Limit Search Results
Author
SpringerLink (Online service)
(31)
Yadav, Sanjay. editor.
(3)
Collège français de métrologie.
(2)
Gåsvik, Kjell J.
(2)
John Wiley & Sons.
(2)
Language
Publication Date
-
Subject
Metrology.
(12)
Engineering.
(8)
Electronic books.
(7)
Machinery.
(6)
Nanotechnology.
(6)
Material Type
Shelf Location
Library
Switch to list view
Switch to thumbnail view
72 Results Found Subscribe to search results
000000000000DEFAULT
Print
37. 
Cover image for A practical guide to optical metrology for thin films
A practical guide to optical metrology for thin films
Author 
Quinten, Michael.
Preferred Shelf Number 
ONLINE
Electronic Access 
Check for Full Text Access restricted: MSVU users only
Ebook Library Click here to view book
Connect to MyiLibrary resource.
John Wiley http://dx.doi.org/10.1002/9783527664344
Format: 
Availability 
Online Library~1
Available:
Copies:
38. 
Cover image for Optical Measurements, Modeling, and Metrology, Volume 5 Proceedings of the 2011 Annual Conference on Experimental and Applied Mechanics
Optical Measurements, Modeling, and Metrology, Volume 5 Proceedings of the 2011 Annual Conference on Experimental and Applied Mechanics
Author 
Proulx, Tom. editor. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE
Electronic Access 
http://dx.doi.org/10.1007/978-1-4614-0228-2
Format: 
Availability 
Online Library~1
Available:
Copies:
39. 
Cover image for The Physics of Metrology All about Instruments: From Trundle Wheels to Atomic Clocks
The Physics of Metrology All about Instruments: From Trundle Wheels to Atomic Clocks
Author 
Hebra, Alexius J. author. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE
Electronic Access 
http://dx.doi.org/10.1007/978-3-211-78381-8
Format: 
Availability 
Online Library~1
Available:
Copies:
40. 
Cover image for Fringe 2009 6th International Workshop on Advanced Optical Metrology
Fringe 2009 6th International Workshop on Advanced Optical Metrology
Author 
Osten, Wolfgang. editor. Kujawinska, Malgorzata. editor. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE
Electronic Access 
http://dx.doi.org/10.1007/978-3-642-03051-2
Format: 
Availability 
Online Library~1
Available:
Copies:
41. 
Cover image for Data Modeling for Metrology and Testing in Measurement Science
Data Modeling for Metrology and Testing in Measurement Science
Author 
Pavese, Franco. editor. Forbes, Alistair B. editor. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE
Electronic Access 
http://dx.doi.org/10.1007/978-0-8176-4804-6
Format: 
Availability 
Online Library~1
Available:
Copies:
42. 
Cover image for Quality Assurance for Chemistry and Environmental Science Metrology from pH Measurement to Nuclear Waste Disposal
Quality Assurance for Chemistry and Environmental Science Metrology from pH Measurement to Nuclear Waste Disposal
Author 
Meinrath, G. author. Schneider, Petra. author. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE
Electronic Access 
http://dx.doi.org/10.1007/978-3-540-71273-2
Format: 
Availability 
Online Library~1
Available:
Copies:
43. 
Cover image for Microwave Circuit Theory and Foundations of Microwave Metrology
Microwave Circuit Theory and Foundations of Microwave Metrology
Author 
Engen, Glenn F.
Preferred Shelf Number 
ONLINE
Electronic Access 
http://dx.doi.org/10.1049/PBEL009E
Format: 
Availability 
Online Library~1
Available:
Copies:
44. 
Cover image for Handbook of surface and nanometrology
Handbook of surface and nanometrology
Author 
Whitehouse, D. J. (David J.) Whitehouse, D. J. (David J.). Handbook of surface metrology.
Preferred Shelf Number 
ONLINE
Electronic Access 
Distributed by publisher. Purchase or institutional license may be required for access.
Format: 
Availability 
Online Library~1
Available:
Copies:
45. 
Cover image for Handbook of surface and nanometrology
Handbook of surface and nanometrology
Author 
Whitehouse, D. J. (David J.) Whitehouse, D. J. (David J.). Handbook of surface metrology.
Preferred Shelf Number 
ONLINE
Electronic Access 
Distributed by publisher. Purchase or institutional license may be required for access.
Format: 
Availability 
Online Library~1
Available:
Copies:
46. 
Cover image for Clinical and Laboratory Medicine Textbook
Clinical and Laboratory Medicine Textbook
Author 
Ciaccio, Marcello. editor. SpringerLink (Online service)
Preferred Shelf Number 
XX(522249.1)
Electronic Access 
https://doi.org/10.1007/978-3-031-24958-7
Format: 
Availability 
Online Library~1
Available:
Copies:
47. 
Cover image for Proceedings of CASICAM 2022
Proceedings of CASICAM 2022
Author 
Zarbane, Khalid. editor. Beidouri, Zitouni. editor. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE
Electronic Access 
https://doi.org/10.1007/978-3-031-32927-2
Format: 
Availability 
Online Library~1
Available:
Copies:
48. 
Cover image for Advances in Integrated Design and Production II Proceedings of the 12th International Conference on Integrated Design and Production, CPI 2022, May 10-12, 2022, ENSAM, Rabat, Morocco
Advances in Integrated Design and Production II Proceedings of the 12th International Conference on Integrated Design and Production, CPI 2022, May 10-12, 2022, ENSAM, Rabat, Morocco
Author 
Azrar, Lahcen. editor. Jalid, Abdelilah. editor. Lamouri, Samir. editor. Siadat, Ali. editor. Taha Janan, Mourad. editor.
Preferred Shelf Number 
ONLINE
Electronic Access 
https://doi.org/10.1007/978-3-031-23615-0
Format: 
Availability 
Online Library~1
Available:
Copies:
Go to:Search Results
|
Top of Page
|
Search Facets