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25. 
Cover image for Heat transfer in microelectronic equipment : a practical guide
Heat transfer in microelectronic equipment : a practical guide
Author 
Seely, John H.
Preferred Shelf Number 
TK 7874 S4 1972
Format: 
Availability 
Beytepe Library~1
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26. 
Cover image for Enhanced phase-locked loop structures for power and energy applications
Enhanced phase-locked loop structures for power and energy applications
Author 
Karimi-Ghartemani, Masoud, author.
Preferred Shelf Number 
ONLINE(341794.1)
Electronic Access 
Ebook Library http://public.eblib.com/choice/publicfullrecord.aspx?p=1658815
ebrary http://site.ebrary.com/id/10853333
John Wiley http://dx.doi.org/10.1002/9781118795187
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27. 
Cover image for CMOS circuit design, layout, and simulation
CMOS circuit design, layout, and simulation
Author 
Baker, R. Jacob, 1964- Wiley InterScience (Online service)
Preferred Shelf Number 
ONLINE
Electronic Access 
Wiley InterScience An electronic book accessible through the World Wide Web; click for information
Format: 
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Online Library~1
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28. 
Cover image for Advanced electronic packaging
Advanced electronic packaging
Author 
Ulrich, Richard K. (Richard Kevin), 1955- Brown, William D., 1943-
Preferred Shelf Number 
ONLINE
Electronic Access 
IEEE Xplore http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5769522
Format: 
Availability 
Online Library~1
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29. 
Cover image for Nanometer frequency synthesis beyond the phase-locked loop
Nanometer frequency synthesis beyond the phase-locked loop
Author 
Xiu, Liming.
Preferred Shelf Number 
ONLINE
Electronic Access 
IEEE Xplore http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=6266786
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Online Library~1
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30. 
Cover image for Reliability wearout mechanisms in advanced CMOS technologies
Reliability wearout mechanisms in advanced CMOS technologies
Author 
Strong, Alvin Wayne, 1946-
Preferred Shelf Number 
ONLINE
Electronic Access 
IEEE Xplore http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5361029
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31. 
Cover image for Nonvolatile memory technologies with emphasis on Flash a comprehensive guide to understanding and using NVM devices
Nonvolatile memory technologies with emphasis on Flash a comprehensive guide to understanding and using NVM devices
Author 
Brewer, Joe (Joe E.) Gill, Manzur.
Preferred Shelf Number 
ONLINE
Electronic Access 
IEEE Xplore http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5201541
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32. 
Cover image for High-performance system design circuits and logic
High-performance system design circuits and logic
Author 
Oklobdzija, Vojin G. IEEE Circuits and Systems Society. IEEE Solid-State Circuits Society.
Preferred Shelf Number 
ONLINE
Electronic Access 
IEEE Xplore http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5265197
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33. 
Cover image for Low-voltage/low-power integrated circuits and systems low-voltage mixed-signal ciruits
Low-voltage/low-power integrated circuits and systems low-voltage mixed-signal ciruits
Author 
Sánchez-Sinencio, Edgar. Andreou, Andreas G. IEEE Solid-State Circuits Society.
Preferred Shelf Number 
ONLINE
Electronic Access 
IEEE Xplore http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5264057
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34. 
Cover image for Electronic and photonic circuits and devices
Electronic and photonic circuits and devices
Author 
Waynant, Ronald W. Lowell, John. IEEE Circuits and Systems Society. Components, Packaging & Manufacturing Technology Society.
Preferred Shelf Number 
ONLINE
Electronic Access 
IEEE Xplore http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5263558
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35. 
Cover image for Nonvolatile semiconductor memory technology a comprehensive guide to understanding and to using NVSM devices
Nonvolatile semiconductor memory technology a comprehensive guide to understanding and to using NVSM devices
Author 
Brown, William D., 1943- Brewer, Joe (Joe E.)
Preferred Shelf Number 
ONLINE
Electronic Access 
IEEE Xplore http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5263122
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36. 
Cover image for Wide Bandgap Power Semiconductor Packaging : Materials, Components, and Reliability
Wide Bandgap Power Semiconductor Packaging : Materials, Components, and Reliability
Author 
Suganuma, Katsuaki, editor.
Preferred Shelf Number 
ONLINE
Electronic Access 
ScienceDirect https://www.sciencedirect.com/science/book/9780081020944
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