)

Computer networks .

(2)

Digital integrated circuits -- Design and construction.

(2)

Electronics and Microelectronics, Instrumentation.

(2)

Electrostatics.

(2)

Integrated circuits -- Protection.

(2)

Integrated circuits -- Very large scale integration -- Design.

(2)

Integrated circuits--Very large scale integration.

(2)

Linear integrated circuits.

(2)

(2)

TECHNOLOGY & ENGINEERING -- Mechanical.

(2)

TECHNOLOGY & ENGINEERING.

(2)

(2)

Three-dimensional integrated circuits.

(2)

(1)

Cell phones -- Equipment and supplies -- Design and construction.

(1)

Circuits intégrés -- Conception et construction.

(1)

Circuits intégrés -- Protection.

(1)

(1)

Computer architecture.

(1)

(1)

Digital electronics.

(1)

Digital integrated circuits.

(1)

Digitalschaltung.

(1)

Dijital entegre devreler -- Test.

(1)

Discrete cosine transforms.

(1)

Electric circuit analysis.

(1)

Electric discharges -- Prevention.

(1)

Electric discharges.

(1)

Electrical engineering.

(1)

Electronic apparatus and appliances

(1)

Electronic apparatus and appliances -- Design and construction.

(1)

Electronic apparatus and appliances.

(1)

Electronic circuits--Testing.

(1)

Electronic digital computers.

(1)

Electronic packaging.

(1)

(1)

(1)

Embedded Systems.

(1)

Embedded computer systems -- Handbooks, manuals, etc.

(1)

Embedded computer systems.

(1)

Expert systems (Computer science).

(1)

Field-effect transistors.

(1)

Gallium nitride.

(1)

Guides et manuels.

(1)

(1)

Handbooks and manuals

(1)

Handbooks and manuals.

(1)

Imagerie tridimensionnelle -- Guides, manuels, etc.

(1)

Integrated circuit layout.

(1)

Integrated circuits -- Computer-aided design.

(1)

Integrated circuits -- Design and construction

(1)

Integrated circuits -- Design and construction.

(1)

Integrated circuits -- Protection

(1)

Integrated circuits -- Reliability -- Congresses.

(1)

Integrated circuits -- Reliability.

(1)

Integrated circuits -- Testing -- Congresses.

(1)

Integrated circuits -- Very large scale integration.

(1)

Integrated circuits industry.

(1)

Integrated circuits--Computer-aided design.

(1)

Integrated circuits--Design and construction.

(1)

Integrated circuits--Reliability.

(1)

Integrated circuits.

(1)

Internet Resources.

(1)

Logic circuits--Computer-aided design.

(1)

Low voltage integrated circuits.

(1)

Materials for Devices.

(1)

(1)

Mathematical models.

(1)

Metal oxide semiconductors, Complementary -- Computer-aided design.

(1)

Metal oxide semiconductors, Complementary -- Testing.

(1)

Microelectronic packaging.

(1)

Microelectronics.

(1)

Microprocessors.

(1)

Microwaves, RF Engineering and Optical Communications.

(1)

Mise sous boîtier (Électronique)

(1)

Multichip modules (Microelectronics)

(1)

Nanoelectronics

(1)

Nanoelectronics.

(1)

Nanotechnologie.

(1)

(1)

Nanotechnology.

(1)

Nanoélectronique.

(1)

Nitrure de gallium.

(1)

Nondestructive testing -- Congresses.

(1)

Power electronics.

(1)

Power transistors.

(1)

Processor Architectures.

(1)

Production engineering.

(1)

Radio frequency integrated circuits -- Testing.

(1)

Radio frequency integrated circuits.

(1)

Semi-conducteurs.

(1)

(1)

Semiconductors -- Design and construction.

(1)

Semiconductors -- Failures.

(1)

Semiconductors -- Testing.

(1)

Semiconductors.

(1)

Signal processing.

(1)

Simulated annealing (Mathematics).

(1)

Solid state electronics

(1)

Solid state electronics.

(1)

Static eliminators

(1)

Static eliminators.

(1)

Systems on a chip -- Testing.

(1)

Systems on a chip.

(1)

TECHNOLOGY & ENGINEERING -- Electronics -- Semiconductors.

(1)

Telecommunication.

(1)

Test circuit intégré

(1)

(1)

Three-dimensional imaging

(1)

Three-dimensional imaging -- Handbooks, manuals, etc.

(1)

Three-dimensional integrated circuits -- Computer-aided design.

(1)

Three-dimensional integrated circuits -- Design and construction -- Handbooks, manuals, etc.

