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37. 
Cover image for Applications and metrology at nanometer scale. 2, Measurement systems, quantum engineering and RBDO method
Applications and metrology at nanometer scale. 2, Measurement systems, quantum engineering and RBDO method
Author 
Dahoo, Pierre Richard, author. Pougnet, Philippe, author. El Hami, Abdelkhalak, author.
Preferred Shelf Number 
QC88
Electronic Access 
https://onlinelibrary.wiley.com/doi/book/10.1002/9781119818984
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38. 
Cover image for Handbook of Laser Technology and Applications Laser Applications: Medical, Metrology and Communication. (Volume Four)
Handbook of Laser Technology and Applications Laser Applications: Medical, Metrology and Communication. (Volume Four)
Author 
Guo, Chunlei, editor. Singh, Subhash Chandra (Writer on technology), editor.
Preferred Shelf Number 
TK7871.3
Electronic Access 
Taylor & Francis https://www.taylorfrancis.com/books/9781003130123
OCLC metadata license agreement http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf
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39. 
Cover image for Applications and metrology at nanometer scale. 1, Smart materials, electromagnetic waves and uncertainties
Applications and metrology at nanometer scale. 1, Smart materials, electromagnetic waves and uncertainties
Author 
Dahoo, Pierre Richard. Pougnet, Philippe. El Hami, Abdelkhalak.
Preferred Shelf Number 
QC88
Electronic Access 
https://onlinelibrary.wiley.com/doi/book/10.1002/9781119808244
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40. 
Cover image for Advances in Manufacturing II Volume 5 - Metrology and Measurement Systems
Advances in Manufacturing II Volume 5 - Metrology and Measurement Systems
Author 
Diering, Magdalena. editor. Wieczorowski, Michał. editor. Brown, Christopher A. editor. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE
Electronic Access 
https://doi.org/10.1007/978-3-030-18682-1
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41. 
Cover image for The new International System of Units (SI) : quantum metrology and quantum standards
The new International System of Units (SI) : quantum metrology and quantum standards
Author 
Göbel, Ernst O., author. Siegner, Uwe, author.
Preferred Shelf Number 
QC91 .G63 2019
Electronic Access 
https://onlinelibrary.wiley.com/doi/book/10.1002/9783527814480
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42. 
Cover image for Metrology and standardization of nanotechnology : protocols and industrial innovations
Metrology and standardization of nanotechnology : protocols and industrial innovations
Author 
Mansfield, Elisabeth, editor. Kaiser, Debra L., editor. Fujita, Daisuke, editor. Voorde, M. H. van de (Marcel H.), editor.
Preferred Shelf Number 
ONLINE
Electronic Access 
Wiley Online Library
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43. 
Cover image for Metrology and standardization of nanotechnology : protocols and industrial innovations
Metrology and standardization of nanotechnology : protocols and industrial innovations
Author 
Mansfield, Elisabeth, (Research chemist), editor. Kaiser, Debra L., editor. Fujita, Daisuke (Materials scientist), editor. Voorde, M. H. van de (Marcel H.), editor.
Preferred Shelf Number 
T174.7
Electronic Access 
https://onlinelibrary.wiley.com/doi/book/10.1002/9783527800308
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44. 
Cover image for Forensic metrology : scientific measurement and inference for lawyers, judges and criminalists
Forensic metrology : scientific measurement and inference for lawyers, judges and criminalists
Author 
Vosk, Ted, author. Emery, A. F. (Ashley Francis), 1934- author.
Preferred Shelf Number 
HV8073.5 .V67 2015
Electronic Access 
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45. 
Cover image for Fringe 2013 7th International Workshop on Advanced Optical Imaging and Metrology
Fringe 2013 7th International Workshop on Advanced Optical Imaging and Metrology
Author 
Osten, Wolfgang. editor. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE
Electronic Access 
https://doi.org/10.1007/978-3-642-36359-7
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46. 
Cover image for Fringe pattern analysis for optical metrology : theory, algorithms, and applications
Fringe pattern analysis for optical metrology : theory, algorithms, and applications
Author 
Servín, Manuel, author. Quiroga, J. Antonio (Juan Antonio), author. Padilla, J. Moisés (José Moisés), author.
Preferred Shelf Number 
ONLINE(342225.1)
Electronic Access 
Ebook Library http://public.eblib.com/choice/publicfullrecord.aspx?p=1701414
ebrary http://site.ebrary.com/id/10881255
John Wiley http://dx.doi.org/10.1002/9783527681075
MyiLibrary http://www.myilibrary.com?id=615339
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47. 
Cover image for Handbook of 3D machine vision : optical metrology and imaging
Handbook of 3D machine vision : optical metrology and imaging
Author 
Song, Zhang.
Preferred Shelf Number 
TK8315 .H36 2013
Electronic Access 
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48. 
Cover image for Laser metrology in fluid mechanics granulometry, temperature and concentration measurements
Laser metrology in fluid mechanics granulometry, temperature and concentration measurements
Author 
Boutier, A. (Alain)
Preferred Shelf Number 
ONLINE
Electronic Access 
Ebook Library Click here to view book
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Wiley http://onlinelibrary.wiley.com/book/10.1002/9781118576847
John Wiley http://dx.doi.org/10.1002/9781118576847
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