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1. 
Cover image for Rationale-Based Software Engineering
Rationale-Based Software Engineering
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Burge, Janet E. author. Carroll, John M. author. McCall, Raymond. author. Mistrik, Ivan. author. SpringerLink (Online service)
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http://dx.doi.org/10.1007/978-3-540-77583-6
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Cover image for Intelligent Computer Techniques in Applied Electromagnetics
Intelligent Computer Techniques in Applied Electromagnetics
Author 
Wiak, Sławomir. editor. Krawczyk, Andrzej. editor. Dolezel, Ivo. editor. SpringerLink (Online service)
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http://dx.doi.org/10.1007/978-3-540-78490-6
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Cover image for Model Order Reduction: Theory, Research Aspects and Applications
Model Order Reduction: Theory, Research Aspects and Applications
Author 
Schilders, Wilhelmus H. A. editor. Vorst, Henk A. editor. Rommes, Joost. editor. SpringerLink (Online service)
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http://dx.doi.org/10.1007/978-3-540-78841-6
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4. 
Cover image for Mathematik für Ingenieure und Naturwissenschaftler Band 3 Vektoranalysis, Wahrscheinlichkeitsrechnung, Mathematische Statistik, Fehler- und Ausgleichsrechnung
Mathematik für Ingenieure und Naturwissenschaftler Band 3 Vektoranalysis, Wahrscheinlichkeitsrechnung, Mathematische Statistik, Fehler- und Ausgleichsrechnung
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Papula, Lothar. author. SpringerLink (Online service)
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http://dx.doi.org/10.1007/978-3-8348-9472-4
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5. 
Cover image for Rapid Prototyping of Digital Systems
Rapid Prototyping of Digital Systems
Author 
Hamblen, James O. author. Hall, Tyson S. author. Furman, Michael D. author. SpringerLink (Online service)
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http://dx.doi.org/10.1007/978-0-387-72671-7
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6. 
Cover image for Modern Power Systems Analysis
Modern Power Systems Analysis
Author 
Wang, Xi-Fan. author. Song, Yonghua. author. Irving, Malcolm. author. SpringerLink (Online service)
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http://dx.doi.org/10.1007/978-0-387-72853-7
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7. 
Cover image for Emerging Nanotechnologies Test, Defect Tolerance, and Reliability
Emerging Nanotechnologies Test, Defect Tolerance, and Reliability
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Tehranipoor, Mohammad. editor. SpringerLink (Online service)
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http://dx.doi.org/10.1007/978-0-387-74747-7
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8. 
Cover image for Communication System Design Using DSP Algorithms with Laboratory Experiments for the TMS320C6713™ DSK
Communication System Design Using DSP Algorithms with Laboratory Experiments for the TMS320C6713™ DSK
Author 
Tretter, Steven A. author. SpringerLink (Online service)
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http://dx.doi.org/10.1007/978-0-387-74886-3
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9. 
Cover image for Nanometer Technology Designs High-Quality Delay Tests
Nanometer Technology Designs High-Quality Delay Tests
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Tehranipoor, Mohammad. author. Ahmed, Nisar. author. SpringerLink (Online service)
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http://dx.doi.org/10.1007/978-0-387-75728-5
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10. 
Cover image for RF Imperfections in High-rate Wireless Systems Impact and Digital Compensation
RF Imperfections in High-rate Wireless Systems Impact and Digital Compensation
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Schenk, Tim. author. SpringerLink (Online service)
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http://dx.doi.org/10.1007/978-1-4020-6903-1
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11. 
Cover image for Nanometer CMOS ICs From basics to ASICs
Nanometer CMOS ICs From basics to ASICs
Author 
Veendrick, H. J. M. author. SpringerLink (Online service)
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http://dx.doi.org/10.1007/978-1-4020-8333-4
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12. 
Cover image for Semiconductor Radiation Detectors Device Physics
Semiconductor Radiation Detectors Device Physics
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Lutz, Gerhard. author. SpringerLink (Online service)
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http://dx.doi.org/10.1007/978-3-540-71679-2
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