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37. 
Cover image for Computing with Memory for Energy-Efficient Robust Systems
Computing with Memory for Energy-Efficient Robust Systems
Author 
Paul, Somnath. author. Bhunia, Swarup. author. SpringerLink (Online service)
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ONLINE
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https://doi.org/10.1007/978-1-4614-7798-3
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38. 
Cover image for EMI-Resilient Amplifier Circuits
EMI-Resilient Amplifier Circuits
Author 
van der Horst, Marcel J. author. Serdijn, Wouter A. author. Linnenbank, André C. author. SpringerLink (Online service)
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https://doi.org/10.1007/978-3-319-00593-5
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39. 
Cover image for Linear CMOS RF Power Amplifiers A Complete Design Workflow
Linear CMOS RF Power Amplifiers A Complete Design Workflow
Author 
Solar Ruiz, Hector. author. Berenguer Pérez, Roc. author. SpringerLink (Online service)
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https://doi.org/10.1007/978-1-4614-8657-2
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40. 
Cover image for Ultra-Low Power Integrated Circuit Design Circuits, Systems, and Applications
Ultra-Low Power Integrated Circuit Design Circuits, Systems, and Applications
Author 
Tan, Nianxiong Nick. editor. Li, Dongmei. editor. Wang, Zhihua. editor. SpringerLink (Online service)
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https://doi.org/10.1007/978-1-4419-9973-3
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41. 
Cover image for Nanowire Field Effect Transistors: Principles and Applications
Nanowire Field Effect Transistors: Principles and Applications
Author 
Kim, Dae Mann. editor. Jeong, Yoon-Ha. editor. SpringerLink (Online service)
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https://doi.org/10.1007/978-1-4614-8124-9
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42. 
Cover image for Analog Filters in Nanometer CMOS
Analog Filters in Nanometer CMOS
Author 
Uhrmann, Heimo. author. Kolm, Robert. author. Zimmermann, Horst. author. SpringerLink (Online service)
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https://doi.org/10.1007/978-3-642-38013-6
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43. 
Cover image for Continuous-Time Digital Front-Ends for Multistandard Wireless Transmission
Continuous-Time Digital Front-Ends for Multistandard Wireless Transmission
Author 
Nuyts, Pieter A. J. author. Reynaert, Patrick. author. Dehaene, Wim. author. SpringerLink (Online service)
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https://doi.org/10.1007/978-3-319-03925-1
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44. 
Cover image for Hybrid Fault Tolerance Techniques to Detect Transient Faults in Embedded Processors
Hybrid Fault Tolerance Techniques to Detect Transient Faults in Embedded Processors
Author 
Azambuja, José Rodrigo. author. Kastensmidt, Fernanda. author. Becker, Jürgen. author. SpringerLink (Online service)
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https://doi.org/10.1007/978-3-319-06340-9
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45. 
Cover image for Design for Manufacturability From 1D to 4D for 90–22 nm Technology Nodes
Design for Manufacturability From 1D to 4D for 90–22 nm Technology Nodes
Author 
Balasinski, Artur. author. SpringerLink (Online service)
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https://doi.org/10.1007/978-1-4614-1761-3
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46. 
Cover image for High-Bandwidth Memory Interface
High-Bandwidth Memory Interface
Author 
Kim, Chulwoo. author. Lee, Hyun-Woo. author. Song, Junyoung. author. SpringerLink (Online service)
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https://doi.org/10.1007/978-3-319-02381-6
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47. 
Cover image for Advanced Symbolic Analysis for VLSI Systems Methods and Applications
Advanced Symbolic Analysis for VLSI Systems Methods and Applications
Author 
Shi, Guoyong. author. Tan, Sheldon X.-D. author. Tlelo Cuautle, Esteban. author. SpringerLink (Online service)
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https://doi.org/10.1007/978-1-4939-1103-5
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48. 
Cover image for Synthesis and Optimization of FPGA-Based Systems
Synthesis and Optimization of FPGA-Based Systems
Author 
Sklyarov, Valery. author. Skliarova, Iouliia. author. Barkalov, Alexander. author. Titarenko, Larysa. author. SpringerLink (Online service)
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https://doi.org/10.1007/978-3-319-04708-9
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