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1. 
Cover image for Interfacial Compatibility in Microelectronics Moving Away from the Trial and Error Approach
Interfacial Compatibility in Microelectronics Moving Away from the Trial and Error Approach
Author 
Laurila, Tomi. author. Vuorinen, Vesa. author. Paulasto-Kröckel, Mervi. author. Turunen, Markus. author. Mattila, Toni T. author.
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http://dx.doi.org/10.1007/978-1-4471-2470-2
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Cover image for Future trends in microelectronics from nanophotonics to sensors and energy
Future trends in microelectronics from nanophotonics to sensors and energy
Author 
Luryi, Serge. Xu, Jimmy. Zaslavsky, Alexander.
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IEEE Xplore http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5599322
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3. 
Cover image for Emerging Topics in Heat and Mass Transfer in Porous Media From Bioengineering and Microelectronics to Nanotechnology
Emerging Topics in Heat and Mass Transfer in Porous Media From Bioengineering and Microelectronics to Nanotechnology
Author 
Vadász, Peter. editor. SpringerLink (Online service)
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http://dx.doi.org/10.1007/978-1-4020-8178-1
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4. 
Cover image for Future trends in microelectronics up the nano creek
Future trends in microelectronics up the nano creek
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FTM-5 (2006 : Crete, Greece) Luryi, Serge. Xu, Jimmy. Zaslavsky, Alex, 1963-
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IEEE Xplore http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5201522
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5. 
Cover image for Handbook of thick- and thin-film hybrid microelectronics
Handbook of thick- and thin-film hybrid microelectronics
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Gupta, Tapan.
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John Wiley http://dx.doi.org/10.1002/0471723673
HathiTrust Digital Library, Limited view (search only) http://catalog.hathitrust.org/api/volumes/oclc/50203924.html
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6. 
Cover image for PVD for microelectronics sputter deposition applied to semiconductor manufacturing
PVD for microelectronics sputter deposition applied to semiconductor manufacturing
Author 
Powell, Ronald A. Rossnagel, Stephen M.
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ScienceDirect http://www.sciencedirect.com/science/book/9780125330268
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7. 
Cover image for VLSI custom microelectronics digital, analog, and mixed-signal
VLSI custom microelectronics digital, analog, and mixed-signal
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Hurst, S. L. (Stanley Leonard)
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8. 
Cover image for The Microelectronics revolution the complete guide to the new technology and its impact on society
The Microelectronics revolution the complete guide to the new technology and its impact on society
Author 
Forester, Tom.
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IEEE Xplore http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=6267262
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9. 
Cover image for The Non-Equilibrium Green's Function Method for Nanoscale Device Simulation
The Non-Equilibrium Green's Function Method for Nanoscale Device Simulation
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Pourfath, Mahdi. author. SpringerLink (Online service)
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https://doi.org/10.1007/978-3-7091-1800-9
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10. 
Cover image for Deterministic Solvers for the Boltzmann Transport Equation
Deterministic Solvers for the Boltzmann Transport Equation
Author 
Hong, Sung-Min. author. Pham, Anh-Tuan. author. Jungemann, Christoph. author. SpringerLink (Online service)
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http://dx.doi.org/10.1007/978-3-7091-0778-2
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11. 
Cover image for Strain-Induced Effects in Advanced MOSFETs
Strain-Induced Effects in Advanced MOSFETs
Author 
Sverdlov, Viktor. author. SpringerLink (Online service)
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http://dx.doi.org/10.1007/978-3-7091-0382-1
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12. 
Cover image for Advanced Gate Stacks for High-Mobility Semiconductors
Advanced Gate Stacks for High-Mobility Semiconductors
Author 
Dimoulas, Athanasios. editor. Gusev, Evgeni. editor. McIntyre, Paul C. editor. Heyns, Marc. editor. SpringerLink (Online service)
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http://dx.doi.org/10.1007/978-3-540-71491-0
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