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1. 
Cover image for Emerging Nanotechnologies Test, Defect Tolerance, and Reliability
Emerging Nanotechnologies Test, Defect Tolerance, and Reliability
Author 
Tehranipoor, Mohammad. editor. SpringerLink (Online service)
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ONLINE
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http://dx.doi.org/10.1007/978-0-387-74747-7
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2. 
Cover image for Nanometer Technology Designs High-Quality Delay Tests
Nanometer Technology Designs High-Quality Delay Tests
Author 
Tehranipoor, Mohammad. author. Ahmed, Nisar. author. SpringerLink (Online service)
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ONLINE
Electronic Access 
http://dx.doi.org/10.1007/978-0-387-75728-5
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3. 
Cover image for Radio Frequency Integrated Circuits and Technologies
Radio Frequency Integrated Circuits and Technologies
Author 
Ellinger, Frank. author. SpringerLink (Online service)
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Electronic Access 
http://dx.doi.org/10.1007/978-3-540-35790-2
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4. 
Cover image for Ultra-Low Voltage Nano-Scale Memories
Ultra-Low Voltage Nano-Scale Memories
Author 
Itoh, Kiyoo. editor. Horiguchi, Masashi. editor. Tanaka, Hitoshi. editor. SpringerLink (Online service)
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http://dx.doi.org/10.1007/978-0-387-68853-4
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5. 
Cover image for Power Management of Digital Circuits in Deep Sub-Micron CMOS Technologies
Power Management of Digital Circuits in Deep Sub-Micron CMOS Technologies
Author 
Henzler, Stephan. author. SpringerLink (Online service)
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ONLINE
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http://dx.doi.org/10.1007/1-4020-5081-X
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6. 
Cover image for Dynamics of Microelectromechanical Systems
Dynamics of Microelectromechanical Systems
Author 
Lobontiu, Nicolae. author. SpringerLink (Online service)
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Electronic Access 
http://dx.doi.org/10.1007/978-0-387-68195-5
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7. 
Cover image for Design for Manufacturability and Yield for Nano-Scale CMOS
Design for Manufacturability and Yield for Nano-Scale CMOS
Author 
Chiang, Charles C. author. Kawa, Jamil. author. SpringerLink (Online service)
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http://dx.doi.org/10.1007/978-1-4020-5188-3
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8. 
Cover image for Full-Chip Nanometer Routing Techniques
Full-Chip Nanometer Routing Techniques
Author 
Ho, Tsung-Yi. author. Chang, Yao-Wen. author. Chen, Sao-Jie. author. SpringerLink (Online service)
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http://dx.doi.org/10.1007/978-1-4020-6195-0
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9. 
Cover image for CMOS Biotechnology
CMOS Biotechnology
Author 
Lee, Hakho. editor. Westervelt, Robert M. editor. Ham, Donhee. editor. SpringerLink (Online service)
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http://dx.doi.org/10.1007/978-0-387-68913-5
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10. 
Cover image for Leakage in Nanometer CMOS Technologies
Leakage in Nanometer CMOS Technologies
Author 
Narendra, Siva G. author. Chandrakasan, Anantha. author. SpringerLink (Online service)
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http://dx.doi.org/10.1007/0-387-28133-9
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11. 
Cover image for Low-Power Low-Voltage Sigma-Delta Modulators in Nanometer CMOS
Low-Power Low-Voltage Sigma-Delta Modulators in Nanometer CMOS
Author 
Yao, Libin. author. Steyaert, Michiel. author. Sansen, Willy. author. SpringerLink (Online service)
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Electronic Access 
http://dx.doi.org/10.1007/1-4020-4140-3
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12. 
Cover image for BioMEMS
BioMEMS
Author 
Urban, Gerald A. editor. SpringerLink (Online service)
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http://dx.doi.org/10.1007/978-0-387-28732-4
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