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1. 
Cover image for Silicon Components and Processes Self Study Field-Effect Transistors
Silicon Components and Processes Self Study Field-Effect Transistors
Author 
El-Kareh, Badih. author. Hutter, Lou N. author. SpringerLink (Online service)
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https://doi.org/10.1007/978-3-031-59193-8
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2. 
Cover image for Alternating Current Field Measurement Technique for Detection and Measurement of Cracks in Structures
Alternating Current Field Measurement Technique for Detection and Measurement of Cracks in Structures
Author 
Li, Wei. author. Yuan, Xin'an. author. Zhao, Jianming. author. Yin, Xiaokang. author. Li, Xiao. author.
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https://doi.org/10.1007/978-981-97-7255-1
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3. 
Cover image for Embedded Machine Learning with Microcontrollers Applications on STM32 Development Boards
Embedded Machine Learning with Microcontrollers Applications on STM32 Development Boards
Author 
Ünsalan, Cem. author. (orcid)0000-0002-8904-3730 Höke, Berkan. author. (orcid)0000-0001-5682-500X Atmaca, Eren. author. SpringerLink (Online service)
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https://doi.org/10.1007/978-3-031-70912-8
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4. 
Cover image for Lecture Notes in Analog Electronics Testing and Diagnosis of Analog and Mixed-Signal Electronic Circuits
Lecture Notes in Analog Electronics Testing and Diagnosis of Analog and Mixed-Signal Electronic Circuits
Author 
Litovski, Vančo B. author. SpringerLink (Online service)
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https://doi.org/10.1007/978-981-97-8257-4
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5. 
Cover image for The Proceedings of 2024 International Conference of Electrical, Electronic and Networked Energy Systems Volume IV
The Proceedings of 2024 International Conference of Electrical, Electronic and Networked Energy Systems Volume IV
Author 
Jia, Limin. editor. Lv, Yanling. editor. Yang, Qiang. editor. (orcid)0000-0002-0761-4692 Xiong, Liansong. editor. Sun, Dongyang. editor.
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https://doi.org/10.1007/978-981-96-2050-0
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6. 
Cover image for The Proceedings of 2024 International Conference of Electrical, Electronic and Networked Energy Systems Volume II
The Proceedings of 2024 International Conference of Electrical, Electronic and Networked Energy Systems Volume II
Author 
Jia, Limin. editor. Liu, Yi. editor. (orcid)0000-0001-9481-2429 Xu, Zhihong. editor. Tang, Longfei. editor. Song, Kai. editor.
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https://doi.org/10.1007/978-981-96-2042-5
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7. 
Cover image for Micro and Nanoelectronics Devices, Circuits and Systems Select Proceedings of MNDCS 2024
Micro and Nanoelectronics Devices, Circuits and Systems Select Proceedings of MNDCS 2024
Author 
Guha, Koushik. editor. Saha, Samar Kanti. editor. (orcid)0000-0002-5687-591X Iannacci, Jacopo. editor. (orcid)0000-0001-6462-4814 SpringerLink (Online service)
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https://doi.org/10.1007/978-981-96-3758-4
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8. 
Cover image for Cryogenic Microelectronic Systems for Ultra-Low Energy and Enhanced Performance
Cryogenic Microelectronic Systems for Ultra-Low Energy and Enhanced Performance
Author 
Zhuldassov, Nurzhan. author. Friedman, Eby G. author. SpringerLink (Online service)
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https://doi.org/10.1007/978-3-031-90754-8
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9. 
Cover image for Analog Microelectronics
Analog Microelectronics
Author 
Borgarino, Mattia. author. (orcid)0000-0001-9678-592X SpringerLink (Online service)
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https://doi.org/10.1007/978-3-031-94286-0
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10. 
Cover image for A Problem-Solving Approach to Electric Circuits Volume I
A Problem-Solving Approach to Electric Circuits Volume I
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Asadi, Farzin. author. SpringerLink (Online service)
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https://doi.org/10.1007/978-3-031-95623-2
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11. 
Cover image for Embedded Machine Learning with Microcontrollers Applications on Arduino Boards
Embedded Machine Learning with Microcontrollers Applications on Arduino Boards
Author 
Ünsalan, Cem. author. (orcid)0000-0002-8904-3730 Höke, Berkan. author. (orcid)0000-0001-5682-500X Atmaca, Eren. author. SpringerLink (Online service)
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https://doi.org/10.1007/978-3-031-69421-9
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12. 
Cover image for The Proceedings of the 11th Frontier Academic Forum of Electrical Engineering (FAFEE2024) Volume I
The Proceedings of the 11th Frontier Academic Forum of Electrical Engineering (FAFEE2024) Volume I
Author 
Yang, Qingxin. editor. Li, Jian. editor. SpringerLink (Online service)
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https://doi.org/10.1007/978-981-97-8780-7
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