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1. 
Cover image for Fundamentals of semiconductor manufacturing and process control
Fundamentals of semiconductor manufacturing and process control
Author 
May, Gary S. Spanos, Costas J.
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IEEE Xplore http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5201952
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Cover image for A real-time approach to process control
A real-time approach to process control
Author 
Svrcek, William Y. Mahoney, Donald P. Young, Brent R.
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Electronic Access 
HathiTrust Digital Library, Limited view (search only) http://catalog.hathitrust.org/api/volumes/oclc/65978529.html
John Wiley http://dx.doi.org/10.1002/9780470029558
Knovel http://app.knovel.com/web/toc.v/cid:kpRTAPCE02
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3. 
Cover image for Practical process control for engineers and technicians
Practical process control for engineers and technicians
Author 
Altmann, Wolfgang. Macdonald, Dave, 1942-
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ScienceDirect http://www.sciencedirect.com/science/book/9780750664004
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4. 
Cover image for The integration of process design and control
The integration of process design and control
Author 
Seferlis, Panagiotis, 1967- Georgiadis, Michael C.
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ScienceDirect http://www.sciencedirect.com/science/book/9780444515575
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5. 
Cover image for Handbook of food process modeling and statistical quality control
Handbook of food process modeling and statistical quality control
Author 
Özilgen, Mustafa. Özilgen, Mustafa. Food process modeling and statistical quality control.
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EBSCOhost http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=361935
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6. 
Cover image for Coulson & Richardson's chemical engineering. Vol. 3, Chemical & biochemical reactors & process control
Coulson & Richardson's chemical engineering. Vol. 3, Chemical & biochemical reactors & process control
Author 
Richardson, J. F. (John Francis) Peacock, D. G. (Donald George), 1927- Coulson, J. M. (John Metcalfe). Chemical engineering.
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ScienceDirect http://www.sciencedirect.com/science/book/9780080571546
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7. 
Cover image for Characterization and control of odours and VOC in the process industries proceedings of the Second International Symposium on Characterization and Control of Odours and VOC in the Process Industries, Louvain-la-Neuve, Belgium, 3-5 November 1993
Characterization and control of odours and VOC in the process industries proceedings of the Second International Symposium on Characterization and Control of Odours and VOC in the Process Industries, Louvain-la-Neuve, Belgium, 3-5 November 1993
Author 
International Symposium on Characterization and Control of Odours and VOC in the Process Industries (2nd : 1993 : Louvain-la-Neuve, Belgium) Vigneron, S. Hermia, J. Chaouki, J. Société belge de filtration.
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ScienceDirect http://www.sciencedirect.com/science/book/9780444817891
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8. 
Cover image for Semiconductor materials analysis and fabrication process control proceedings of Symposium D on Diagnostic Techniques for Semiconductor Materials Analysis and Fabrication Process Control of the 1992 E-MRS Spring Conference, Strasbourg, France, June 2-5, 1992
Semiconductor materials analysis and fabrication process control proceedings of Symposium D on Diagnostic Techniques for Semiconductor Materials Analysis and Fabrication Process Control of the 1992 E-MRS Spring Conference, Strasbourg, France, June 2-5, 1992
Author 
Symposium D on Diagnostic Techniques for Semiconductor Materials Analysis and Fabrication Process Control (1992 : Strasbourg, France) Crean, G. M. Stuck, R. Woollam, John A. European Materials Research Society.
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ScienceDirect http://www.sciencedirect.com/science/book/9780444899088
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9. 
Cover image for Advances in Manufacturing, Production Management and Process Control Joint proceedings of the AHFE 2018 International Conference on Advanced Production Management and Process Control, the AHFE International Conference on Human Aspects of Advanced Manufacturing, and the AHFE International Conference on Additive Manufacturing, Modeling Systems and 3D Prototyping, July 21-25, 2018, Loews Sapphire Falls Resort at Universal Studios, Orlando, Florida, USA
Advances in Manufacturing, Production Management and Process Control Joint proceedings of the AHFE 2018 International Conference on Advanced Production Management and Process Control, the AHFE International Conference on Human Aspects of Advanced Manufacturing, and the AHFE International Conference on Additive Manufacturing, Modeling Systems and 3D Prototyping, July 21-25, 2018, Loews Sapphire Falls Resort at Universal Studios, Orlando, Florida, USA
Author 
Karwowski, Waldemar. editor. Trzcielinski, Stefan. editor. Mrugalska, Beata. editor. Di Nicolantonio, Massimo. editor. Rossi, Emilio. editor.
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https://doi.org/10.1007/978-3-319-94196-7
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10. 
Cover image for Process systems and materials for CO₂ capture : modelling, design, control and integration
Process systems and materials for CO₂ capture : modelling, design, control and integration
Author 
Papadopoulos, Athanasios I., 1977- editor. Seferlis, Panagiotis, 1967- editor.
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Wiley Online Library
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11. 
Cover image for Modelling, simulation and control of the dyeing process
Modelling, simulation and control of the dyeing process
Author 
Shamey, R., author. Zhao, X., author.
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ONLINE(355584.1)
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ScienceDirect http://www.sciencedirect.com/science/book/9780857091338
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12. 
Cover image for Process Control for Sheet-Metal Stamping Process Modeling, Controller Design and Shop-Floor Implementation
Process Control for Sheet-Metal Stamping Process Modeling, Controller Design and Shop-Floor Implementation
Author 
Lim, Yongseob. author. Venugopal, Ravinder. author. Ulsoy, A Galip. author. SpringerLink (Online service)
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https://doi.org/10.1007/978-1-4471-6284-1
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