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25. 
Cover image for Practical root cause failure analysis : key elements, case studies, and common equipment ... failures.
Practical root cause failure analysis : key elements, case studies, and common equipment ... failures.
Author 
Riddell, Randy.
Preferred Shelf Number 
TA169.5
Electronic Access 
Taylor & Francis https://www.taylorfrancis.com/books/e/9781003248675
Taylor & Francis https://www.taylorfrancis.com/books/9781003248675
OCLC metadata license agreement http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf
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26. 
Cover image for Avoiding inelastic strains in solder joint interconnections of IC devices
Avoiding inelastic strains in solder joint interconnections of IC devices
Author 
Suhir, Ephraim, author.
Preferred Shelf Number 
TK7874.53 .S84 2021 EB
Electronic Access 
Taylor & Francis https://www.taylorfrancis.com/books/9780429460470
OCLC metadata license agreement http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf
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27. 
Cover image for Accelerated life testing of one-shot devices : data collection and analysis
Accelerated life testing of one-shot devices : data collection and analysis
Author 
Balakrishnan, N., 1956- author. Ling, Man Ho, author. So, Hon Yiu, author.
Preferred Shelf Number 
TA169.3 .B35 2021
Electronic Access 
https://onlinelibrary.wiley.com/doi/book/10.1002/9781119664031
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28. 
Cover image for Mechanical engineering under uncertainties : from classical approaches to some recent developments
Mechanical engineering under uncertainties : from classical approaches to some recent developments
Author 
Gogu, Christian, editor.
Preferred Shelf Number 
TJ145 .M43 2021 EB
Electronic Access 
https://onlinelibrary.wiley.com/doi/book/10.1002/9781119817635
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29. 
Cover image for Engineering physics of high temperature materials : metals, ice, rocks and ceramics
Engineering physics of high temperature materials : metals, ice, rocks and ceramics
Author 
Sinha, Nirmal K. (Engineer), author. Sinha, Shoma, author.
Preferred Shelf Number 
TA418.24 .S56 2021
Electronic Access 
https://onlinelibrary.wiley.com/doi/book/10.1002/9781119420507
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30. 
Cover image for Practically Speaking : A Dictionary of Quotations on Engineering, Technology and Architecture.
Practically Speaking : A Dictionary of Quotations on Engineering, Technology and Architecture.
Author 
Gaither, Carl C., 1944- author.
Preferred Shelf Number 
TA9
Electronic Access 
Taylor & Francis https://www.taylorfrancis.com/books/9780429187155
OCLC metadata license agreement http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf
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31. 
Cover image for Reliability analysis for asset management of electric power grids
Reliability analysis for asset management of electric power grids
Author 
Ross, Robert D., author.
Preferred Shelf Number 
TK3001 .R67 2019
Electronic Access 
https://onlinelibrary.wiley.com/doi/book/10.1002/9781119125204
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32. 
Cover image for Analysis and design of machine elements
Analysis and design of machine elements
Author 
Jiang, Wei, 1966- author.
Preferred Shelf Number 
TJ230 .J52 2019
Electronic Access 
https://onlinelibrary.wiley.com/doi/book/10.1002/9781119276081
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33. 
Cover image for Soil Mechanics : Concepts and Applications, Third Edition
Soil Mechanics : Concepts and Applications, Third Edition
Author 
Powrie, William, author. Taylor and Francis.
Preferred Shelf Number 
 TA710
Electronic Access 
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34. 
Cover image for Structural reliability analysis and prediction
Structural reliability analysis and prediction
Author 
Melchers, R. E. (Robert E.), 1945- author. Beck, André T., author.
Preferred Shelf Number 
TA656.5 .M45 2018
Electronic Access 
https://onlinelibrary.wiley.com/doi/book/10.1002/9781119266105
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35. 
Cover image for Forensic systems engineering : evaluating operations by discovery
Forensic systems engineering : evaluating operations by discovery
Author 
Stimson, William A., author.
Preferred Shelf Number 
TA169.5 .S755 2018
Electronic Access 
https://onlinelibrary.wiley.com/doi/book/10.1002/9781119422808
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36. 
Cover image for Probabilistic physics of failure approach to reliability : modeling, accelerated testing, prognosis and reliability assessment
Probabilistic physics of failure approach to reliability : modeling, accelerated testing, prognosis and reliability assessment
Author 
Modarres, M. (Mohammad), author. Amiri, Mehdi, author. Jackson, Christopher, 1979- author.
Preferred Shelf Number 
TA169.5
Electronic Access 
https://onlinelibrary.wiley.com/doi/book/10.1002/9781119388692
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