Limit Search Results
Author
SpringerLink (Online service)
(315)
Taylor and Francis.
(21)
Le, Tao.
(12)
Dulan, Steven W.
(10)
John Wiley & Sons, publisher.
(10)
Language
Publication Date
-
Subject
Electronic books.
(201)
Test-taking skills.
(103)
TECHNOLOGY & ENGINEERING.
(69)
Universities and colleges -- Entrance examinations -- Study guides.
(50)
SCIENCE.
(45)
Material Type
Shelf Location
Switch to list view
Switch to thumbnail view
Select an Action
1312 Results Found Subscribe to search results
000000000000DEFAULT
Print
1. 
Cover image for VLSI Design and Test for Systems Dependability
VLSI Design and Test for Systems Dependability
Author 
Asai, Shojiro. editor. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE
Electronic Access 
https://doi.org/10.1007/978-4-431-56594-9
Format: 
Availability 
Online Library~1
Available:
Copies:
2. 
Cover image for CMOS Test and Evaluation A Physical Perspective
CMOS Test and Evaluation A Physical Perspective
Author 
Bhushan, Manjul. author. Ketchen, Mark B. author. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE
Electronic Access 
https://doi.org/10.1007/978-1-4939-1349-7
Format: 
Availability 
Online Library~1
Available:
Copies:
3. 
Cover image for Nurses! Test Yourself In Non-Medical Prescribing
Nurses! Test Yourself In Non-Medical Prescribing
Author 
Harris, Noel. Shearer, Diane.
Preferred Shelf Number 
ONLINE
Electronic Access 
EBSCOhost http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=524783
Format: 
Availability 
Online Library~1
Available:
Copies:
4. 
Cover image for Test and Diagnosis for Small-Delay Defects
Test and Diagnosis for Small-Delay Defects
Author 
Tehranipoor, Mohammad. author. Peng, Ke. author. Chakrabarty, Krishnendu. author. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE
Electronic Access 
http://dx.doi.org/10.1007/978-1-4419-8297-1
Format: 
Availability 
Online Library~1
Available:
Copies:
5. 
Cover image for Advanced Bayesian methods for medical test accuracy
Advanced Bayesian methods for medical test accuracy
Author 
Broemeling, Lyle D., 1939, author.
Preferred Shelf Number 
RC71.3 .A38 2012
Electronic Access 
Click here to view.
Format: 
Availability 
Online Library~1
Available:
Copies:
6. 
Cover image for Advanced Bayesian methods for medical test accuracy
Advanced Bayesian methods for medical test accuracy
Author 
Broemeling, Lyle D., 1939, author.
Preferred Shelf Number 
RC71.3 .A38 2012
Electronic Access 
Click here to view.
Format: 
Availability 
Online Library~1
Available:
Copies:
7. 
Cover image for Design Driven Testing Test Smarter, Not Harder
Design Driven Testing Test Smarter, Not Harder
Author 
Stephens, Matt. author. Rosenberg, Doug. author. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE
Electronic Access 
http://dx.doi.org/10.1007/978-1-4302-2944-5
Format: 
Availability 
Online Library~1
Available:
Copies:
8. 
Cover image for Engineered concrete : mix design and test methods
Engineered concrete : mix design and test methods
Author 
Kett, Irving., author.
Preferred Shelf Number 
TA442.5 .K48 2010
Electronic Access 
Click here to view.
Format: 
Availability 
Online Library~1
Available:
Copies:
9. 
Cover image for Electronic design automation synthesis, verification, and test
Electronic design automation synthesis, verification, and test
Author 
Wang, Laung-Terng. Chang, Yao-Wen. Cheng, Kwang-Ting, 1961-
Preferred Shelf Number 
ONLINE
Electronic Access 
ScienceDirect http://www.sciencedirect.com/science/book/9780123743640
Format: 
Availability 
Online Library~1
Available:
Copies:
10. 
Cover image for Test Pattern Generation using Boolean Proof Engines
Test Pattern Generation using Boolean Proof Engines
Author 
Drechsler, Rolf. author. Eggersglüβ, Stephan. author. Fey, Görschwin. author. Tille, Daniel. author. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE
Electronic Access 
http://dx.doi.org/10.1007/978-90-481-2360-5
Format: 
Availability 
Online Library~1
Available:
Copies:
11. 
Cover image for Emerging Nanotechnologies Test, Defect Tolerance, and Reliability
Emerging Nanotechnologies Test, Defect Tolerance, and Reliability
Author 
Tehranipoor, Mohammad. editor. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE
Electronic Access 
http://dx.doi.org/10.1007/978-0-387-74747-7
Format: 
Availability 
Online Library~1
Available:
Copies:
12. 
Cover image for Statistical test theory for the behavioral sciences
Statistical test theory for the behavioral sciences
Author 
Gruijter, Dato N. de., author. Kamp, Leo J. Th. van der.
Preferred Shelf Number 
H61.25 .G78 2008
Electronic Access 
Click here to view.
Format: 
Availability 
Online Library~1
Available:
Copies:
Select an Action