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25. 
Cover image for Metrology and Measurement Uncertainty Concepts and Applications
Metrology and Measurement Uncertainty Concepts and Applications
Author 
Novellino do Rosario, Pedro Paulo. author. Mendes, Alexandre. author. SpringerLink (Online service)
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ONLINE
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https://doi.org/10.1007/978-3-031-82303-9
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26. 
Cover image for Coordinate Metrology Accuracy of Systems and Measurements
Coordinate Metrology Accuracy of Systems and Measurements
Author 
Sładek, Jerzy A. author. SpringerLink (Online service)
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ONLINE
Electronic Access 
https://doi.org/10.1007/978-3-662-48465-4
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27. 
Cover image for Metrology for Fire Experiments in Outdoor Conditions
Metrology for Fire Experiments in Outdoor Conditions
Author 
Silvani, Xavier. author. SpringerLink (Online service)
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ONLINE(332373.1)
Electronic Access 
http://dx.doi.org/10.1007/978-1-4614-7962-8
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28. 
Cover image for Graphene Nanoelectronics Metrology, Synthesis, Properties and Applications
Graphene Nanoelectronics Metrology, Synthesis, Properties and Applications
Author 
Raza, Hassan. editor. SpringerLink (Online service)
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http://dx.doi.org/10.1007/978-3-642-22984-8
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29. 
Cover image for Distributed Large-Scale Dimensional Metrology New Insights
Distributed Large-Scale Dimensional Metrology New Insights
Author 
Franceschini, Fiorenzo. author. Galetto, Maurizio. author. Maisano, Domenico. author. Mastrogiacomo, Luca. author. Pralio, Barbara. author.
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Electronic Access 
http://dx.doi.org/10.1007/978-0-85729-543-9
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30. 
Cover image for Digital holography for MEMS and microsystem metrology
Digital holography for MEMS and microsystem metrology
Author 
Asundi, Anand.
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ONLINE
Electronic Access 
John Wiley http://dx.doi.org/10.1002/9781119997290
http://lib.myilibrary.com?id=317798
http://public.eblib.com/EBLPublic/PublicView.do?ptiID=697681
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31. 
Cover image for Advances in speckle metrology and related techniques
Advances in speckle metrology and related techniques
Author 
Kaufmann, Guillermo H.
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ONLINE
Electronic Access 
Wiley InterScience An electronic book accessible through the World Wide Web; click for information
Wiley InterScience - Full Text Online http://onlinelibrary.wiley.com/book/10.1002/9783527633852
http://site.ebrary.com/lib/alltitles/Doc?id=10446636
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32. 
Cover image for Handbook of optical metrology : principles and applications
Handbook of optical metrology : principles and applications
Author 
Yoshizawa, Toru, 1939-
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QC367 .H36 2009
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33. 
Cover image for Metrology in industry the key for quality
Metrology in industry the key for quality
Author 
Collège français de métrologie. Wiley InterScience (Online service)
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Contributor biographical information http://catdir.loc.gov/catdir/enhancements/fy0806/2006003530-b.html
John Wiley http://dx.doi.org/10.1002/9780470612125
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34. 
Cover image for Transverse disciplines in metrology proceedings of the 13th International Metrology Congress, 2007, Lille, France
Transverse disciplines in metrology proceedings of the 13th International Metrology Congress, 2007, Lille, France
Author 
International Metrology Conference (13th : 2007 : French College of Metrology) Collège français de métrologie. Wiley InterScience (Online service)
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Ebook Library http://public.eblib.com/EBLPublic/PublicView.do?ptiID=477706
John Wiley http://dx.doi.org/10.1002/9780470611371
http://site.ebrary.com/lib/alltitles/Doc?id=10360928
http://swb.eblib.com/patron/FullRecord.aspx?p=477706
HathiTrust Digital Library, Limited view (search only) http://catalog.hathitrust.org/api/volumes/oclc/230183422.html
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35. 
Cover image for Advances in Metrology Select Proceedings of AdMet 2024
Advances in Metrology Select Proceedings of AdMet 2024
Author 
Yadav, Sanjay. editor. Garg, Naveen. editor. Kumar, Mukesh. editor. Aggarwal, Shankar G. editor. Jaiswal, Shiv Kumar. editor.
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https://doi.org/10.1007/978-981-96-6418-4
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36. 
Cover image for Advances in Biophotonics, Nanofabrication, Optical Metrology and Nonlinear and Ultrafast Photonics Proceedings of PHOTONICS 2023, Volume 3
Advances in Biophotonics, Nanofabrication, Optical Metrology and Nonlinear and Ultrafast Photonics Proceedings of PHOTONICS 2023, Volume 3
Author 
Prakash, Jaya. editor. Basu, Jaydeep Kumar. editor. Mukherjee, Sebabrata. editor. Chandrashekar, C. M. editor. (orcid)0000-0003-4820-2317 SpringerLink (Online service)
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https://doi.org/10.1007/978-981-97-7917-8
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