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421. 
Cover image for Security in Embedded Devices
Security in Embedded Devices
Author 
Gebotys, Catherine H. author. SpringerLink (Online service)
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ONLINE
Electronic Access 
http://dx.doi.org/10.1007/978-1-4419-1530-6
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422. 
Cover image for Design and Verification of Microprocessor Systems for High-Assurance Applications
Design and Verification of Microprocessor Systems for High-Assurance Applications
Author 
Hardin, David S. editor. SpringerLink (Online service)
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ONLINE
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http://dx.doi.org/10.1007/978-1-4419-1539-9
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423. 
Cover image for Scalable Techniques for Formal Verification
Scalable Techniques for Formal Verification
Author 
Ray, Sandip. author. SpringerLink (Online service)
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http://dx.doi.org/10.1007/978-1-4419-5998-0
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424. 
Cover image for A Practical Introduction to Hardware/Software Codesign
A Practical Introduction to Hardware/Software Codesign
Author 
Schaumont, Patrick R. author. SpringerLink (Online service)
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ONLINE
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http://dx.doi.org/10.1007/978-1-4419-6000-9
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425. 
Cover image for Processor and System-on-Chip Simulation
Processor and System-on-Chip Simulation
Author 
Leupers, Rainer. editor. Temam, Olivier. editor. SpringerLink (Online service)
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http://dx.doi.org/10.1007/978-1-4419-6175-4
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426. 
Cover image for Low Power Hardware Synthesis from Concurrent Action-Oriented Specifications
Low Power Hardware Synthesis from Concurrent Action-Oriented Specifications
Author 
Singh, Gaurav. author. Shukla, Sandeep K. author. SpringerLink (Online service)
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http://dx.doi.org/10.1007/978-1-4419-6481-6
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427. 
Cover image for Software Automatic Tuning From Concepts to State-of-the-Art Results
Software Automatic Tuning From Concepts to State-of-the-Art Results
Author 
Naono, Ken. editor. Teranishi, Keita. editor. Cavazos, John. editor. Suda, Reiji. editor. SpringerLink (Online service)
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http://dx.doi.org/10.1007/978-1-4419-6935-4
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428. 
Cover image for Composing Software Components A Software-testing Perspective
Composing Software Components A Software-testing Perspective
Author 
Hamlet, Dick. author. SpringerLink (Online service)
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http://dx.doi.org/10.1007/978-1-4419-7148-7
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429. 
Cover image for CAD and GIS integration
CAD and GIS integration
Author 
Karimi, Hassan A. Akinci, Burcu.
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G70.28 C33 2010
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430. 
Cover image for Power-Aware Testing and Test Strategies for Low Power Devices
Power-Aware Testing and Test Strategies for Low Power Devices
Author 
Girard, Patrick. editor. Nicolici, Nicola. editor. Wen, Xiaoqing. editor. SpringerLink (Online service)
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http://dx.doi.org/10.1007/978-1-4419-0928-2
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431. 
Cover image for Analysis and Design of Resilient VLSI Circuits Mitigating Soft Errors and Process Variations
Analysis and Design of Resilient VLSI Circuits Mitigating Soft Errors and Process Variations
Author 
Garg, Rajesh. author. Khatri, Sunil P. author. SpringerLink (Online service)
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http://dx.doi.org/10.1007/978-1-4419-0931-2
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432. 
Cover image for Advanced Test Methods for SRAMs Effective Solutions for Dynamic Fault Detection in Nanoscaled Technologies
Advanced Test Methods for SRAMs Effective Solutions for Dynamic Fault Detection in Nanoscaled Technologies
Author 
Bosio, Alberto. author. Dilillo, Luigi. author. Girard, Patrick. author. Pravossoudovitch, Serge. author. Virazel, Arnaud. author.
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http://dx.doi.org/10.1007/978-1-4419-0938-1
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