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Publication Date: 2012

Author

Wiley InterScience (Online service)

(4)

SpringerLink (Online service)

(2)

Adachi, Chihaya.

(1)

Alquier, Daniel.

(1)

(1)

Balasinki, Artur.

(1)

Barquinha, Pedro.

(1)

Beer, Albert C., ed.

(1)

(1)

Bernasek, S. L. (Steven L.)

(1)

Boyd, Sarah B. author.

(1)

Brütting, Wolfgang.

(1)

(1)

Collins, Andrew.

(1)

(1)

Fisher, Dennis G., Ph. D.

(1)

(1)

He, Gang (Professor of physics)

(1)

Henini, Mohamed.

(1)

Holmes, Russell James Delmar, 1978-

(1)

Iniewski, Krzysztof.

(1)

International Conference on Defects: Recognition, Imaging and Physics in Semiconductors (2011 : Miyazaki, Japan)

(1)

(1)

Kularatna, Nihal.

(1)

Larsson, Sven, 1941-

(1)

(1)

(1)

Lu, James Jian-Qiang.

(1)

McHale, Jeanne L.

(1)

Murphy, Edmond J.

(1)

Neamen, Donald A.

(1)

Nowotny, Janusz, 1936-

(1)

(1)

Plekhanov, Vladimir G., ed.

(1)

(1)

Reddy, P. Jayarama.

(1)

(1)

Saddow, Stephen E.

(1)

(1)

ScienceDirect (Online service)

(1)

Slater, John Clarke, 1900-

(1)

Song, Bang-Sup.

(1)

Sun, Zhaoqi (Professor of physics)

(1)

Taklo, Maaike M. V.

(1)

Tam, Wing-Shan.

(1)

Tao, Feng, 1971-

(1)

Tsujimura, Takatoshi.

(1)

Tsymbal, E. Y. (Evgeny Y.)

(1)

Virkar, Ajay. author.

(1)

Weber, Eicke R., ed.

(1)

Willardson, Robert K. ed.

(1)

(1)

Wong, Terence K. S.

(1)

(1)

Yamada-Kaneta, Hiroshi.

(1)

(1)

Language

(34)

Subject

Semiconductors.

(5)

Electronic books.

(3)

Metal oxide semiconductors, Complementary.

(3)

Semiconductors -- Materials.

(3)

(2)

Integrated circuits -- Design and construction.

(2)

Metal oxide semiconductors, Complementary -- Design and construction.

(2)

Organic semiconductors.

(2)

Semiconductors -- Surfaces.

(2)

Biochemical engineering.

(1)

Biocompatible Materials.

(1)

Biomedical materials.

(1)

Carbon Compounds, Inorganic.

(1)

Chemical engineering.

(1)

Chemistry, Physical and theoretical -- Textbooks.

(1)

(1)

Compound semiconductors -- Design and construction -- Materials.

(1)

Compound semiconductors.

(1)

(1)

Defects recognition

(1)

Digital integrated circuits -- Design and construction.

(1)

Electric circuit analysis.

(1)

Electric circuits -- Design and construction.

(1)

Electric circuits -- Direct current.

(1)

Electroluminescent devices.

(1)

(1)

(1)

(1)

Flat panel displays.

(1)

Gallium arsenide semiconductors.

(1)

Gamma ray detectors -- Materials.

(1)

Gate array circuits.

(1)

Image processing -- Congresses.

(1)

(1)

Industrial efficiency.

(1)

Integrated circuits -- Design and construction -- Cost control.

(1)

Integrated circuits -- Reliability.

(1)

KUANTUM KURAMI.

(1)

Light modulators.

(1)

Luminescence spectroscopy.

(1)

MADDE -- YAPIMI.

(1)

MOLEKÜLER KURAM.

(1)

(1)

Magnetoresistance.

(1)

Materials -- Congresses.

(1)

Materials science -- Congresses.

(1)

Metal oxide semiconductors -- Reliability.

(1)

Metal oxide semiconductors.

(1)

Microwave integrated circuits.

(1)

Molecular beam epitaxy.

(1)

Nanoelectromechanical systems.

(1)

Nanoelectronics -- Materials.

(1)

(1)

(1)

Nanostructured materials.

(1)

Nanotechnology -- Experiments.

(1)

Optoelectronic devices -- Materials.

(1)

Optoelectronic devices.

(1)

Oxides -- Electric properties.

(1)

Photoluminescence.

(1)

Photovoltaic power generation.

(1)

Power electronics.

(1)

Renewable energy sources.

(1)

(1)

Semiconductor films.

(1)

Semiconductor industry -- Cost control.

(1)

Semiconductor wafers -- Handbooks, manuals, etc.

(1)

Semiconductor wafers.

(1)

Semiconductors -- Bonding -- Handbooks, manuals, etc.

(1)

Semiconductors -- Defects -- Congresses.

(1)

Semiconductors -- Design and construction -- Materials.

(1)

Semiconductors -- Design and construction.

(1)

Semiconductors -- Materials -- Congresses.

(1)

Semiconductors -- Periodicals.

