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1. 
Cover image for Graphene Nanoelectronics Metrology, Synthesis, Properties and Applications
Graphene Nanoelectronics Metrology, Synthesis, Properties and Applications
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Raza, Hassan. editor. SpringerLink (Online service)
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http://dx.doi.org/10.1007/978-3-642-22984-8
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Cover image for Scanning Probe Microscopy in Nanoscience and Nanotechnology 2
Scanning Probe Microscopy in Nanoscience and Nanotechnology 2
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Bhushan, Bharat. editor. SpringerLink (Online service)
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http://dx.doi.org/10.1007/978-3-642-10497-8
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Cover image for Quantum Materials, Lateral Semiconductor Nanostructures, Hybrid Systems and Nanocrystals Lateral Semiconductor Nanostructures, Hybrid Systems and Nanocrystals
Quantum Materials, Lateral Semiconductor Nanostructures, Hybrid Systems and Nanocrystals Lateral Semiconductor Nanostructures, Hybrid Systems and Nanocrystals
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Heitmann, Detlef. editor. SpringerLink (Online service)
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http://dx.doi.org/10.1007/978-3-642-10553-1
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4. 
Cover image for Nanoscience and Engineering in Superconductivity
Nanoscience and Engineering in Superconductivity
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Moshchalkov, Victor. editor. Woerdenweber, Roger. editor. Lang, Wolfgang. editor. SpringerLink (Online service)
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http://dx.doi.org/10.1007/978-3-642-15137-8
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5. 
Cover image for Particle Size Measurements Fundamentals, Practice, Quality
Particle Size Measurements Fundamentals, Practice, Quality
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Merkus, Henk G. author. SpringerLink (Online service)
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http://dx.doi.org/10.1007/978-1-4020-9016-5
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6. 
Cover image for Applied Scanning Probe Methods XI Scanning Probe Microscopy Techniques
Applied Scanning Probe Methods XI Scanning Probe Microscopy Techniques
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Bhushan, Bharat. author. Fuchs, Harald. author. SpringerLink (Online service)
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http://dx.doi.org/10.1007/978-3-540-85037-3
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7. 
Cover image for Applied Scanning Probe Methods XII Characterization
Applied Scanning Probe Methods XII Characterization
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Bhushan, Bharat. editor. Fuchs, Harald. editor. SpringerLink (Online service)
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http://dx.doi.org/10.1007/978-3-540-85039-7
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8. 
Cover image for Applied Scanning Probe Methods XIII Biomimetics and Industrial Applications
Applied Scanning Probe Methods XIII Biomimetics and Industrial Applications
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Bhushan, Bharat. editor. Fuchs, Harald. editor. SpringerLink (Online service)
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http://dx.doi.org/10.1007/978-3-540-85049-6
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9. 
Cover image for Semiconductor Nanostructures
Semiconductor Nanostructures
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Bimberg, Dieter. editor. SpringerLink (Online service)
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http://dx.doi.org/10.1007/978-3-540-77899-8
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10. 
Cover image for Multiscale Dissipative Mechanisms and Hierarchical Surfaces Friction, Superhydrophobicity, and Biomimetics
Multiscale Dissipative Mechanisms and Hierarchical Surfaces Friction, Superhydrophobicity, and Biomimetics
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Nosonovsky, Michael. author. Bhushan, Bharat. author. SpringerLink (Online service)
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http://dx.doi.org/10.1007/978-3-540-78425-8
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11. 
Cover image for Fundamentals of Friction and Wear
Fundamentals of Friction and Wear
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Gnecco, Enrico. editor. Meyer, Ernst. editor. SpringerLink (Online service)
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http://dx.doi.org/10.1007/978-3-540-36807-6
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12. 
Cover image for Applied Scanning Probe Methods VI Characterization
Applied Scanning Probe Methods VI Characterization
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Bhushan, Bharat. editor. Kawata, Satoshi. editor. SpringerLink (Online service)
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http://dx.doi.org/10.1007/11776314
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