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25. 
Cover image for Design, Analysis and Test of Logic Circuits Under Uncertainty
Design, Analysis and Test of Logic Circuits Under Uncertainty
Author 
Krishnaswamy, Smita. author. Markov, Igor L. author. Hayes, John P. author. SpringerLink (Online service)
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ONLINE(335669.1)
Electronic Access 
http://dx.doi.org/10.1007/978-90-481-9644-9
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26. 
Cover image for Mechanical Properties of Materials
Mechanical Properties of Materials
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Pelleg, Joshua. author. SpringerLink (Online service)
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ONLINE(335750.1)
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http://dx.doi.org/10.1007/978-94-007-4342-7
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27. 
Cover image for IAENG Transactions on Engineering Technologies Special Edition of the World Congress on Engineering and Computer Science 2011
IAENG Transactions on Engineering Technologies Special Edition of the World Congress on Engineering and Computer Science 2011
Author 
Kim, Haeng Kon. editor. Ao, Sio-Iong. editor. Rieger, Burghard B. editor. SpringerLink (Online service)
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ONLINE(335821.1)
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http://dx.doi.org/10.1007/978-94-007-4786-9
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28. 
Cover image for Test and Diagnosis for Small-Delay Defects
Test and Diagnosis for Small-Delay Defects
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Tehranipoor, Mohammad. author. Peng, Ke. author. Chakrabarty, Krishnendu. author. SpringerLink (Online service)
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http://dx.doi.org/10.1007/978-1-4419-8297-1
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29. 
Cover image for Software Reliability Assessment with OR Applications
Software Reliability Assessment with OR Applications
Author 
Kapur, P.K. author. Pham, Hoang. author. Gupta, A. author. Jha, P.C. author. SpringerLink (Online service)
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http://dx.doi.org/10.1007/978-0-85729-204-9
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30. 
Cover image for Dependability of Networked Computer-based Systems
Dependability of Networked Computer-based Systems
Author 
Verma, Ajit Kumar. author. Ajit, Srividya. author. Kumar, Manoj. author. SpringerLink (Online service)
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http://dx.doi.org/10.1007/978-0-85729-318-3
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31. 
Cover image for Soft Errors in Modern Electronic Systems
Soft Errors in Modern Electronic Systems
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Nicolaidis, Michael. editor. SpringerLink (Online service)
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http://dx.doi.org/10.1007/978-1-4419-6993-4
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32. 
Cover image for Predictive Technology Model for Robust Nanoelectronic Design
Predictive Technology Model for Robust Nanoelectronic Design
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Cao, Yu. author. SpringerLink (Online service)
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http://dx.doi.org/10.1007/978-1-4614-0445-3
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33. 
Cover image for Trustworthy Internet
Trustworthy Internet
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Salgarelli, Luca. editor. Bianchi, Giuseppe. editor. Blefari-Melazzi, Nicola. editor. SpringerLink (Online service)
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http://dx.doi.org/10.1007/978-88-470-1818-1
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34. 
Cover image for VLSI 2010 Annual Symposium Selected papers
VLSI 2010 Annual Symposium Selected papers
Author 
Voros, Nikolaos. editor. Mukherjee, Amar. editor. Sklavos, Nicolas. editor. Masselos, Konstantinos. editor. Huebner, Michael. editor.
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http://dx.doi.org/10.1007/978-94-007-1488-5
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35. 
Cover image for Models in Hardware Testing Lecture Notes of the Forum in Honor of Christian Landrault
Models in Hardware Testing Lecture Notes of the Forum in Honor of Christian Landrault
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Wunderlich, Hans-Joachim. editor. SpringerLink (Online service)
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http://dx.doi.org/10.1007/978-90-481-3282-9
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36. 
Cover image for Permanent Magnet Motor Technology : Design and Applications, Third Edition
Permanent Magnet Motor Technology : Design and Applications, Third Edition
Author 
Gieras, Jacek F., author. Taylor and Francis.
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TK2537
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