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1. 
Cover image for Recent Advances in Mechanical Engineering Select Proceedings of STAAAR 2022
Recent Advances in Mechanical Engineering Select Proceedings of STAAAR 2022
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Sethuraman, Balaguru. editor. Jain, Pushpdant. editor. Gupta, Manoj. editor. SpringerLink (Online service)
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https://doi.org/10.1007/978-981-99-2349-6
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Cover image for Advances in Reliability and Safety Assessment for Critical Systems Proceedings of the 5th National Conference on Reliability and Safety (NCRS 2022)
Advances in Reliability and Safety Assessment for Critical Systems Proceedings of the 5th National Conference on Reliability and Safety (NCRS 2022)
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Senthil Kumar, C. editor. Sujatha, R. editor. Muthukumar, R. editor. Rao, K. Balaji. editor. Prakash, Raghu V. editor.
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https://doi.org/10.1007/978-981-99-5049-2
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Cover image for Passive and Active Measurement 24th International Conference, PAM 2023, Virtual Event, March 21-23, 2023, Proceedings
Passive and Active Measurement 24th International Conference, PAM 2023, Virtual Event, March 21-23, 2023, Proceedings
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Brunstrom, Anna. editor. Flores, Marcel. editor. Fiore, Marco. editor. SpringerLink (Online service)
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https://doi.org/10.1007/978-3-031-28486-1
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Cover image for Computational Science and Its Applications - ICCSA 2023 23rd International Conference, Athens, Greece, July 3-6, 2023, Proceedings, Part I
Computational Science and Its Applications - ICCSA 2023 23rd International Conference, Athens, Greece, July 3-6, 2023, Proceedings, Part I
Author 
Gervasi, Osvaldo. editor. (orcid) Murgante, Beniamino. editor. (orcid) Taniar, David. editor. Apduhan, Bernady O. editor. Braga, Ana Cristina. editor.
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5. 
Cover image for Computer Safety, Reliability, and Security. SAFECOMP 2023 Workshops ASSURE, DECSoS, SASSUR, SENSEI, SRToITS, and WAISE, Toulouse, France, September 19, 2023, Proceedings
Computer Safety, Reliability, and Security. SAFECOMP 2023 Workshops ASSURE, DECSoS, SASSUR, SENSEI, SRToITS, and WAISE, Toulouse, France, September 19, 2023, Proceedings
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Guiochet, Jérémie. editor. Tonetta, Stefano. editor. Schoitsch, Erwin. editor. Roy, Matthieu. editor. Bitsch, Friedemann. editor.
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https://doi.org/10.1007/978-3-031-40953-0
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6. 
Cover image for Which-Is-Better (WIB): Problems in Reliability Theory
Which-Is-Better (WIB): Problems in Reliability Theory
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Mizutani, Satoshi. author. Zhao, Xufeng. author. Nakagawa, Toshio. author. SpringerLink (Online service)
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https://doi.org/10.1007/978-3-031-27316-2
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Cover image for Applications in Reliability and Statistical Computing
Applications in Reliability and Statistical Computing
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Pham, Hoang. editor. SpringerLink (Online service)
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https://doi.org/10.1007/978-3-031-21232-1
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8. 
Cover image for Proceedings of 2023 Chinese Intelligent Automation Conference
Proceedings of 2023 Chinese Intelligent Automation Conference
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Deng, Zhidong. editor. SpringerLink (Online service)
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9. 
Cover image for Proceedings of the 16th International Conference on Electrostatic Precipitation
Proceedings of the 16th International Conference on Electrostatic Precipitation
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Németh, Bálint. editor. SpringerLink (Online service)
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https://doi.org/10.1007/978-3-031-34526-5
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10. 
Cover image for Advanced Communication and Intelligent Systems Second International Conference, ICACIS 2023, Warsaw, Poland, June 16-17, 2023, Revised Selected Papers, Part II
Advanced Communication and Intelligent Systems Second International Conference, ICACIS 2023, Warsaw, Poland, June 16-17, 2023, Revised Selected Papers, Part II
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Shaw, Rabindra Nath. editor. Paprzycki, Marcin. editor. Ghosh, Ankush. editor. SpringerLink (Online service)
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11. 
Cover image for Responsive and Sustainable Educational Futures 18th European Conference on Technology Enhanced Learning, EC-TEL 2023, Aveiro, Portugal, September 4-8, 2023, Proceedings
Responsive and Sustainable Educational Futures 18th European Conference on Technology Enhanced Learning, EC-TEL 2023, Aveiro, Portugal, September 4-8, 2023, Proceedings
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Viberg, Olga. editor. Jivet, Ioana. editor. Muñoz-Merino, Pedro J. editor. Perifanou, Maria. editor. Papathoma, Tina. editor.
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12. 
Cover image for Interconnect Reliability in Advanced Memory Device Packaging
Interconnect Reliability in Advanced Memory Device Packaging
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Gan, Chong Leong,. author. Huang, Chen-Yu,. author. SpringerLink (Online service)
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