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37. 
Cover image for X-ray metrology in semiconductor manufacturing
X-ray metrology in semiconductor manufacturing
Author 
Bowen, D. Keith (David Keith), 1940- author. Tanner, B. K. (Brian Keith)
Preferred Shelf Number 
TK7874.58 .B69 2006
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38. 
Cover image for DNA microarrays and related genomics techniques : designs, analysis, and interpretation of experiments
DNA microarrays and related genomics techniques : designs, analysis, and interpretation of experiments
Author 
Allison, David B. (David Bradley), 1963-
Preferred Shelf Number 
QP624.5 .D726 D636 2006
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39. 
Cover image for Pharmaceutical Chemical Analysis : Methods for Identification and Limit Tests
Pharmaceutical Chemical Analysis : Methods for Identification and Limit Tests
Author 
Pedersen, Ole, author. Taylor and Francis.
Preferred Shelf Number 
RS189
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40. 
Cover image for The handbook of manufacturing engineering. Factory operations : planning and instructional methods
The handbook of manufacturing engineering. Factory operations : planning and instructional methods
Author 
Crowson, Richard.
Preferred Shelf Number 
TS183 .H3594 2006
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41. 
Cover image for A practical guide to quality management in clinical trial research
A practical guide to quality management in clinical trial research
Author 
Ogg, Graham D., author.
Preferred Shelf Number 
R853 .C55 O344 2006
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