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Symposium D on Diagnostic Techniques for Semiconductor Materials Analysis and Fabrication Process Control (1992 : Strasbourg, France) Crean, G. M. Stuck, R. Woollam, John A. European Materials Research Society.
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Karwowski, Waldemar. editor. Trzcielinski, Stefan. editor. Mrugalska, Beata. editor. Di Nicolantonio, Massimo. editor. Rossi, Emilio. editor.
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Papadopoulos, Athanasios I., 1977- editor. Seferlis, Panagiotis, 1967- editor.
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Shamey, R., author. Zhao, X., author.
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Lim, Yongseob. author. Venugopal, Ravinder. author. Ulsoy, A Galip. author. SpringerLink (Online service)
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Ge, Zhiqiang. author. Song, Zhihuan. author. SpringerLink (Online service)
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Gilani, Hossein G. Samper, Katia G. Haghi, Reza K.
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Liu, Tao. author. Gao, Furong. author. SpringerLink (Online service)
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Mannan, Sam.
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Krüger, Uwe, Dr. Xie, Lei (Professor of control engineering)
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John Wiley http://dx.doi.org/10.1002/9780470517253
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Baldea, Michael. Daoutidis, Prodromos .
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Christofides, Panagiotis D. author. Liu, Jinfeng. author. Muñoz de la Peña, David. author. SpringerLink (Online service)
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