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37. 
Cover image for Finite mixture models
Finite mixture models
Author 
McLachlan, Geoffrey J., 1946- Peel, David, 1971- John Wiley & Sons.
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John Wiley http://dx.doi.org/10.1002/0471721182
http://www3.interscience.wiley.com/cgi-bin/bookhome/109856105
Contributor biographical information http://catdir.loc.gov/catdir/bios/wiley043/00043324.html
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38. 
Cover image for Protein sequencing and identification using tandem mass spectrometry
Protein sequencing and identification using tandem mass spectrometry
Author 
Kinter, Michael. Sherman, Nicholas E. John Wiley & Sons.
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John Wiley http://dx.doi.org/10.1002/0471721980
Contributor biographical information http://catdir.loc.gov/catdir/bios/wiley043/00038204.html
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39. 
Cover image for Applied logistic regression
Applied logistic regression
Author 
Hosmer, David W. Lemeshow, Stanley. John Wiley & Sons.
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John Wiley http://dx.doi.org/10.1002/0471722146
http://www3.interscience.wiley.com/cgi-bin/bookhome/109855848
Contributor biographical information http://catdir.loc.gov/catdir/bios/wiley042/00036843.html
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40. 
Cover image for The probabilistic method
The probabilistic method
Author 
Alon, Noga. Spencer, Joel H. John Wiley & Sons.
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John Wiley http://dx.doi.org/10.1002/0471722154
http://www3.interscience.wiley.com/cgi-bin/bookhome/109790495
Contributor biographical information http://catdir.loc.gov/catdir/bios/wiley045/00033011.html
ebrary http://site.ebrary.com/id/10275086
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41. 
Cover image for Frequency selective surfaces theory and design
Frequency selective surfaces theory and design
Author 
Munk, Ben (Benedikt A.) John Wiley & Sons.
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Ebook Library http://public.eblib.com/EBLPublic/PublicView.do?ptiID=226559
John Wiley http://dx.doi.org/10.1002/0471723770
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42. 
Cover image for Statistical methods in analytical chemistry
Statistical methods in analytical chemistry
Author 
Meier, Peter C., 1945- Zünd, Richard E. John Wiley & Sons, Inc.
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e-book
Wiley InterScience An electronic book accessible through the World Wide Web; click for information
Ebook Library http://public.eblib.com/EBLPublic/PublicView.do?ptiID=226443
Contributor biographical information http://catdir.loc.gov/catdir/bios/wiley041/99025291.html
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43. 
Cover image for Random graphs
Random graphs
Author 
Janson, Svante. Łuczak, Tomasz, 1963- Ruciński, Andrzej. Wiley InterScience (Online service)
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ONLINE
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Wiley InterScience An electronic book accessible through the World Wide Web; click for information
Ebook Library Click here to view book
Contributor biographical information http://catdir.loc.gov/catdir/bios/wiley041/99089121.html
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44. 
Cover image for Applied functional analysis
Applied functional analysis
Author 
Aubin, Jean Pierre.
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Wiley InterScience An electronic book accessible through the World Wide Web; click for information
Ebook Library Click here to view book
Contributor biographical information http://catdir.loc.gov/catdir/bios/wiley041/99015355.html
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45. 
Cover image for A posteriori error estimation in finite element analysis
A posteriori error estimation in finite element analysis
Author 
Ainsworth, Mark, 1965- Oden, J. Tinsley (John Tinsley), 1936- Wiley InterScience (Online service)
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ONLINE
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Wiley InterScience An electronic book accessible through the World Wide Web; click for information
Contributor biographical information http://catdir.loc.gov/catdir/bios/wiley043/00039915.html
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46. 
Cover image for Semiconducting polymers chemistry, physics, and engineering
Semiconducting polymers chemistry, physics, and engineering
Author 
Hadziioannou, Georges. Hutten, Paul F. van.
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http://www3.interscience.wiley.com/cgi-bin/homepage/?isbn=3527602186
John Wiley http://dx.doi.org/10.1002/3527602186
Contributor biographical information http://catdir.loc.gov/catdir/enhancements/fy0704/2001316008-b.html
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47. 
Cover image for Comprehensive mass metrology
Comprehensive mass metrology
Author 
Kochsiek, Manfred. Gläser, Michael, 1942- John Wiley & Sons.
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HathiTrust Digital Library, Limited view (search only) http://catalog.hathitrust.org/api/volumes/oclc/43419333.html
John Wiley http://dx.doi.org/10.1002/3527602992
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48. 
Cover image for Computer simulation of materials at atomic level
Computer simulation of materials at atomic level
Author 
Deák, Péter. Frauenheim, Thomas. Pederson, Mark Roger. John Wiley & Sons.
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John Wiley http://dx.doi.org/10.1002/3527603107
HathiTrust Digital Library Limited view (search only) http://catalog.hathitrust.org/api/volumes/oclc/43069165.html
MyiLibrary, Table of contents http://www.myilibrary.com?id=55955&ref=toc
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