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25. 
Cover image for Algorithmic and Knowledge-based CAD for VLSI
Algorithmic and Knowledge-based CAD for VLSI
Author 
Taylor, Gaynor, ed. Russell, Gordon, ed.
Preferred Shelf Number 
ONLINE
Electronic Access 
http://dx.doi.org/10.1049/PBCS004E
Format: 
Availability 
Online Library~1
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26. 
Cover image for Digital circuit testing a guide to DFT and other techniques
Digital circuit testing a guide to DFT and other techniques
Author 
Wang, Francis C.
Preferred Shelf Number 
ONLINE
Electronic Access 
ScienceDirect http://www.sciencedirect.com/science/book/9780127345802
Format: 
Availability 
Online Library~1
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27. 
Cover image for Electronics reliability and measurement technology nondestructive evaluation
Electronics reliability and measurement technology nondestructive evaluation
Author 
Heyman, Joseph S.
Preferred Shelf Number 
ONLINE
Electronic Access 
ScienceDirect http://www.sciencedirect.com/science/book/9780815511717
Format: 
Availability 
Online Library~1
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