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25. 
Cover image for Nanosystems Design and Technology
Nanosystems Design and Technology
Author 
Micheli, Giovanni. author. Leblebici, Yusuf. author. Gijs, Martin. author. Vörös, Janos. author. SpringerLink (Online service)
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ONLINE
Electronic Access 
http://dx.doi.org/10.1007/978-1-4419-0255-9
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26. 
Cover image for More than Moore Creating High Value Micro/Nanoelectronics Systems
More than Moore Creating High Value Micro/Nanoelectronics Systems
Author 
Zhang, Guo Qi. editor. Roosmalen, Alfred. editor. SpringerLink (Online service)
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ONLINE
Electronic Access 
http://dx.doi.org/10.1007/978-0-387-75593-9
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27. 
Cover image for Embedded Memories for Nano-Scale VLSIs
Embedded Memories for Nano-Scale VLSIs
Author 
Zhang, Kevin. editor. SpringerLink (Online service)
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http://dx.doi.org/10.1007/978-0-387-88497-4
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28. 
Cover image for Copper Interconnect Technology
Copper Interconnect Technology
Author 
Gupta, Tapan. author. SpringerLink (Online service)
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ONLINE
Electronic Access 
http://dx.doi.org/10.1007/978-1-4419-0076-0
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29. 
Cover image for BioNanoFluidic MEMS
BioNanoFluidic MEMS
Author 
Hesketh, Peter J. editor. SpringerLink (Online service)
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ONLINE
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http://dx.doi.org/10.1007/978-0-387-46283-7
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30. 
Cover image for Nanotechnology-Enabled Sensors
Nanotechnology-Enabled Sensors
Author 
Kalantar-zadeh, Kourosh. author. Fry, Benjamin. author. SpringerLink (Online service)
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ONLINE
Electronic Access 
http://dx.doi.org/10.1007/978-0-387-68023-1
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31. 
Cover image for Emerging Nanotechnologies Test, Defect Tolerance, and Reliability
Emerging Nanotechnologies Test, Defect Tolerance, and Reliability
Author 
Tehranipoor, Mohammad. editor. SpringerLink (Online service)
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ONLINE
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http://dx.doi.org/10.1007/978-0-387-74747-7
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32. 
Cover image for Radio Frequency Integrated Circuits and Technologies
Radio Frequency Integrated Circuits and Technologies
Author 
Ellinger, Frank. editor. SpringerLink (Online service)
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ONLINE
Electronic Access 
http://dx.doi.org/10.1007/978-3-540-69325-3
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33. 
Cover image for Nanometer Technology Designs High-Quality Delay Tests
Nanometer Technology Designs High-Quality Delay Tests
Author 
Tehranipoor, Mohammad. author. Ahmed, Nisar. author. SpringerLink (Online service)
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Electronic Access 
http://dx.doi.org/10.1007/978-0-387-75728-5
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34. 
Cover image for Bionanotechnology : global prospects
Bionanotechnology : global prospects
Author 
Reisner, David Evans. Bronzino, Joseph D., 1937-
Preferred Shelf Number 
TP248.25 .N35 B565 2008
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35. 
Cover image for Dynamics of Microelectromechanical Systems
Dynamics of Microelectromechanical Systems
Author 
Lobontiu, Nicolae. author. SpringerLink (Online service)
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http://dx.doi.org/10.1007/978-0-387-68195-5
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36. 
Cover image for Radio Frequency Integrated Circuits and Technologies
Radio Frequency Integrated Circuits and Technologies
Author 
Ellinger, Frank. author. SpringerLink (Online service)
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Electronic Access 
http://dx.doi.org/10.1007/978-3-540-35790-2
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