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1. 
Cover image for Laser isotope separation in atomic vapor
Laser isotope separation in atomic vapor
Author 
Bokhan, P. A. John Wiley & Sons.
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ONLINE
Electronic Access 
John Wiley http://dx.doi.org/10.1002/352760894X
http://www3.interscience.wiley.com/cgi-bin/bookhome/112750139
Ebook Library http://public.eblib.com/EBLPublic/PublicView.do?ptiID=481310
http://www3.interscience.wiley.com/cgi-bin/homepage/?isbn=9783527608942
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2. 
Cover image for Cyclodextrins and their complexes chemistry, analytical methods, applications
Cyclodextrins and their complexes chemistry, analytical methods, applications
Author 
Dodziuk, Helena. John Wiley & Sons.
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ONLINE
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John Wiley http://dx.doi.org/10.1002/3527608982
http://www3.interscience.wiley.com/cgi-bin/bookhome/112750133
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3. 
Cover image for Miniplant-Technik in der Prozessindustrie
Miniplant-Technik in der Prozessindustrie
Author 
Deibele, Ludwig. Dohrn, Ralf. John Wiley & Sons.
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ONLINE
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John Wiley http://dx.doi.org/10.1002/3527609024
http://site.ebrary.com/lib/alltitles/Doc?id=10538643
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4. 
Cover image for FTTX concepts and applications
FTTX concepts and applications
Author 
Keiser, Gerd. John Wiley & Sons.
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ONLINE
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IEEE Xplore http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5237822
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5. 
Cover image for Software measurement and estimation a practical approach
Software measurement and estimation a practical approach
Author 
Laird, Linda M., 1952- Brennan, M. Carol, 1954- IEEE Computer Society. John Wiley & Sons.
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IEEE Xplore http://ieeexplore.ieee.org/servlet/opac?bknumber=5988896
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6. 
Cover image for The cognitive dynamics of computer science cost-effective large scale software development
The cognitive dynamics of computer science cost-effective large scale software development
Author 
De Gyurky, Szabolcs Michael. Tarbell, Mark A. John Wiley & Sons.
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IEEE Xplore http://ieeexplore.ieee.org/servlet/opac?bknumber=5201429
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7. 
Cover image for Contamination and ESD control in high technology manufacturing
Contamination and ESD control in high technology manufacturing
Author 
Welker, R. W. Nagarajan, R. (Ramamurthy) Newberg, Carl E. John Wiley & Sons.
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IEEE Xplore http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5201423
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8. 
Cover image for Math refresher for scientists and engineers
Math refresher for scientists and engineers
Author 
Fanchi, John R. John Wiley & Sons.
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IEEE Xplore http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5237539
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9. 
Cover image for Research and development in the chemical and pharmaceutical industry
Research and development in the chemical and pharmaceutical industry
Author 
Bamfield, P. (Peter) John Wiley & Sons.
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John Wiley http://dx.doi.org/10.1002/3527608834
http://www3.interscience.wiley.com/cgi-bin/bookhome/112729041
Ebook Library http://public.eblib.com/EBLPublic/PublicView.do?ptiID=481912
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10. 
Cover image for Kunststoffe Synthese, Herstellungsverfahren, Apparaturen
Kunststoffe Synthese, Herstellungsverfahren, Apparaturen
Author 
Keim, Wilhelm. John Wiley & Sons.
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ONLINE
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http://www3.interscience.wiley.com/cgi-bin/browsebyproduct?type=2
John Wiley http://dx.doi.org/10.1002/3527608974
Volltext http://onlinelibrary.wiley.com/book/10.1002/3527608974
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11. 
Cover image for Photophysics of molecular materials from single molecules to single crystals
Photophysics of molecular materials from single molecules to single crystals
Author 
Lanzani, Guglielmo. John Wiley & Sons.
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John Wiley http://dx.doi.org/10.1002/3527607323
http://www3.interscience.wiley.com/cgi-bin/bookhome/112534692
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12. 
Cover image for NMR imaging in chemical engineering
NMR imaging in chemical engineering
Author 
Stapf, Siegfried. Han, Song-I, 1972- John Wiley & Sons.
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John Wiley http://dx.doi.org/10.1002/3527607560
http://www3.interscience.wiley.com/cgi-bin/bookhome/112592316
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