Limit Search Results
Author
SpringerLink (Online service)
(67)
Wiley InterScience (Online service)
(37)
John Wiley & Sons.
(6)
Francombe, Maurice H.
(5)
Morkoç, Hadis.
(5)
Language
Publication Date
-
Subject
Semiconductors.
(109)
Electronic books.
(44)
Optical materials.
(37)
Physics.
(28)
Semiconductors -- Materials.
(28)
Material Type
Shelf Location
Library
Switch to list view
Switch to thumbnail view
Select an Action
463 Results Found Subscribe to search results
000000000000DEFAULT
Print
289. 
Cover image for Semiconductor quantum bits
Semiconductor quantum bits
Author 
Benson, Oliver. Henneberger, Fritz.
Preferred Shelf Number 
ONLINE
Electronic Access 
Distributed by publisher. Purchase or institutional license may be required for access.
Format: 
Availability 
Online Library~1
Available:
Copies:
290. 
Cover image for Nano-CMOS design for manufacturability robust circuit and physical design for sub-65 nm technology nodes
Nano-CMOS design for manufacturability robust circuit and physical design for sub-65 nm technology nodes
Author 
Wong, Ban P., 1953-
Preferred Shelf Number 
ONLINE
Electronic Access 
Click here to view book
Knovel http://app.knovel.com/web/toc.v/cid:kpNCMOSDM2
John Wiley http://dx.doi.org/10.1002/9780470382820
Ebook Library http://public.eblib.com/EBLPublic/PublicView.do?ptiID=413074_0
http://site.ebrary.com/lib/alltitles/Doc?id=10278707
Format: 
Availability 
Online Library~1
Available:
Copies:
291. 
Cover image for Organic electronics structural and electronic properties of OFETs
Organic electronics structural and electronic properties of OFETs
Author 
Wöll, Christof. Wiley InterScience (Online service)
Preferred Shelf Number 
ONLINE
Electronic Access 
Ebook Library http://public.eblib.com/EBLPublic/PublicView.do?ptiID=482374
John Wiley http://dx.doi.org/10.1002/9783527627387
http://www3.interscience.wiley.com/cgi-bin/bookhome/122498289
http://site.ebrary.com/lib/alltitles/Doc?id=10313609
Format: 
Availability 
Online Library~1
Available:
Copies:
292. 
Cover image for Electronic device architectures for the nano-CMOS era from ultimate CMOS scaling to beyond CMOS devices
Electronic device architectures for the nano-CMOS era from ultimate CMOS scaling to beyond CMOS devices
Author 
Deleonibus, Simon.
Preferred Shelf Number 
ONLINE
Electronic Access 
Distributed by publisher. Purchase or institutional license may be required for access.
Format: 
Availability 
Online Library~1
Available:
Copies:
293. 
Cover image for Tunable laser applications
Tunable laser applications
Author 
Duarte, F. J. (Frank J.)
Preferred Shelf Number 
ONLINE
Electronic Access 
Distributed by publisher. Purchase or institutional license may be required for access.
Format: 
Availability 
Online Library~1
Available:
Copies:
294. 
Cover image for Processing of nanoparticle structures and composites a collection of papers presented at the 2008 Materials Science and Technology Conference (MS & T08) October 5-9, 2008, Pittsburgh, Pennsylvania
Processing of nanoparticle structures and composites a collection of papers presented at the 2008 Materials Science and Technology Conference (MS & T08) October 5-9, 2008, Pittsburgh, Pennsylvania
Author 
Materials Science & Technology Conference (2008 : Pittsburgh, Pa.) Hinklin, Tom. Lu, Kathy. Wiley InterScience (Online service)
Preferred Shelf Number 
ONLINE
Electronic Access 
John Wiley http://dx.doi.org/10.1002/9780470551523
http://site.ebrary.com/lib/alltitles/Doc?id=10341612
Format: 
Availability 
Online Library~1
Available:
Copies:
295. 
Cover image for Power electronics semiconductor devices
Power electronics semiconductor devices
Author 
Perret, Robert (Robert Jos)
Preferred Shelf Number 
ONLINE
Electronic Access 
Ebook Library http://public.eblib.com/EBLPublic/PublicView.do?ptiID=477696
John Wiley http://dx.doi.org/10.1002/9780470611494
Books24x7 http://www.books24x7.com/marc.asp?bookid=31186
http://site.ebrary.com/lib/alltitles/Doc?id=10361049
Format: 
Availability 
Online Library~1
Available:
Copies:
296. 
Cover image for ESD failure mechanisms and models
ESD failure mechanisms and models
Author 
Voldman, Steven H. Wiley InterScience (Online service)
Preferred Shelf Number 
ONLINE
Electronic Access 
John Wiley http://dx.doi.org/10.1002/9780470747254
http://site.ebrary.com/lib/alltitles/Doc?id=10317806
Format: 
Availability 
Online Library~1
Available:
Copies:
297. 
Cover image for Electrical characterization of organic electronic materials and devices
Electrical characterization of organic electronic materials and devices
Author 
Stallinga, Peter, 1966- Wiley InterScience (Online service)
Preferred Shelf Number 
ONLINE
Electronic Access 
John Wiley http://dx.doi.org/10.1002/9780470750162
http://site.ebrary.com/lib/alltitles/Doc?id=10342813
Format: 
Availability 
Online Library~1
Available:
Copies:
298. 
Cover image for Electrons and Phonons in Semiconductor Multilayers
Electrons and Phonons in Semiconductor Multilayers
Author 
Ridley, B. K..
Preferred Shelf Number 
ONLINE
Electronic Access 
Access by subscription
Format: 
Availability 
Online Library~1
Available:
Copies:
299. 
Cover image for Reliability wearout mechanisms in advanced CMOS technologies
Reliability wearout mechanisms in advanced CMOS technologies
Author 
Strong, Alvin Wayne, 1946-
Preferred Shelf Number 
ONLINE
Electronic Access 
IEEE Xplore http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5361029
Format: 
Availability 
Online Library~1
Available:
Copies:
300. 
Cover image for Transient-induced latchup in CMOS integrated circuits
Transient-induced latchup in CMOS integrated circuits
Author 
Ker, Ming-Dou. Hsu, Sheng-Fu.
Preferred Shelf Number 
ONLINE
Electronic Access 
IEEE Xplore http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5453758
Format: 
Availability 
Online Library~1
Available:
Copies:
Select an Action