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1. 
Cover image for Nanometer CMOS ICs From Basics to ASICs
Nanometer CMOS ICs From Basics to ASICs
Author 
J.M. Veendrick, Harry. author. SpringerLink (Online service)
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https://doi.org/10.1007/978-3-319-47597-4
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Cover image for VLSI-SoC: Design for Reliability, Security, and Low Power 23rd IFIP WG 10.5/IEEE International Conference on Very Large Scale Integration, VLSI-SoC 2015, Daejeon, Korea, October 5-7, 2015, Revised Selected Papers
VLSI-SoC: Design for Reliability, Security, and Low Power 23rd IFIP WG 10.5/IEEE International Conference on Very Large Scale Integration, VLSI-SoC 2015, Daejeon, Korea, October 5-7, 2015, Revised Selected Papers
Author 
Shin, Youngsoo. editor. Tsui, Chi Ying. editor. Kim, Jae-Joon. editor. Choi, Kiyoung. editor. Reis, Ricardo. editor. (orcid)0000-0001-5781-5858
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https://doi.org/10.1007/978-3-319-46097-0
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3. 
Cover image for Intelligent Computing and Applications Proceedings of the International Conference on ICA, 22-24 December 2014
Intelligent Computing and Applications Proceedings of the International Conference on ICA, 22-24 December 2014
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Mandal, Durbadal. editor. Kar, Rajib. editor. Das, Swagatam. editor. Panigrahi, Bijaya Ketan. editor. SpringerLink (Online service)
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https://doi.org/10.1007/978-81-322-2268-2
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Cover image for Application of Evolutionary Algorithms for Multi-objective Optimization in VLSI and Embedded Systems
Application of Evolutionary Algorithms for Multi-objective Optimization in VLSI and Embedded Systems
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Bhuvaneswari, M.C. editor. SpringerLink (Online service)
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https://doi.org/10.1007/978-81-322-1958-3
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5. 
Cover image for Advanced research in VLSI proceedings of the fifth MIT conference, March 1988
Advanced research in VLSI proceedings of the fifth MIT conference, March 1988
Author 
Allen, Jonathan, 1934- Leighton, Frank Thomson. Massachusetts Institute of Technology. Microsystems Research Center. MIT Conference on Advanced Research in VLSI (5th : 1988 : Cambridge, Mass.)
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IEEE Xplore http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=6276833
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6. 
Cover image for Logic testing and design for testability
Logic testing and design for testability
Author 
Fujiwara, Hideo.
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IEEE Xplore http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=6267264
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