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25. 
Cover image for Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits 2nd Edition
Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits 2nd Edition
Author 
Sachdev, Manoj. editor. Gyvez, José Pineda de. editor. SpringerLink (Online service)
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ONLINE
Electronic Access 
http://dx.doi.org/10.1007/0-387-46547-2
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26. 
Cover image for Konstruktionselemente des Maschinenbaus 2 Grundlagen von Maschinenelementen für Antriebsaufgaben
Konstruktionselemente des Maschinenbaus 2 Grundlagen von Maschinenelementen für Antriebsaufgaben
Author 
Albers, Albert. author. Deters, Ludger. author. Feldhusen, Jörg. author. Leidich, Erhard. author. Linke, Heinz. author.
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Electronic Access 
http://dx.doi.org/10.1007/3-540-29630-1
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27. 
Cover image for Structural Sensitivity Analysis and Optimization 2 Nonlinear Systems and Applications
Structural Sensitivity Analysis and Optimization 2 Nonlinear Systems and Applications
Author 
Choi, Kyung K. author. Kim, Nam Ho. author. SpringerLink (Online service)
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http://dx.doi.org/10.1007/b138895
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28. 
Cover image for Design and manufacturing practices for performability engineering
Design and manufacturing practices for performability engineering
Author 
Chaturvedi, Sanjay K., editor. Gargama, Heeralal, editor. Rai, Rajiv N., editor.
Preferred Shelf Number 
TS171 .D47 2025
Electronic Access 
https://onlinelibrary.wiley.com/doi/book/10.1002/9781394345731
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29. 
Cover image for Industrial and manufacturing designs : quantitative and qualitative analysis
Industrial and manufacturing designs : quantitative and qualitative analysis
Author 
Sahu, Atul Kumar, editor Raut, Rakesh D. editor Raja, Rohit, editor Sahu, Anoop Kumar, editor Sahu, Nitin Kumar, editor
Preferred Shelf Number 
TA174
Electronic Access 
https://onlinelibrary.wiley.com/doi/book/10.1002/9781394212668
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30. 
Cover image for Structural dynamics in engineering design
Structural dynamics in engineering design
Author 
Maia, Nuno Manuel Mendes, 1956- author. Di Maio, Dario, author. Carrella, Alex, author. Marulo, Francesco, author. Zang, Chaoping, author.
Preferred Shelf Number 
TA174 .M337 2024
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https://onlinelibrary.wiley.com/doi/book/10.1002/9781118770696
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31. 
Cover image for Design of Mechanical Systems Accelerated Lifecycle Testing and Reliability
Design of Mechanical Systems Accelerated Lifecycle Testing and Reliability
Author 
Woo, Seongwoo. author. SpringerLink (Online service)
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https://doi.org/10.1007/978-3-031-28938-5
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32. 
Cover image for Materials, Design and Manufacturing for Sustainable Environment Select Proceedings of ICMDMSE 2022
Materials, Design and Manufacturing for Sustainable Environment Select Proceedings of ICMDMSE 2022
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Natarajan, Elango. editor. Vinodh, S. editor. Rajkumar, V. editor. SpringerLink (Online service)
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https://doi.org/10.1007/978-981-19-3053-9
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33. 
Cover image for Prediction Technologies for Improving Engineering Product Efficiency
Prediction Technologies for Improving Engineering Product Efficiency
Author 
Klyatis, Lev M. author. SpringerLink (Online service)
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https://doi.org/10.1007/978-3-031-16655-6
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34. 
Cover image for Research Techniques for Computer Science, Information Systems and Cybersecurity
Research Techniques for Computer Science, Information Systems and Cybersecurity
Author 
Mbanaso, Uche M. author. Abrahams, Lucienne. author. Okafor, Kennedy Chinedu. author. SpringerLink (Online service)
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https://doi.org/10.1007/978-3-031-30031-8
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35. 
Cover image for Emerging Trends in Mechanical and Industrial Engineering Select Proceedings of ICETMIE 2022
Emerging Trends in Mechanical and Industrial Engineering Select Proceedings of ICETMIE 2022
Author 
Li, Xianguo. editor. Rashidi, Mohammad Mehdi. editor. Lather, Rohit Singh. editor. Raman, Roshan. editor. SpringerLink (Online service)
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ONLINE
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https://doi.org/10.1007/978-981-19-6945-4
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36. 
Cover image for Digital Twin Development An Introduction to Simcenter Amesim
Digital Twin Development An Introduction to Simcenter Amesim
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Rückert, Frank U. author. Sauer, Michael. author. Liimatainen, Tuomo. author. Hübner, Dirk. author. SpringerLink (Online service)
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https://doi.org/10.1007/978-3-031-25692-9
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