(1)

Three-dimensional integrated circuits -- Design and construction.

(1)

Three-dimensional integrated circuits -- Testing.

(1)

Transistors de puissance.

(1)

Transistors à effet de champ.

(1)

(1)

Wireless communication systems -- Equipment and supplies -- Design and construction.

(1)

antistatic agent.

(1)

electronic engineering.

(1)

(1)

(1)

Électronique de l'état solide.

(1)

(1)

İntegre Devreler -- Çok geniş kapsamlı integre devreler -- Test.

(1)

Material Type

Shelf Location

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Electronic Library

Wiley E-Book Collection

Library

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1.

Cover image for Nanoelectronics : materials, devices, applications

Nanoelectronics : materials, devices, applications

Nanoelectronics : materials, devices, applications

Author

Puers, R., editor.

Preferred Shelf Number

TK7874.84

Electronic Access

https://onlinelibrary.wiley.com/doi/book/10.1002/9783527800728

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Online Library~1

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2.

Cover image for Nanometer CMOS ICs From Basics to ASICs

Nanometer CMOS ICs From Basics to ASICs

Nanometer CMOS ICs From Basics to ASICs

Author

J.M. Veendrick, Harry. author. SpringerLink (Online service)

Preferred Shelf Number

ONLINE

Electronic Access

https://doi.org/10.1007/978-3-319-47597-4

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3.

Cover image for Design of 3D integrated circuits and systems

Design of 3D integrated circuits and systems

Design of 3D integrated circuits and systems

Author

Sharma, Rohit, editor.

Preferred Shelf Number

TK7874.893 .D48 2014

Electronic Access

Click here to view.

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4.

Cover image for 3D IC stacking technology

3D IC stacking technology

3D IC stacking technology

Author

Wu, Banqiu. Kumar, Ajay. Ramaswami, Sesh.

Preferred Shelf Number

ONLINE

Electronic Access

Subscription required

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5.

Cover image for ESD failure mechanisms and models

ESD failure mechanisms and models

ESD failure mechanisms and models

Author

Voldman, Steven H. Wiley InterScience (Online service)

Preferred Shelf Number

ONLINE

Electronic Access

John Wiley http://dx.doi.org/10.1002/9780470747254
http://site.ebrary.com/lib/alltitles/Doc?id=10317806

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6.

Cover image for System-on-chip test architectures nanometer design for testability

System-on-chip test architectures nanometer design for testability

System-on-chip test architectures nanometer design for testability

Author

Wang, Laung-Terng. Stroud, Charles E. Touba, Nur A.

Preferred Shelf Number

ONLINE

Electronic Access

ScienceDirect http://www.sciencedirect.com/science/book/9780123739735

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7.

Cover image for Test and Diagnosis of Analogue, Mixed-Signal and RF Integrated Circuits The system on chip approach

Test and Diagnosis of Analogue, Mixed-Signal and RF Integrated Circuits The system on chip approach

Test and Diagnosis of Analogue, Mixed-Signal and RF Integrated Circuits The system on chip approach

Author

Yichuang Sun, ed.

Preferred Shelf Number

ONLINE

Electronic Access

http://dx.doi.org/10.1049/PBCS019E

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8.

Cover image for RF measurements for cellular phones and wireless data systems

RF measurements for cellular phones and wireless data systems

RF measurements for cellular phones and wireless data systems

Author

Scott, Allan W. Frobenius, Rex.

Preferred Shelf Number

ONLINE

Electronic Access

IEEE Xplore http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5361014

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9.

Cover image for Digital design and fabrication

Digital design and fabrication

Digital design and fabrication

Author

Oklobdzija, Vojin G.

Preferred Shelf Number

TK7885 .D54 2008

Electronic Access

Click here to view.

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10.

Cover image for The VLSI handbook

The VLSI handbook

The VLSI handbook

Author

Chen, Wai-Kai, 1936-

Preferred Shelf Number

TK7874.75 .V573 2007

Electronic Access

Click here to view.

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11.

Cover image for Digital integrated circuits : design-for-test using Simulink and Stateflow

Digital integrated circuits : design-for-test using Simulink and Stateflow

Digital integrated circuits : design-for-test using Simulink and Stateflow

Author

Perelroyzen, Evgeni.

Preferred Shelf Number

TK7874 .P445 2007

Format:

Availability

Beytepe Library~1

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12.

Cover image for Microelectronics

Microelectronics

Microelectronics

Author

Whitaker, Jerry C.

Preferred Shelf Number

TK7874 .M4587 2006

Electronic Access

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