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2605. 
Cover image for Handbook of semiconductor technology
Handbook of semiconductor technology
Author 
Jackson, Kenneth A. Schröter, W. (Wolfgang)
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ONLINE
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Wiley InterScience An electronic book accessible through the World Wide Web; click for information
Wiley InterScience An electronic book accessible through the World Wide Web; click for information
Knovel http://app.knovel.com/web/toc.v/cid:kpHSTV0003
John Wiley http://dx.doi.org/10.1002/9783527619290
HathiTrust Digital Library Limited view (search only) http://catalog.hathitrust.org/api/volumes/oclc/43030635.html
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2606. 
Cover image for The Euro capital market
The Euro capital market
Author 
Gros, Daniel, 1955- Lannoo, Karel.
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Full text available from Wiley InterScience
John Wiley http://dx.doi.org/10.1002/047001329X
Contributor biographical information http://catdir.loc.gov/catdir/bios/wiley041/99032598.html
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2607. 
Cover image for Sorting a distribution theory
Sorting a distribution theory
Author 
Mahmoud, Hosam M. (Hosam Mahmoud), 1954-
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John Wiley http://dx.doi.org/10.1002/9781118032886
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2608. 
Cover image for Optimization foundations and applications
Optimization foundations and applications
Author 
Miller, Ronald E.
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John Wiley http://dx.doi.org/10.1002/9781118032930
ebrary http://site.ebrary.com/id/10462151
Contributor biographical information http://catdir.loc.gov/catdir/bios/wiley042/99021921.html
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2609. 
Cover image for Positive linear systems theory and applications
Positive linear systems theory and applications
Author 
Farina, Lorenzo, 1963- Rinaldi, S. (Sergio), 1940- Wiley InterScience (Online service)
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Wiley InterScience An electronic book accessible through the World Wide Web; click for information
Ebook Library Click here to view book
Contributor biographical information http://catdir.loc.gov/catdir/bios/wiley043/00021312.html
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2610. 
Cover image for Logic-based methods for optimization combining optimization and constraint satisfaction
Logic-based methods for optimization combining optimization and constraint satisfaction
Author 
Hooker, John, 1949- Wiley InterScience (Online service)
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Wiley InterScience An electronic book accessible through the World Wide Web; click for information
Contributor biographical information http://catdir.loc.gov/catdir/bios/wiley043/99088732.html
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2611. 
Cover image for Reliability modeling, prediction, and optimization
Reliability modeling, prediction, and optimization
Author 
Blischke, W. R., 1934- Murthy, D. N. P. Wiley InterScience (Online service)
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Wiley InterScience An electronic book accessible through the World Wide Web; click for information
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Available by subscription from Safari Books Online
Contributor biographical information http://catdir.loc.gov/catdir/bios/wiley043/99053029.html
HathiTrust Digital Library, Limited view (search only) http://catalog.hathitrust.org/api/volumes/oclc/42708105.html
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2612. 
Cover image for Learning to reason an introduction to logic, sets and relations
Learning to reason an introduction to logic, sets and relations
Author 
Rodgers, Nancy, 1941-
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Wiley InterScience An electronic book accessible through the World Wide Web; click for information
Ebook Library Click here to view book
Contributor biographical information http://catdir.loc.gov/catdir/bios/wiley043/00023492.html
ebrary http://site.ebrary.com/id/10500922
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2613. 
Cover image for Finite mixture models
Finite mixture models
Author 
McLachlan, Geoffrey J., 1946- Peel, David, 1971- John Wiley & Sons.
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John Wiley http://dx.doi.org/10.1002/0471721182
http://www3.interscience.wiley.com/cgi-bin/bookhome/109856105
Contributor biographical information http://catdir.loc.gov/catdir/bios/wiley043/00043324.html
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2614. 
Cover image for Protein sequencing and identification using tandem mass spectrometry
Protein sequencing and identification using tandem mass spectrometry
Author 
Kinter, Michael. Sherman, Nicholas E. John Wiley & Sons.
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John Wiley http://dx.doi.org/10.1002/0471721980
Contributor biographical information http://catdir.loc.gov/catdir/bios/wiley043/00038204.html
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2615. 
Cover image for Applied logistic regression
Applied logistic regression
Author 
Hosmer, David W. Lemeshow, Stanley. John Wiley & Sons.
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John Wiley http://dx.doi.org/10.1002/0471722146
http://www3.interscience.wiley.com/cgi-bin/bookhome/109855848
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2616. 
Cover image for The probabilistic method
The probabilistic method
Author 
Alon, Noga. Spencer, Joel H. John Wiley & Sons.
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John Wiley http://dx.doi.org/10.1002/0471722154
http://www3.interscience.wiley.com/cgi-bin/bookhome/109790495
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