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37. 
Cover image for Projected Capacitive Touch A Practical Guide for Engineers
Projected Capacitive Touch A Practical Guide for Engineers
Author 
Gray, Tony. author. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE
Electronic Access 
https://doi.org/10.1007/978-3-319-98392-9
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38. 
Cover image for VLSI Design and Test for Systems Dependability
VLSI Design and Test for Systems Dependability
Author 
Asai, Shojiro. editor. SpringerLink (Online service)
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https://doi.org/10.1007/978-4-431-56594-9
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39. 
Cover image for Managing More-than-Moore Integration Technology Development A Story of an Advanced Technology Program in the Semiconductor Industry
Managing More-than-Moore Integration Technology Development A Story of an Advanced Technology Program in the Semiconductor Industry
Author 
Radojcic, Riko. author. SpringerLink (Online service)
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https://doi.org/10.1007/978-3-319-92701-5
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40. 
Cover image for Electronically Scanned Arrays (ESAs) and K-Space Gain Formulation
Electronically Scanned Arrays (ESAs) and K-Space Gain Formulation
Author 
Dana, Roger A. author. SpringerLink (Online service)
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https://doi.org/10.1007/978-3-030-04678-1
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41. 
Cover image for Fundamentals of Power Semiconductor Devices
Fundamentals of Power Semiconductor Devices
Author 
Baliga, B. Jayant. author. SpringerLink (Online service)
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https://doi.org/10.1007/978-3-319-93988-9
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42. 
Cover image for Theory of Power Matching
Theory of Power Matching
Author 
Ladvánszky, János. author. SpringerLink (Online service)
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https://doi.org/10.1007/978-3-030-16631-1
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43. 
Cover image for Quick Start Guide to VHDL
Quick Start Guide to VHDL
Author 
LaMeres, Brock J. author. SpringerLink (Online service)
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https://doi.org/10.1007/978-3-030-04516-6
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44. 
Cover image for Microwave Active Devices and Circuits for Communication
Microwave Active Devices and Circuits for Communication
Author 
Bera, Subhash Chandra. author. SpringerLink (Online service)
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https://doi.org/10.1007/978-981-13-3004-9
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45. 
Cover image for Multi-run Memory Tests for Pattern Sensitive Faults
Multi-run Memory Tests for Pattern Sensitive Faults
Author 
Mrozek, Ireneusz. author. SpringerLink (Online service)
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https://doi.org/10.1007/978-3-319-91204-2
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46. 
Cover image for Introduction to Logic Circuits & Logic Design with VHDL
Introduction to Logic Circuits & Logic Design with VHDL
Author 
LaMeres, Brock J. author. SpringerLink (Online service)
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https://doi.org/10.1007/978-3-030-12489-2
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47. 
Cover image for CMOS-Compatible Key Engineering Devices for High-Speed Silicon-Based Optical Interconnections
CMOS-Compatible Key Engineering Devices for High-Speed Silicon-Based Optical Interconnections
Author 
Wang, Jing. author. SpringerLink (Online service)
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https://doi.org/10.1007/978-981-13-3378-1
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48. 
Cover image for Fundamentals of Computer Architecture and Design
Fundamentals of Computer Architecture and Design
Author 
Bindal, Ahmet. author. SpringerLink (Online service)
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https://doi.org/10.1007/978-3-030-00223-7
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