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25. 
Cover image for Fully Integrated High-Voltage DC-DC and AC-DC Conversion
Fully Integrated High-Voltage DC-DC and AC-DC Conversion
Author 
Van Daele, Tuur. author. Tavernier, Filip. author. SpringerLink (Online service)
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https://doi.org/10.1007/978-3-031-78519-1
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26. 
Cover image for Random Number Generators Verilog Description, Hardware Implementation and Applications
Random Number Generators Verilog Description, Hardware Implementation and Applications
Author 
de la Fraga, Luis Gerardo. author. (orcid)0000-0002-9373-9837 Rodríguez-Muñoz, José David. author. (orcid)0009-0001-9553-1394 Tlelo-Cuautle, Esteban. author. (orcid)0000-0001-7187-4686 SpringerLink (Online service)
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https://doi.org/10.1007/978-3-031-82865-2
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27. 
Cover image for CMOS Plasma and Process Damage
CMOS Plasma and Process Damage
Author 
Prall, Kirk. author. SpringerLink (Online service)
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https://doi.org/10.1007/978-3-031-89029-1
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28. 
Cover image for CMOS-based Portable NMR/MRI Microsystems
CMOS-based Portable NMR/MRI Microsystems
Author 
Fan, Shuhao. author. Zhou, Qi. author. (orcid)0000-0002-3949-7953 Lei, Ka-Meng. author. Martins, Rui P. author. Mak, Pui-In. author.
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https://doi.org/10.1007/978-3-031-91447-8
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29. 
Cover image for SOC-Based Solutions in Emerging Application Domains
SOC-Based Solutions in Emerging Application Domains
Author 
Chakravarthi, Veena S. author. (orcid)0000-0002-8703-2376 Koteshwar, Shivananda R. author. (orcid)0000-0003-4299-4069 SpringerLink (Online service)
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https://doi.org/10.1007/978-3-031-85044-8
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30. 
Cover image for Bulk-Driven Circuit Techniques for CMOS FDSOI Processes From Circuit Concept to Implementations
Bulk-Driven Circuit Techniques for CMOS FDSOI Processes From Circuit Concept to Implementations
Author 
Gerfers, Friedel. editor. (orcid)0000-0002-0520-1923 SpringerLink (Online service)
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https://doi.org/10.1007/978-3-031-85114-8
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31. 
Cover image for A Problem-Solving Approach to Electric Circuits Volume IV
A Problem-Solving Approach to Electric Circuits Volume IV
Author 
Asadi, Farzin. author. SpringerLink (Online service)
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https://doi.org/10.1007/978-3-031-96586-9
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32. 
Cover image for Evolution in Signal Processing and Telecommunication Networks Proceedings of 8th International Conference on Microelectronics Electromagnetics and Telecommunications (ICMEET 2023)
Evolution in Signal Processing and Telecommunication Networks Proceedings of 8th International Conference on Microelectronics Electromagnetics and Telecommunications (ICMEET 2023)
Author 
Bhateja, Vikrant. editor. (orcid)0000-0002-3259-8874 Chowdary, P. Satish Rama. editor. (orcid)0000-0002-1649-4258 Flores-Fuentes, Wendy. editor. (orcid)0000-0002-1477-7449 Urooj, Shabana. editor. (orcid)0000-0002-1477-8759 Sankar Dhar, Rudra. editor. (orcid)0000-0002-6571-3808
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https://doi.org/10.1007/978-981-97-0644-0
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33. 
Cover image for Understanding Logic Locking
Understanding Logic Locking
Author 
Zamiri Azar, Kimia. author. Mardani Kamali, Hadi. author. Farahmandi, Farimah. author. Tehranipoor, Mark. author. SpringerLink (Online service)
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https://doi.org/10.1007/978-3-031-37989-5
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34. 
Cover image for Quality-of-Service Aware Design and Management of Embedded Mixed-Criticality Systems
Quality-of-Service Aware Design and Management of Embedded Mixed-Criticality Systems
Author 
Ranjbar, Behnaz. author. Ejlali, Alireza. author. Kumar, Akash. author. (orcid)0000-0001-7125-1737 SpringerLink (Online service)
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https://doi.org/10.1007/978-3-031-38960-3
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35. 
Cover image for Machine Learning-based Design and Optimization of High-Speed Circuits
Machine Learning-based Design and Optimization of High-Speed Circuits
Author 
Melikyan, Vazgen. author. SpringerLink (Online service)
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https://doi.org/10.1007/978-3-031-50714-4
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36. 
Cover image for Formal and Practical Techniques for the Complex System Design Process using Virtual Prototypes Better Early than Never
Formal and Practical Techniques for the Complex System Design Process using Virtual Prototypes Better Early than Never
Author 
Pieper, Pascal. author. (orcid)0000-0002-7155-2537 Drechsler, Rolf. author. SpringerLink (Online service)
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https://doi.org/10.1007/978-3-031-51692-4
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