(1)

Semiconductors -- Reliability.

(1)

Semimetals -- Periodicals..

(1)

Silicon Compounds.

(1)

Silicon carbide -- Biotechnology.

(1)

Silicon carbide.

(1)

Silicon-on-insulator technology.

(1)

(1)

(1)

TECHNOLOGY & ENGINEERING -- Electronics -- Circuits -- General.

(1)

Thin film transistors.

(1)

Three-dimensional imaging.

(1)

Three-dimensional integrated circuits -- Design and construction.

(1)

Three-dimensional integrated circuits.

(1)

Titanium dioxide.

(1)

Transparent semiconductors.

(1)

Voltage references.

(1)

X-ray diffractometer -- Materials.

(1)

X-rays -- Measurement -- Materials.

(1)

YARIMETALLER -- SÜRELİ YAYINLAR..

(1)

YARIİLETKENLER -- SÜRELİ YAYINLAR.

(1)

Material Type

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25.

Cover image for High-k gate dielectrics for CMOS technology

High-k gate dielectrics for CMOS technology

High-k gate dielectrics for CMOS technology

Author

He, Gang (Professor of physics) Sun, Zhaoqi (Professor of physics)

Preferred Shelf Number

ONLINE

Electronic Access

ebrary An electronic book accessible through the World Wide Web; click to view
http://public.eblib.com/EBLPublic/PublicView.do?ptiID=956000
Wiley InterScience http://dx.doi.org/10.1002/9783527646340
ebrary http://site.ebrary.com/id/10653595

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Online Library~1

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26.

Cover image for Handbook of luminescent semiconductor materials

Handbook of luminescent semiconductor materials

Handbook of luminescent semiconductor materials

Author

Bergman, Leah. McHale, Jeanne L.

Preferred Shelf Number

ONLINE

Electronic Access

Distributed by publisher. Purchase or institutional license may be required for access.

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Online Library~1

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27.

Cover image for MicroCMOS design

MicroCMOS design

MicroCMOS design

Author

Song, Bang-Sup.

Preferred Shelf Number

ONLINE

Electronic Access

Distributed by publisher. Purchase or institutional license may be required for access.

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28.

Cover image for Nano-CMOS gate dielectric engineering

Nano-CMOS gate dielectric engineering

Nano-CMOS gate dielectric engineering

Author

Wong, Hei.

Preferred Shelf Number

ONLINE

Electronic Access

Distributed by publisher. Purchase or institutional license may be required for access.

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29.

Cover image for Compound semiconductor radiation detectors

Compound semiconductor radiation detectors

Compound semiconductor radiation detectors

Author

Owens, Alan.

Preferred Shelf Number

ONLINE

Electronic Access

Distributed by publisher. Purchase or institutional license may be required for access.

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30.

Cover image for Substrate surface preparation handbook / Max Robertson

Substrate surface preparation handbook / Max Robertson

Substrate surface preparation handbook / Max Robertson

Author

Robertson, Max

Preferred Shelf Number

QC611.S9 R56 2012

Format:

Availability

Beytepe Library~1

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31.

Cover image for HeteroSiC & WASMPE 2011 selected, peer reviewed papers from the 4th Workshop on Advanced Semiconductor Materials and Devices for Power Electronics Applications (HeteroSiC & WASMPE 2011), June 27-30, 2011, Tours, France

HeteroSiC & WASMPE 2011 selected, peer reviewed papers from the 4th Workshop on Advanced Semiconductor Materials and Devices for Power Electronics Applications (HeteroSiC & WASMPE 2011), June 27-30, 2011, Tours, France

HeteroSiC & WASMPE 2011 selected, peer reviewed papers from the 4th Workshop on Advanced Semiconductor Materials and Devices for Power Electronics Applications (HeteroSiC & WASMPE 2011), June 27-30, 2011, Tours, France

Author

Alquier, Daniel.

Preferred Shelf Number

ONLINE

Electronic Access

EBSCOhost http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=517109

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32.

Cover image for Semiconductor strain metrology principles and applications

Semiconductor strain metrology principles and applications

Semiconductor strain metrology principles and applications

Author

Wong, Terence K. S.

Preferred Shelf Number

ONLINE

Electronic Access

EBSCOhost http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=500610

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33.

Cover image for Handbook of spin transport and magnetism

Handbook of spin transport and magnetism

Handbook of spin transport and magnetism

Author

Tsymbal, E. Y. (Evgeny Y.) Zutic, Igor.

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ONLINE

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34.

Cover image for CMOS voltage references an analytical and practical perspective

CMOS voltage references an analytical and practical perspective

CMOS voltage references an analytical and practical perspective

Author

Kok, Chi-Wah. Tam, Wing-Shan.

Preferred Shelf Number

ONLINE

Electronic Access

IEEE Xplore http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=6462190

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35.

Cover image for Semiconductor physics and devices : basic principles

Semiconductor physics and devices : basic principles

Semiconductor physics and devices : basic principles

Author

Neamen, Donald A.

Preferred Shelf Number

QC611 N43 2012

Format:

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