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1. 
Cover image for Transition-Metal Defects in Silicon New Insights from Photoluminescence Studies of Highly Enriched 28Si
Transition-Metal Defects in Silicon New Insights from Photoluminescence Studies of Highly Enriched 28Si
Author 
Steger, Michael. author. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE(333931.1)
Electronic Access 
http://dx.doi.org/10.1007/978-3-642-35079-5
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2. 
Cover image for Strongly Correlated Systems Numerical Methods
Strongly Correlated Systems Numerical Methods
Author 
Avella, Adolfo. editor. Mancini, Ferdinando. editor. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE(333937.1)
Electronic Access 
http://dx.doi.org/10.1007/978-3-642-35106-8
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3. 
Cover image for High Permittivity Gate Dielectric Materials
High Permittivity Gate Dielectric Materials
Author 
Kar, Samares. editor. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE(334228.1)
Electronic Access 
http://dx.doi.org/10.1007/978-3-642-36535-5
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4. 
Cover image for Modern NMR Methodology
Modern NMR Methodology
Author 
Heise, Henrike. editor. Matthews, Stephen. editor. SpringerLink (Online service)
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ONLINE(334511.1)
Electronic Access 
http://dx.doi.org/10.1007/978-3-642-37991-8
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5. 
Cover image for ICAME 2011 Proceedings of the 31st International Conference on the Applications of the Mössbauer Effect (ICAME 2011) held in Tokyo, Japan, 25-30 September 2011
ICAME 2011 Proceedings of the 31st International Conference on the Applications of the Mössbauer Effect (ICAME 2011) held in Tokyo, Japan, 25-30 September 2011
Author 
Yoshida, Yutaka. editor. SpringerLink (Online service)
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ONLINE(335817.1)
Electronic Access 
http://dx.doi.org/10.1007/978-94-007-4762-3
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