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25. 
Cover image for Distributed Large-Scale Dimensional Metrology New Insights
Distributed Large-Scale Dimensional Metrology New Insights
Author 
Franceschini, Fiorenzo. author. Galetto, Maurizio. author. Maisano, Domenico. author. Mastrogiacomo, Luca. author. Pralio, Barbara. author.
Preferred Shelf Number 
ONLINE
Electronic Access 
http://dx.doi.org/10.1007/978-0-85729-543-9
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26. 
Cover image for Digital holography for MEMS and microsystem metrology
Digital holography for MEMS and microsystem metrology
Author 
Asundi, Anand.
Preferred Shelf Number 
ONLINE
Electronic Access 
John Wiley http://dx.doi.org/10.1002/9781119997290
http://lib.myilibrary.com?id=317798
http://public.eblib.com/EBLPublic/PublicView.do?ptiID=697681
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27. 
Cover image for Advances in speckle metrology and related techniques
Advances in speckle metrology and related techniques
Author 
Kaufmann, Guillermo H.
Preferred Shelf Number 
ONLINE
Electronic Access 
Wiley InterScience An electronic book accessible through the World Wide Web; click for information
Wiley InterScience - Full Text Online http://onlinelibrary.wiley.com/book/10.1002/9783527633852
http://site.ebrary.com/lib/alltitles/Doc?id=10446636
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28. 
Cover image for Handbook of optical metrology : principles and applications
Handbook of optical metrology : principles and applications
Author 
Yoshizawa, Toru, 1939-
Preferred Shelf Number 
QC367 .H36 2009
Electronic Access 
Click here to view.
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29. 
Cover image for Metrology in industry the key for quality
Metrology in industry the key for quality
Author 
Collège français de métrologie. Wiley InterScience (Online service)
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ONLINE
Electronic Access 
Contributor biographical information http://catdir.loc.gov/catdir/enhancements/fy0806/2006003530-b.html
John Wiley http://dx.doi.org/10.1002/9780470612125
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30. 
Cover image for Transverse disciplines in metrology proceedings of the 13th International Metrology Congress, 2007, Lille, France
Transverse disciplines in metrology proceedings of the 13th International Metrology Congress, 2007, Lille, France
Author 
International Metrology Conference (13th : 2007 : French College of Metrology) Collège français de métrologie. Wiley InterScience (Online service)
Preferred Shelf Number 
ONLINE
Electronic Access 
Ebook Library http://public.eblib.com/EBLPublic/PublicView.do?ptiID=477706
John Wiley http://dx.doi.org/10.1002/9780470611371
http://site.ebrary.com/lib/alltitles/Doc?id=10360928
http://swb.eblib.com/patron/FullRecord.aspx?p=477706
HathiTrust Digital Library, Limited view (search only) http://catalog.hathitrust.org/api/volumes/oclc/230183422.html
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31. 
Cover image for High-productivity drilling tools. Materials, metrology, and failure analysis
High-productivity drilling tools. Materials, metrology, and failure analysis
Author 
Astakhov, Viktor P., author.
Preferred Shelf Number 
TJ1260
Electronic Access 
Taylor & Francis https://www.taylorfrancis.com/books/9781003263319
OCLC metadata license agreement http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf
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32. 
Cover image for Recent Advances in Metrology Select Proceedings of AdMet 2021
Recent Advances in Metrology Select Proceedings of AdMet 2021
Author 
Yadav, Sanjay. editor. Chaudhary, K.P. editor. Gahlot, Ajay. editor. Arya, Yogendra. editor. Dahiya, Aman. editor.
Preferred Shelf Number 
ONLINE
Electronic Access 
https://doi.org/10.1007/978-981-19-2468-2
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33. 
Cover image for The economics and science of measurement : a study of metrology
The economics and science of measurement : a study of metrology
Author 
Link, Albert N., author.
Preferred Shelf Number 
QC91
Electronic Access 
Taylor & Francis https://www.taylorfrancis.com/books/9781003186953
OCLC metadata license agreement http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf
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34. 
Cover image for Metrology and instrumentation : practical applications for engineering and manufacturing
Metrology and instrumentation : practical applications for engineering and manufacturing
Author 
Mekid, Samir, author.
Preferred Shelf Number 
QC88 .M38 2022
Electronic Access 
https://onlinelibrary.wiley.com/doi/book/10.1002/9781119721789
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35. 
Cover image for Applications and metrology at nanometer scale. 1, Smart materials, electromagnetic waves and uncertainties
Applications and metrology at nanometer scale. 1, Smart materials, electromagnetic waves and uncertainties
Author 
Dahoo, Pierre Richard. Pougnet, Philippe. El Hami, Abdelkhalak.
Preferred Shelf Number 
QC88
Electronic Access 
https://onlinelibrary.wiley.com/doi/book/10.1002/9781119808244
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36. 
Cover image for Applications and metrology at nanometer scale. 2, Measurement systems, quantum engineering and RBDO method
Applications and metrology at nanometer scale. 2, Measurement systems, quantum engineering and RBDO method
Author 
Dahoo, Pierre Richard, author. Pougnet, Philippe, author. El Hami, Abdelkhalak, author.
Preferred Shelf Number 
QC88
Electronic Access 
https://onlinelibrary.wiley.com/doi/book/10.1002/9781119818984
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