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25. 
Cover image for Computer Engineering and Technology 16th National Conference, NCCET 2012, Shanghai, China, August 17-19, 2012, Revised Selected Papers
Computer Engineering and Technology 16th National Conference, NCCET 2012, Shanghai, China, August 17-19, 2012, Revised Selected Papers
Author 
Xu, Weixia. editor. Xiao, Liquan. editor. Lu, Pingjing. editor. Li, Jinwen. editor. Zhang, Chengyi. editor.
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ONLINE(334080.1)
Electronic Access 
http://dx.doi.org/10.1007/978-3-642-35898-2
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26. 
Cover image for Parallel Computing Technologies 12th International Conference, PaCT 2013, St. Petersburg, Russia, September 30 - October 4, 2013. Proceedings
Parallel Computing Technologies 12th International Conference, PaCT 2013, St. Petersburg, Russia, September 30 - October 4, 2013. Proceedings
Author 
Malyshkin, Victor. editor. SpringerLink (Online service)
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ONLINE(334871.1)
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http://dx.doi.org/10.1007/978-3-642-39958-9
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27. 
Cover image for Privacy and Security for Cloud Computing
Privacy and Security for Cloud Computing
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Pearson, Siani. editor. Yee, George. editor. SpringerLink (Online service)
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ONLINE(330926.1)
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http://dx.doi.org/10.1007/978-1-4471-4189-1
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28. 
Cover image for Energy-Efficient High Performance Computing Measurement and Tuning
Energy-Efficient High Performance Computing Measurement and Tuning
Author 
Laros III, James H. author. Pedretti, Kevin. author. Kelly, Suzanne M. author. Shu, Wei. author. Ferreira, Kurt. author.
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29. 
Cover image for Energy Minimization Methods in Computer Vision and Pattern Recognition 9th International Conference, EMMCVPR 2013, Lund, Sweden, August 19-21, 2013. Proceedings
Energy Minimization Methods in Computer Vision and Pattern Recognition 9th International Conference, EMMCVPR 2013, Lund, Sweden, August 19-21, 2013. Proceedings
Author 
Heyden, Anders. editor. Kahl, Fredrik. editor. Olsson, Carl. editor. Oskarsson, Magnus. editor. Tai, Xue-Cheng. editor.
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ONLINE(334939.1)
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http://dx.doi.org/10.1007/978-3-642-40395-8
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30. 
Cover image for Design, Analysis and Test of Logic Circuits Under Uncertainty
Design, Analysis and Test of Logic Circuits Under Uncertainty
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Krishnaswamy, Smita. author. Markov, Igor L. author. Hayes, John P. author. SpringerLink (Online service)
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http://dx.doi.org/10.1007/978-90-481-9644-9
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31. 
Cover image for Advances in protective structures research proceedings of the IAPS Open Forum on Recent Research Advances on Protective Structures, Tianjin, China, 13-14 September 2012
Advances in protective structures research proceedings of the IAPS Open Forum on Recent Research Advances on Protective Structures, Tianjin, China, 13-14 September 2012
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IAPS Open Forum on Recent Research Advances on Protective Structures (2012 : Tianjin, China) Hao, Hong, 1972-
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32. 
Cover image for Semiconductor packaging materials interaction and reliability
Semiconductor packaging materials interaction and reliability
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Chen, Andrea. Lo, Randy.
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33. 
Cover image for Rail human factors around the world impacts on and of people for successful rail operations
Rail human factors around the world impacts on and of people for successful rail operations
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Wilson, John R.
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34. 
Cover image for Pattern recognition for reliability assessment of water distribution networks
Pattern recognition for reliability assessment of water distribution networks
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Trifunovi?, Nemanja.
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35. 
Cover image for Plasma processing of nanomaterials
Plasma processing of nanomaterials
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Sankaran, Mohan.
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36. 
Cover image for Power vacuum tubes handbook
Power vacuum tubes handbook
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Whitaker, Jerry C.
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