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37. 
Cover image for High-productivity drilling tools. Materials, metrology, and failure analysis
High-productivity drilling tools. Materials, metrology, and failure analysis
Author 
Astakhov, Viktor P., author.
Preferred Shelf Number 
TJ1260
Electronic Access 
Taylor & Francis https://www.taylorfrancis.com/books/9781003263319
OCLC metadata license agreement http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf
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38. 
Cover image for Recent Advances in Metrology Select Proceedings of AdMet 2022
Recent Advances in Metrology Select Proceedings of AdMet 2022
Author 
Yadav, Sanjay. editor. (orcid)0000-0002-1450-3202 Garg, Naveen. editor. Aggarwal, Shankar G. editor. (orcid)0000-0002-5809-157X Jaiswal, Shiv Kumar. editor. Kumar, Harish. editor.
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ONLINE
Electronic Access 
https://doi.org/10.1007/978-981-99-4594-8
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39. 
Cover image for Recent Advances in Metrology Select Proceedings of AdMet 2021
Recent Advances in Metrology Select Proceedings of AdMet 2021
Author 
Yadav, Sanjay. editor. Chaudhary, K.P. editor. Gahlot, Ajay. editor. Arya, Yogendra. editor. Dahiya, Aman. editor.
Preferred Shelf Number 
ONLINE
Electronic Access 
https://doi.org/10.1007/978-981-19-2468-2
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40. 
Cover image for The economics and science of measurement : a study of metrology
The economics and science of measurement : a study of metrology
Author 
Link, Albert N., author.
Preferred Shelf Number 
QC91
Electronic Access 
Taylor & Francis https://www.taylorfrancis.com/books/9781003186953
OCLC metadata license agreement http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf
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41. 
Cover image for Metrology and instrumentation : practical applications for engineering and manufacturing
Metrology and instrumentation : practical applications for engineering and manufacturing
Author 
Mekid, Samir, author.
Preferred Shelf Number 
QC88 .M38 2022
Electronic Access 
https://onlinelibrary.wiley.com/doi/book/10.1002/9781119721789
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42. 
Cover image for Modern characterization of electromagnetic systems and its associated metrology
Modern characterization of electromagnetic systems and its associated metrology
Author 
Sarkar, Tapan (Tapan K.), editor. Salazar-Palma, Magdalena, editor. Zhu, Ming Da, editor. Chen, Heng, 1990- editor.
Preferred Shelf Number 
QC760 .M53 2021
Electronic Access 
https://onlinelibrary.wiley.com/doi/book/10.1002/9781119076230
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43. 
Cover image for Handbook of Laser Technology and Applications Laser Applications: Medical, Metrology and Communication. (Volume Four)
Handbook of Laser Technology and Applications Laser Applications: Medical, Metrology and Communication. (Volume Four)
Author 
Guo, Chunlei, editor. Singh, Subhash Chandra (Writer on technology), editor.
Preferred Shelf Number 
TK7871.3
Electronic Access 
Taylor & Francis https://www.taylorfrancis.com/books/9781003130123
OCLC metadata license agreement http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf
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44. 
Cover image for Applications and metrology at nanometer scale. 1, Smart materials, electromagnetic waves and uncertainties
Applications and metrology at nanometer scale. 1, Smart materials, electromagnetic waves and uncertainties
Author 
Dahoo, Pierre Richard. Pougnet, Philippe. El Hami, Abdelkhalak.
Preferred Shelf Number 
QC88
Electronic Access 
https://onlinelibrary.wiley.com/doi/book/10.1002/9781119808244
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45. 
Cover image for Applications and metrology at nanometer scale. 2, Measurement systems, quantum engineering and RBDO method
Applications and metrology at nanometer scale. 2, Measurement systems, quantum engineering and RBDO method
Author 
Dahoo, Pierre Richard, author. Pougnet, Philippe, author. El Hami, Abdelkhalak, author.
Preferred Shelf Number 
QC88
Electronic Access 
https://onlinelibrary.wiley.com/doi/book/10.1002/9781119818984
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46. 
Cover image for The new International System of Units (SI) : quantum metrology and quantum standards
The new International System of Units (SI) : quantum metrology and quantum standards
Author 
Göbel, Ernst O., author. Siegner, Uwe, author.
Preferred Shelf Number 
QC91 .G63 2019
Electronic Access 
https://onlinelibrary.wiley.com/doi/book/10.1002/9783527814480
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47. 
Cover image for Advances in Manufacturing II Volume 5 - Metrology and Measurement Systems
Advances in Manufacturing II Volume 5 - Metrology and Measurement Systems
Author 
Diering, Magdalena. editor. Wieczorowski, Michał. editor. Brown, Christopher A. editor. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE
Electronic Access 
https://doi.org/10.1007/978-3-030-18682-1
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48. 
Cover image for Metrology and standardization of nanotechnology : protocols and industrial innovations
Metrology and standardization of nanotechnology : protocols and industrial innovations
Author 
Mansfield, Elisabeth, (Research chemist), editor. Kaiser, Debra L., editor. Fujita, Daisuke (Materials scientist), editor. Voorde, M. H. van de (Marcel H.), editor.
Preferred Shelf Number 
T174.7
Electronic Access 
https://onlinelibrary.wiley.com/doi/book/10.1002/9783527800308
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