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1. 
Cover image for Characterization of High Tc Materials and Devices by Electron Microscopy
Characterization of High Tc Materials and Devices by Electron Microscopy
Author 
Browning, Nigel D.. Pennycook, Stephen J..
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ONLINE
Electronic Access 
Access by subscription
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2. 
Cover image for Handbook of microscopy applications in materials science, solid-state physics and chemistry. Applications
Handbook of microscopy applications in materials science, solid-state physics and chemistry. Applications
Author 
Amelinckx, S. (Severin) Wiley InterScience (Online service)
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ONLINE
Electronic Access 
Wiley InterScience An electronic book accessible through the World Wide Web; click for information
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3. 
Cover image for Handbook of microscopy applications in materials science, solid-state physics, and chemistry
Handbook of microscopy applications in materials science, solid-state physics, and chemistry
Author 
Amelinckx, S. (Severin) Wiley InterScience (Online service)
Preferred Shelf Number 
ONLINE
Electronic Access 
John Wiley http://dx.doi.org/10.1002/9783527619283
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4. 
Cover image for Handbook of microscopy applications in materials science, solid-state physics, and chemistry
Handbook of microscopy applications in materials science, solid-state physics, and chemistry
Author 
Amelinckx, S. (Severin) Wiley InterScience (Online service)
Preferred Shelf Number 
ONLINE
Electronic Access 
Wiley InterScience An electronic book accessible through the World Wide Web; click for information
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5. 
Cover image for Handbook of microscopy applications in materials science, solid-state physics and chemistry. Methods I
Handbook of microscopy applications in materials science, solid-state physics and chemistry. Methods I
Author 
Amelinckx, S. (Severin) Wiley InterScience (Online service)
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ONLINE
Electronic Access 
Wiley InterScience An electronic book accessible through the World Wide Web; click for information
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6. 
Cover image for Electron microscopy in plasticity and fracture research of materials : proceedings of the international symposium held at Holzhau near Dresden, 8 to 13 October 1989
Electron microscopy in plasticity and fracture research of materials : proceedings of the international symposium held at Holzhau near Dresden, 8 to 13 October 1989
Author 
Messerschmidt, U. , ed.
Preferred Shelf Number 
TA 417.35 E43 1990
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7. 
Cover image for Scanning electron microscopy : applications to materials and device science
Scanning electron microscopy : applications to materials and device science
Author 
Thornton, P. R.
Preferred Shelf Number 
QH 212.E4 T52 1968 1.K
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8. 
Cover image for Electron microscopy in heterogeneous catalysis
Electron microscopy in heterogeneous catalysis
Author 
Gai, Pratibha L., 1948, author. Boyes, E. D. (Edward D.)
Preferred Shelf Number 
QD505 .G35 2003
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9. 
Cover image for Characterization of radiation-damage by transmission electron microscopy
Characterization of radiation-damage by transmission electron microscopy
Author 
Jenkins, M. L., 1949, author. Kirk, M. A., 1942-
Preferred Shelf Number 
TA418.6 .J46 2001
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10. 
Cover image for Characterization of radiation-damage by transmission electron microscopy
Characterization of radiation-damage by transmission electron microscopy
Author 
Jenkins, M. L., 1949, author. Kirk, M. A., 1942-
Preferred Shelf Number 
TA418.6 .J46 2001
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11. 
Cover image for Polymer surface modification : relevance to adhesion
Polymer surface modification : relevance to adhesion
Author 
International Symposium on Polymer Surface Modification: Relevance to Adhesion. Mittal, K. L., 1945-
Preferred Shelf Number 
QD381.9 .S97 I58 1996
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12. 
Cover image for Core-Shell Nanomaterials From Fundamentals to Applications
Core-Shell Nanomaterials From Fundamentals to Applications
Author 
Sharma, Shreya. Phogat, Peeyush. Thakur, Jahanvi. Singh, N. L.
Preferred Shelf Number 
XX(600416.1)
Electronic Access 
https://onlinelibrary.wiley.com/doi/book/10.1002/9783527855766
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