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25. 
Cover image for Synchronized Phasor Measurements and Their Applications
Synchronized Phasor Measurements and Their Applications
Author 
Phadke, A.G. author. Thorp, J.S. author. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE
Electronic Access 
http://dx.doi.org/10.1007/978-0-387-76537-2
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26. 
Cover image for IEEE spectrum.
IEEE spectrum.
Author 
Institute of Electrical and Electronics Engineers.
Preferred Shelf Number 
ALFABETİK V.1967 OCT-1968 JUN
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27. 
Cover image for IEEE Circuits and systems magazine.
IEEE Circuits and systems magazine.
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ALFABETİK V.2 2002
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28. 
Cover image for Electrical installation calculations
Electrical installation calculations
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ONLINE
Electronic Access 
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29. 
Cover image for Electrical installation calculations
Electrical installation calculations
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ONLINE
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30. 
Cover image for Detection, estimation, and modulation theory
Detection, estimation, and modulation theory
Author 
Van Trees, Harry L.
Preferred Shelf Number 
TK 5102.5 V3 V.3
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31. 
Cover image for Advances in imaging and electron physics.
Advances in imaging and electron physics.
Author 
Hawkes, Peter W., ed.
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QC 793.5.E62 A3 V.127 2003
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32. 
Cover image for Power Distribution Networks with On-Chip Decoupling Capacitors
Power Distribution Networks with On-Chip Decoupling Capacitors
Author 
Popovich, Mikhhail. author. Mezhiba, Andrey V. author. Friedman, Eby G. author. SpringerLink (Online service)
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ONLINE
Electronic Access 
http://dx.doi.org/10.1007/978-0-387-71601-5
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33. 
Cover image for Standardized Functional Verification
Standardized Functional Verification
Author 
Wiemann, Alan. author. SpringerLink (Online service)
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ONLINE
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http://dx.doi.org/10.1007/978-0-387-71733-3
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34. 
Cover image for FinFETs and Other Multi-Gate Transistors
FinFETs and Other Multi-Gate Transistors
Author 
Colinge, Jean-Pierre. editor. SpringerLink (Online service)
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ONLINE
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http://dx.doi.org/10.1007/978-0-387-71752-4
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35. 
Cover image for Emerging Nanotechnologies Test, Defect Tolerance, and Reliability
Emerging Nanotechnologies Test, Defect Tolerance, and Reliability
Author 
Tehranipoor, Mohammad. editor. SpringerLink (Online service)
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ONLINE
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http://dx.doi.org/10.1007/978-0-387-74747-7
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36. 
Cover image for Design of High Voltage xDSL Line Drivers in Standard CMOS
Design of High Voltage xDSL Line Drivers in Standard CMOS
Author 
Serneels, Bert. editor. Steyaert, Michiel. editor. SpringerLink (Online service)
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ONLINE
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http://dx.doi.org/10.1007/978-1-4020-6790-7
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