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25. 
Cover image for Applied Scanning Probe Methods III Characterization
Applied Scanning Probe Methods III Characterization
Author 
Bhushan, Bharat. editor. Fuchs, Harald. editor. SpringerLink (Online service)
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http://dx.doi.org/10.1007/b138285
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26. 
Cover image for Applied Scanning Probe Methods IV Industrial Applications
Applied Scanning Probe Methods IV Industrial Applications
Author 
Bhushan, Bharat. editor. Fuchs, Harald. editor. SpringerLink (Online service)
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http://dx.doi.org/10.1007/b138289
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27. 
Cover image for Metalle Struktur und Eigenschaften der Metalle und Legierungen
Metalle Struktur und Eigenschaften der Metalle und Legierungen
Author 
Hornbogen, Erhard. author. Warlimont, Hans. author. SpringerLink (Online service)
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http://dx.doi.org/10.1007/3-540-34011-4
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28. 
Cover image for Planewaves, Pseudopotentials and the LAPW Method
Planewaves, Pseudopotentials and the LAPW Method
Author 
Singh, David J. author. Nordström, Lars. author. SpringerLink (Online service)
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http://dx.doi.org/10.1007/978-0-387-29684-5
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29. 
Cover image for Scanning Probe Microscopy Atomic Scale Engineering by Forces and Currents
Scanning Probe Microscopy Atomic Scale Engineering by Forces and Currents
Author 
Foster, Adam. author. Hofer, Werner. author. SpringerLink (Online service)
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http://dx.doi.org/10.1007/0-387-37231-8
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30. 
Cover image for Handbook of Applied Solid State Spectroscopy
Handbook of Applied Solid State Spectroscopy
Author 
Vij, D. R. editor. SpringerLink (Online service)
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http://dx.doi.org/10.1007/0-387-37590-2
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31. 
Cover image for Applied Scanning Probe Methods II Scanning Probe Microscopy Techniques
Applied Scanning Probe Methods II Scanning Probe Microscopy Techniques
Author 
Bhushan, Bharat. editor. Fuchs, Harald. editor. SpringerLink (Online service)
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http://dx.doi.org/10.1007/b139097
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32. 
Cover image for Handbook of Practical X-Ray Fluorescence Analysis
Handbook of Practical X-Ray Fluorescence Analysis
Author 
Beckhoff, Burkhard. editor. Kanngießer, habil. Birgit. editor. Langhoff, Norbert. editor. Wedell, Reiner. editor. Wolff, Helmut. editor.
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http://dx.doi.org/10.1007/978-3-540-36722-2
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33. 
Cover image for Introduction to Focused Ion Beams Instrumentation, Theory, Techniques and Practice
Introduction to Focused Ion Beams Instrumentation, Theory, Techniques and Practice
Author 
Giannuzzi, Lucille A. editor. Stevie, Fred A. editor. SpringerLink (Online service)
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http://dx.doi.org/10.1007/b101190
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34. 
Cover image for Materials for Information Technology Devices, Interconnects and Packaging
Materials for Information Technology Devices, Interconnects and Packaging
Author 
Zschech, Ehrenfried. editor. Whelan, Caroline. editor. Mikolajick, Thomas. editor. SpringerLink (Online service)
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http://dx.doi.org/10.1007/1-84628-235-7
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35. 
Cover image for Spectroscopic Properties of Rare Earths in Optical Materials
Spectroscopic Properties of Rare Earths in Optical Materials
Author 
Hull, Robert. editor. Parisi, Jürgen. editor. Osgood, R. M. editor. Warlimont, Hans. editor. Liu, Guokui. editor.
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http://dx.doi.org/10.1007/3-540-28209-2
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36. 
Cover image for Thin Films and Heterostructures for Oxide Electronics
Thin Films and Heterostructures for Oxide Electronics
Author 
Ogale, Satischandra B. author. SpringerLink (Online service)
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http://dx.doi.org/10.1007/b136780
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