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1. 
Cover image for Micro and Nanoelectronics Devices, Circuits and Systems Select Proceedings of MNDCS 2024
Micro and Nanoelectronics Devices, Circuits and Systems Select Proceedings of MNDCS 2024
Author 
Guha, Koushik. editor. Saha, Samar Kanti. editor. (orcid)0000-0002-5687-591X Iannacci, Jacopo. editor. (orcid)0000-0001-6462-4814 SpringerLink (Online service)
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https://doi.org/10.1007/978-981-96-3758-4
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Cover image for A Problem-Solving Approach to Electric Circuits Volume III
A Problem-Solving Approach to Electric Circuits Volume III
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Asadi, Farzin. author. SpringerLink (Online service)
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https://doi.org/10.1007/978-3-031-95493-1
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Cover image for Photoresist Technology in Microsystems: Principles, Processes and Applications
Photoresist Technology in Microsystems: Principles, Processes and Applications
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Wang, Kaiying. author. SpringerLink (Online service)
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https://doi.org/10.1007/978-981-95-1606-3
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Cover image for Advances in Micro-Electronics, Embedded Systems and IoT Proceedings of Ninth International Conference on Microelectronics Electromagnetics and Telecommunications (ICMEET 2024), Volume 1
Advances in Micro-Electronics, Embedded Systems and IoT Proceedings of Ninth International Conference on Microelectronics Electromagnetics and Telecommunications (ICMEET 2024), Volume 1
Author 
Bhateja, Vikrant. editor. Anguera, Jaume. editor. Ghosh, Anumoy. editor. (orcid)0000-0003-4865-5893 Chowdary, P. Satish Rama. editor. (orcid)0000-0002-1649-4258 SpringerLink (Online service)
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https://doi.org/10.1007/978-981-96-7222-6
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5. 
Cover image for Advancements in VLSI Design, Microelectronics Devices and Circuits Select Proceedings of SPIN 2025, Volume 5
Advancements in VLSI Design, Microelectronics Devices and Circuits Select Proceedings of SPIN 2025, Volume 5
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Kumar, Pradeep. editor. Navaraj, William. editor. Moreira, Fernando. editor. SpringerLink (Online service)
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https://doi.org/10.1007/978-981-96-9231-6
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Cover image for Signal Processing, Telecommunication & Embedded Systems: AI and ML Applications Proceedings of Ninth International Conference on Microelectronics Electromagnetics and Telecommunications (ICMEET 2024), Volume 3
Signal Processing, Telecommunication & Embedded Systems: AI and ML Applications Proceedings of Ninth International Conference on Microelectronics Electromagnetics and Telecommunications (ICMEET 2024), Volume 3
Author 
Bhateja, Vikrant. editor. Omar, Zaid. editor. Ghosh, Anumoy. editor. (orcid)0000-0003-4865-5893 Shrivastava, Sarika. editor. SpringerLink (Online service)
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https://doi.org/10.1007/978-981-96-7249-3
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7. 
Cover image for A Problem-Solving Approach to Electric Circuits Volume I
A Problem-Solving Approach to Electric Circuits Volume I
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Asadi, Farzin. author. SpringerLink (Online service)
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https://doi.org/10.1007/978-3-031-95623-2
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8. 
Cover image for Next-generation electrochromic devices : from multifunctional materials to smart glasses
Next-generation electrochromic devices : from multifunctional materials to smart glasses
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Cossari, Pierluigi, author.
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TA1750 .C67 2025
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https://onlinelibrary.wiley.com/doi/book/10.1002/9783527832583
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9. 
Cover image for Parameter estimation of permanent magnet synchronous machines
Parameter estimation of permanent magnet synchronous machines
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Zhu, Ziqiang, Ph. D., author. Liu, Kan (Dean), author. Liang, Dawei (Research associate), author.
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QA276.8 .Z48 2025 EB
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https://onlinelibrary.wiley.com/doi/book/10.1002/9781394280452
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10. 
Cover image for Single element semiconductors : properties and devices
Single element semiconductors : properties and devices
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Shi, Yi (Electrical engineer), author. Yan, Shancheng, author.
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TK7871.85 .S55 2025
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https://onlinelibrary.wiley.com/doi/book/10.1002/9783527851782
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11. 
Cover image for A Problem-Solving Approach to Electric Circuits Volume II
A Problem-Solving Approach to Electric Circuits Volume II
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Asadi, Farzin. author. SpringerLink (Online service)
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https://doi.org/10.1007/978-3-031-95634-8
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12. 
Cover image for Alternating Current Field Measurement Technique for Detection and Measurement of Cracks in Structures
Alternating Current Field Measurement Technique for Detection and Measurement of Cracks in Structures
Author 
Li, Wei. author. Yuan, Xin'an. author. Zhao, Jianming. author. Yin, Xiaokang. author. Li, Xiao. author.
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https://doi.org/10.1007/978-981-97-7255-1
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