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409. 
Cover image for 3D IC stacking technology
3D IC stacking technology
Author 
Wu, Banqiu. Kumar, Ajay. Ramaswami, Sesh.
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410. 
Cover image for Google Sketchup workshop : modeling, visualizing, and illustrating
Google Sketchup workshop : modeling, visualizing, and illustrating
Author 
Brixius, Laurent.
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411. 
Cover image for AutoCAD 2011 : essentials
AutoCAD 2011 : essentials
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Hamad, Munir M.
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T385 H3293 2011
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412. 
Cover image for VHDL for logic synthesis
VHDL for logic synthesis
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Rushton, Andrew.
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Books24x7 http://www.books24x7.com/marc.asp?bookid=41715
John Wiley http://dx.doi.org/10.1002/9781119995852
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413. 
Cover image for Up and running with AutoCAD 2012. 2D drawing and modeling
Up and running with AutoCAD 2012. 2D drawing and modeling
Author 
Gindis, Elliot.
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ScienceDirect http://www.sciencedirect.com/science/book/9780123876836
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414. 
Cover image for Structural Optimization with Uncertainties
Structural Optimization with Uncertainties
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Banichuk, N.V. author. Neittaanmäki, Pekka. author. SpringerLink (Online service)
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http://dx.doi.org/10.1007/978-90-481-2518-0
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415. 
Cover image for Designing Amplifier Circuits (Analog Circuit Design Series Volume 1)
Designing Amplifier Circuits (Analog Circuit Design Series Volume 1)
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Feucht, D.
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416. 
Cover image for Introduction to AutoCAD 2011 2D and 3D design
Introduction to AutoCAD 2011 2D and 3D design
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Yarwood, Alf.
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417. 
Cover image for Power-Aware Testing and Test Strategies for Low Power Devices
Power-Aware Testing and Test Strategies for Low Power Devices
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Girard, Patrick. editor. Nicolici, Nicola. editor. Wen, Xiaoqing. editor. SpringerLink (Online service)
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http://dx.doi.org/10.1007/978-1-4419-0928-2
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418. 
Cover image for Analysis and Design of Resilient VLSI Circuits Mitigating Soft Errors and Process Variations
Analysis and Design of Resilient VLSI Circuits Mitigating Soft Errors and Process Variations
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Garg, Rajesh. author. Khatri, Sunil P. author. SpringerLink (Online service)
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http://dx.doi.org/10.1007/978-1-4419-0931-2
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419. 
Cover image for Advanced Test Methods for SRAMs Effective Solutions for Dynamic Fault Detection in Nanoscaled Technologies
Advanced Test Methods for SRAMs Effective Solutions for Dynamic Fault Detection in Nanoscaled Technologies
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Bosio, Alberto. author. Dilillo, Luigi. author. Girard, Patrick. author. Pravossoudovitch, Serge. author. Virazel, Arnaud. author.
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420. 
Cover image for Designing Embedded Systems with the SIGNAL Programming Language Synchronous, Reactive Specification
Designing Embedded Systems with the SIGNAL Programming Language Synchronous, Reactive Specification
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Gamatie, Abdoulaye. author. SpringerLink (Online service)
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http://dx.doi.org/10.1007/978-1-4419-0941-1
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