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37. 
Cover image for Fundamentals and Principles of Electromagnetic Wave Absorbers From Theory, Design, and Materials to Measurement
Fundamentals and Principles of Electromagnetic Wave Absorbers From Theory, Design, and Materials to Measurement
Author 
Kim, Sung-Soo. author. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE
Electronic Access 
https://doi.org/10.1007/978-981-97-6477-8
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38. 
Cover image for Single-Photon Avalanche Diodes and Photon Counting Systems From Phototransduction to Circuit Architecture
Single-Photon Avalanche Diodes and Photon Counting Systems From Phototransduction to Circuit Architecture
Author 
Dandin, Marc. author. McFarlane, Nicole. author. Sajal, Md Sakibur. author. Dehghandehnavi, Fahimeh. author. Nouri, Babak. author.
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ONLINE
Electronic Access 
https://doi.org/10.1007/978-3-031-64334-7
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39. 
Cover image for PCM-CMM2023: Theories, Models and Simulations of Complex Physical Systems
PCM-CMM2023: Theories, Models and Simulations of Complex Physical Systems
Author 
Świtoński, Eugeniusz. editor. Mężyk, Arkadiusz. editor. Kciuk, Sławomir. editor. Szewczyk, Roman. editor. SpringerLink (Online service)
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https://doi.org/10.1007/978-3-031-73161-7
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40. 
Cover image for Modeling of AlGaN/GaN High Electron Mobility Transistors
Modeling of AlGaN/GaN High Electron Mobility Transistors
Author 
Nirmal, D. editor. Ajayan, J. editor. (orcid)0000-0002-2398-3690 SpringerLink (Online service)
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ONLINE
Electronic Access 
https://doi.org/10.1007/978-981-97-7506-4
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41. 
Cover image for CMOS Plasma and Process Damage
CMOS Plasma and Process Damage
Author 
Prall, Kirk. author. SpringerLink (Online service)
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Electronic Access 
https://doi.org/10.1007/978-3-031-89029-1
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42. 
Cover image for Halide perovskite semiconductors : structures, characterization, properties, and phenomena
Halide perovskite semiconductors : structures, characterization, properties, and phenomena
Author 
Zhou, Yuanyuan, editor. Mora-Sero, Ivan, editor.
Preferred Shelf Number 
TK7871.85
Electronic Access 
https://onlinelibrary.wiley.com/doi/book/10.1002/9783527829026
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43. 
Cover image for X-ray Photon Processing Detectors Space, Industrial, and Medical applications
X-ray Photon Processing Detectors Space, Industrial, and Medical applications
Author 
Hansson, Conny. editor. Iniewski, Krzysztof (Kris). editor. SpringerLink (Online service)
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https://doi.org/10.1007/978-3-031-35241-6
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44. 
Cover image for Proceedings of SIE 2023 54th Annual Meeting of the Italian Electronics Society
Proceedings of SIE 2023 54th Annual Meeting of the Italian Electronics Society
Author 
Ciofi, Carmine. editor. Limiti, Ernesto. editor. SpringerLink (Online service)
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https://doi.org/10.1007/978-3-031-48711-8
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45. 
Cover image for Design and Applications of Emerging Computer Systems
Design and Applications of Emerging Computer Systems
Author 
Liu, Weiqiang. editor. Han, Jie. editor. Lombardi, Fabrizio. editor. SpringerLink (Online service)
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https://doi.org/10.1007/978-3-031-42478-6
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46. 
Cover image for Silicon Components and Processes Self Study Rectifying and Ohmic Contacts, Bipolar Junction Transistors
Silicon Components and Processes Self Study Rectifying and Ohmic Contacts, Bipolar Junction Transistors
Author 
El-Kareh, Badih. author. Hutter, Lou N. author. SpringerLink (Online service)
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https://doi.org/10.1007/978-3-031-59189-1
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47. 
Cover image for Wide bandgap semiconductor spintronics
Wide bandgap semiconductor spintronics
Author 
Litvinov, Vladimir, author.
Preferred Shelf Number 
TK7874.887
Electronic Access 
Taylor & Francis https://www.taylorfrancis.com/books/9781003480228
OCLC metadata license agreement http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf
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48. 
Cover image for Hydrogels : fundamentals to advanced energy applications
Hydrogels : fundamentals to advanced energy applications
Author 
Kumar, Anuj (Chemical engineer), editor. Gupta, Ram K., editor.
Preferred Shelf Number 
QD549
Electronic Access 
Taylor & Francis https://www.taylorfrancis.com/books/9781003351566
OCLC metadata license agreement http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf
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