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37. 
Cover image for Languages, Design Methods, and Tools for Electronic System Design Selected Contributions from FDL 2016
Languages, Design Methods, and Tools for Electronic System Design Selected Contributions from FDL 2016
Author 
Fummi, Franco. editor. Wille, Robert. editor. SpringerLink (Online service)
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ONLINE
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https://doi.org/10.1007/978-3-319-62920-9
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38. 
Cover image for Trusted Digital Circuits Hardware Trojan Vulnerabilities, Prevention and Detection
Trusted Digital Circuits Hardware Trojan Vulnerabilities, Prevention and Detection
Author 
Salmani, Hassan. author. SpringerLink (Online service)
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https://doi.org/10.1007/978-3-319-79081-7
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39. 
Cover image for Timing Performance of Nanometer Digital Circuits Under Process Variations
Timing Performance of Nanometer Digital Circuits Under Process Variations
Author 
Champac, Victor. author. Garcia Gervacio, Jose. author. SpringerLink (Online service)
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https://doi.org/10.1007/978-3-319-75465-9
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40. 
Cover image for Physically Unclonable Functions From Basic Design Principles to Advanced Hardware Security Applications
Physically Unclonable Functions From Basic Design Principles to Advanced Hardware Security Applications
Author 
Halak, Basel. author. SpringerLink (Online service)
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https://doi.org/10.1007/978-3-319-76804-5
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41. 
Cover image for Fault Tolerant Architectures for Cryptography and Hardware Security
Fault Tolerant Architectures for Cryptography and Hardware Security
Author 
PATRANABIS, SIKHAR. editor. Mukhopadhyay, Debdeep. editor. SpringerLink (Online service)
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https://doi.org/10.1007/978-981-10-1387-4
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42. 
Cover image for Advanced Techniques for Power, Energy, and Thermal Management for Clustered Manycores
Advanced Techniques for Power, Energy, and Thermal Management for Clustered Manycores
Author 
Pagani, Santiago. author. Chen, Jian-Jia. author. Shafique, Muhammad. author. Henkel, Jörg. author. SpringerLink (Online service)
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https://doi.org/10.1007/978-3-319-77479-4
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43. 
Cover image for Contactless VLSI Measurement and Testing Techniques
Contactless VLSI Measurement and Testing Techniques
Author 
Sayil, Selahattin. author. SpringerLink (Online service)
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https://doi.org/10.1007/978-3-319-69673-7
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44. 
Cover image for Automated Validation & Verification of UML/OCL Models Using Satisfiability Solvers
Automated Validation & Verification of UML/OCL Models Using Satisfiability Solvers
Author 
Przigoda, Nils. author. Wille, Robert. author. Przigoda, Judith. author. Drechsler, Rolf. author. SpringerLink (Online service)
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https://doi.org/10.1007/978-3-319-72814-8
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45. 
Cover image for Digital Storage in Consumer Electronics The Essential Guide
Digital Storage in Consumer Electronics The Essential Guide
Author 
Coughlin, Thomas M. author. SpringerLink (Online service)
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https://doi.org/10.1007/978-3-319-69907-3
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46. 
Cover image for Embedded Flash Memory for Embedded Systems: Technology, Design for Sub-systems, and Innovations
Embedded Flash Memory for Embedded Systems: Technology, Design for Sub-systems, and Innovations
Author 
Hidaka, Hideto. editor. SpringerLink (Online service)
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https://doi.org/10.1007/978-3-319-55306-1
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47. 
Cover image for Symbolic Parallelization of Nested Loop Programs
Symbolic Parallelization of Nested Loop Programs
Author 
Tanase, Alexandru-Petru. author. Hannig, Frank. author. Teich, Jürgen. author. SpringerLink (Online service)
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https://doi.org/10.1007/978-3-319-73909-0
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48. 
Cover image for Energy-Efficient Smart Temperature Sensors in CMOS Technology
Energy-Efficient Smart Temperature Sensors in CMOS Technology
Author 
Souri, Kamran. author. Makinwa, Kofi A.A. author. SpringerLink (Online service)
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https://doi.org/10.1007/978-3-319-62307-8
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