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25. 
Cover image for Integrating metaheuristics in computer vision for real-world optimization problems
Integrating metaheuristics in computer vision for real-world optimization problems
Preferred Shelf Number 
TA1637 .I58 2024
Electronic Access 
https://onlinelibrary.wiley.com/doi/book/10.1002/9781394230952
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26. 
Cover image for CompTIA DataSys+ study guide : exam DSO-001
CompTIA DataSys+ study guide : exam DSO-001
Author 
Chapple, Mike, 1975- author. Nijim, Sharif, author.
Preferred Shelf Number 
QA76.3 .C43 2024
Electronic Access 
https://onlinelibrary.wiley.com/doi/book/10.1002/9781394277094
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27. 
Cover image for Thermal management materials for electronic packaging : preparation, characterization, and devices
Thermal management materials for electronic packaging : preparation, characterization, and devices
Author 
Tian, Xingyou, editor.
Preferred Shelf Number 
TK7870.15
Electronic Access 
https://onlinelibrary.wiley.com/doi/book/10.1002/9783527843121
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28. 
Cover image for Reliability prediction for microelectronics
Reliability prediction for microelectronics
Author 
Bernstein, Joseph B., author. Bensoussan, Alain A., author. Bender, Emmanuel (Carl), author.
Preferred Shelf Number 
TK7874
Electronic Access 
https://onlinelibrary.wiley.com/doi/book/10.1002/9781394210961
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29. 
Cover image for Smart edge computing : an operation research perspective
Smart edge computing : an operation research perspective
Author 
Chakraborty, Rajdeep, editor. Ghosh, Anupam, editor. Mandal, Jyotsna Kumar, editor. Choudhury, Tanupriya, editor. Chatterjee, Prasenjit, editor.
Preferred Shelf Number 
QA76.583
Electronic Access 
https://onlinelibrary.wiley.com/doi/book/10.1002/9781394277599
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30. 
Cover image for Reliability analysis of modern power systems
Reliability analysis of modern power systems
Author 
Saket, R. K., editor. Sanjeevikumar, Padmanaban, 1978-
Preferred Shelf Number 
TA169 .S234 2024
Electronic Access 
https://onlinelibrary.wiley.com/doi/book/10.1002/9781394226771
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31. 
Cover image for Mixed-flow pumps : modeling, simulation, and measurements
Mixed-flow pumps : modeling, simulation, and measurements
Author 
Li, Wei (Professor of engineering), author. Ji, Leilei, author. Agarwal, R. K. (Ramesh K.), author. Shi, Weidong (College presidents), author. Zhou, Ling (Professor), author.
Preferred Shelf Number 
TJ919 .L38 2024
Electronic Access 
https://onlinelibrary.wiley.com/doi/book/10.1002/9781119910381
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32. 
Cover image for Advanced Communication and Intelligent Systems Second International Conference, ICACIS 2023, Warsaw, Poland, June 16-17, 2023, Revised Selected Papers, Part II
Advanced Communication and Intelligent Systems Second International Conference, ICACIS 2023, Warsaw, Poland, June 16-17, 2023, Revised Selected Papers, Part II
Author 
Shaw, Rabindra Nath. editor. Paprzycki, Marcin. editor. Ghosh, Ankush. editor. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE
Electronic Access 
https://doi.org/10.1007/978-3-031-45124-9
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33. 
Cover image for Computer Safety, Reliability, and Security. SAFECOMP 2023 Workshops ASSURE, DECSoS, SASSUR, SENSEI, SRToITS, and WAISE, Toulouse, France, September 19, 2023, Proceedings
Computer Safety, Reliability, and Security. SAFECOMP 2023 Workshops ASSURE, DECSoS, SASSUR, SENSEI, SRToITS, and WAISE, Toulouse, France, September 19, 2023, Proceedings
Author 
Guiochet, Jérémie. editor. Tonetta, Stefano. editor. Schoitsch, Erwin. editor. Roy, Matthieu. editor. Bitsch, Friedemann. editor.
Preferred Shelf Number 
ONLINE
Electronic Access 
https://doi.org/10.1007/978-3-031-40953-0
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34. 
Cover image for Interconnect Reliability in Advanced Memory Device Packaging
Interconnect Reliability in Advanced Memory Device Packaging
Author 
Gan, Chong Leong,. author. Huang, Chen-Yu,. author. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE
Electronic Access 
https://doi.org/10.1007/978-3-031-26708-6
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35. 
Cover image for Proceedings of China SAE Congress 2022: Selected Papers
Proceedings of China SAE Congress 2022: Selected Papers
Author 
SpringerLink (Online service)
Preferred Shelf Number 
ONLINE
Electronic Access 
https://doi.org/10.1007/978-981-99-1365-7
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36. 
Cover image for Which-Is-Better (WIB): Problems in Reliability Theory
Which-Is-Better (WIB): Problems in Reliability Theory
Author 
Mizutani, Satoshi. author. Zhao, Xufeng. author. Nakagawa, Toshio. author. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE
Electronic Access 
https://doi.org/10.1007/978-3-031-27316-2
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